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ADS1120
SBAS535C – AUGUST 2013 – REVISED FEBRUARY 2017
ADS1120 4-Channel, 2-kSPS, Low-Power, 16-Bit ADC with Integrated PGA and Reference
1 Features 3 Description
1• Low Current Consumption: The ADS1120 is a precision, 16-bit, analog-to-digital
As Low as 120 μA (typ) in Duty-Cycle Mode converter (ADC) that offers many integrated features
to reduce system cost and component count in
• Wide Supply Range: 2.3 V to 5.5 V applications measuring small sensor signals. The
• Programmable Gain: 1 V/V to 128 V/V device features two differential or four single-ended
• Programmable Data Rates: Up to 2 kSPS inputs through a flexible input multiplexer (MUX), a
low-noise, programmable gain amplifier (PGA), two
• 16-Bit Noise-Free Resolution at 20 SPS
programmable excitation current sources, a voltage
• Simultaneous 50-Hz and 60-Hz Rejection at reference, an oscillator, a low-side switch, and a
20 SPS with Single-Cycle Settling Digital Filter precision temperature sensor.
• Two Differential or Four Single-Ended Inputs The device can perform conversions at data rates up
• Dual-Matched Programmable Current Sources: to 2000 samples-per-second (SPS) with single-cycle
50 μA to 1.5 mA settling. At 20 SPS, the digital filter offers
• Internal 2.048-V Reference: 5 ppm/°C (typ) Drift simultaneous 50-Hz and 60-Hz rejection for noisy
industrial applications. The internal PGA offers gains
• Internal 2% Accurate Oscillator up to 128 V/V. This PGA makes the ADS1120 ideally-
• Internal Temperature Sensor: suited for applications measuring small sensor
0.5°C (typ) Accuracy signals, such as resistance temperature detectors
• SPI-Compatible Interface (Mode 1) (RTDs), thermocouples, thermistors, and bridge
sensors. The device supports measurements of
• Package: 3.5-mm × 3.5-mm × 0.9-mm VQFN pseudo- or fully-differential signals when using the
PGA. Alternatively, the device can be configured to
2 Applications bypass the internal PGA while still providing high
• Temperature Sensor Measurements: input impedance and gains up to 4 V/V, allowing for
single-ended measurements.
– Thermistors
– Thermocouples Power consumption is as low as 120 µA when
operating in duty-cycle mode with the PGA disabled.
– Resistance Temperature Detectors (RTDs): The ADS1120 is offered in a leadless VQFN-16 or a
2-, 3-, or 4-Wire Types TSSOP-16 package and is specified over a
• Resistive Bridge Sensor Measurements: temperature range of –40°C to +125°C.
– Pressure Sensors
Device Information(1)
– Strain Gauges
PART NUMBER PACKAGE BODY SIZE (NOM)
– Weigh Scales VQFN (16) 3.50 mm × 3.50 mm
• Portable Instrumentation ADS1120
TSSOP (16) 5.00 mm × 4.40 mm
• Factory Automation and Process Controls
(1) For all available packages, see the orderable addendum at
the end of the datasheet.
K-Type Thermocouple Measurement

3.3 V 3.3 V
0.1 PF 0.1 PF
3.3 V REFP0 REFN0

50 A to AVDD DVDD
1.5 mA
AIN0 Internal Reference

Reference MUX
TI Device
AIN1 CS
AINP Digital Filter SCLK
Thermocouple 16-Bit and
MUX PGA DIN
û ADC SPI
Interface DOUT/DRDY
AIN2 AINN
DRDY
Isothermal
Block
Precision
Low-Drift
AIN3 Temperature
Oscillator
Sensor
AVSS CLK DGND
Copyright © 2017, Texas Instruments Incorporated
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
ADS1120
SBAS535C – AUGUST 2013 – REVISED FEBRUARY 2017 www.ti.com
Table of Contents
1 Features .................................................................. 1 8.5 Programming........................................................... 34
2 Applications ........................................................... 1 8.6 Register Map........................................................... 39
3 Description ............................................................. 1 9 Application and Implementation ........................ 44
4 Revision History..................................................... 2 9.1 Application Information............................................ 44
9.2 Typical Applications ................................................ 49
5 Pin Configuration and Functions ......................... 4
6 Specifications......................................................... 5 10 Power Supply Recommendations ..................... 60
10.1 Power-Supply Sequencing.................................... 60
6.1 Absolute Maximum Ratings ...................................... 5
10.2 Power-Supply Ramp Rate .................................... 60
6.2 ESD Ratings.............................................................. 5
10.3 Power-Supply Decoupling..................................... 60
6.3 Recommended Operating Conditions....................... 6
6.4 Thermal Information .................................................. 6 11 Layout................................................................... 61
6.5 Electrical Characteristics........................................... 7 11.1 Layout Guidelines ................................................. 61
6.6 SPI Timing Requirements ......................................... 9 11.2 Layout Example .................................................... 62
6.7 SPI Switching Characteristics ................................... 9 12 Device and Documentation Support ................. 63
6.8 Typical Characteristics ............................................ 10 12.1 Documentation Support ........................................ 63
7 Parameter Measurement Information ................ 16 12.2 Receiving Notification of Documentation Updates 63
7.1 Noise Performance ................................................. 16 12.3 Community Resources.......................................... 63
12.4 Trademarks ........................................................... 63
8 Detailed Description ............................................ 19
12.5 Electrostatic Discharge Caution ............................ 63
8.1 Overview ................................................................. 19
12.6 Glossary ................................................................ 63
8.2 Functional Block Diagram ....................................... 19
8.3 Feature Description................................................. 20 13 Mechanical, Packaging, and Orderable
8.4 Device Functional Modes........................................ 32
Information ........................................................... 63
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision B (January 2015) to Revision C Page
• Changed document title ......................................................................................................................................................... 1

• Changed K-Type Thermocouple Measurement figure .......................................................................................................... 1
• Added footnote 1 to Pin Functions table and changed descriptions of AIN0/REFP1, AIN1, AIN2, AIN3/REFN1,
REFN0, and REFP0 pins accordingly ................................................................................................................................... 4
• Changed format of Absolute Maximum Ratings table ............................................................................................................ 5
• Changed Functional Block Diagram figure .......................................................................................................................... 19
• Changed Bypassing the PGA section .................................................................................................................................. 24
• Changed (AVDD) to (AVDD – AVSS) in first paragraph of Voltage Reference section....................................................... 29
• Added fourth sentence to Temperature Sensor section....................................................................................................... 31
• Changed last equation in Converting from Digital Codes to Temperature section .............................................................. 31
• Changed bit 0 in register 03h to 0 from RESERVED .......................................................................................................... 39
• Changed description of bits 5:4 in Configuration Register 2 ................................................................................................ 42
• Added Unused Inputs and Outputs section ......................................................................................................................... 47
• Changed Thermocouple Measurement figure ...................................................................................................................... 49
• Changed 3-Wire RTD Measurement figure ......................................................................................................................... 52
• Changed Resistive Bridge Measurement figure .................................................................................................................. 58
• Changed Power Supply Recommendations section: changed Power-Supply Sequencing subsection, added Power-
Supply Ramp Rate subsection ............................................................................................................................................. 60
2 Submit Documentation Feedback Copyright © 2013–2017, Texas Instruments Incorporated
Product Folder Links: ADS1120

ADS1120
www.ti.com SBAS535C – AUGUST 2013 – REVISED FEBRUARY 2017
Changes from Revision A (January 2014) to Revision B Page
• Added ESD Ratings and Recommended Operating Conditions tables and Application and Implementation, Power
Supply Recommendations, Layout, Device and Documentation Support, and Mechanical, Packaging, and Orderable
Information sections................................................................................................................................................................ 1
• Changed document title, Features, Applications, Description, Pin Configuration and Functions, Parameter
Measurement Information, Feature Description, Device Functional Modes, Programming, and Register Map
sections, and front-page figure ............................................................................................................................................... 1
• Deleted Ordering Information section and Product Family table............................................................................................ 4
• Changed format of Absolute Maximum Ratings table and added minimum junction temperature specification ................... 5
• Changed Analog Inputs and Voltage Reference Input sections (specification values were not changed) and added
Internal Oscillator section to Electrical Characteristics table.................................................................................................. 7
• Changed System Performance section: changed VIO parameter name, deleted symbol and changed test conditions
of Gain error parameter in Electrical Characteristics table .................................................................................................... 7
• Deleted Clock Sources section and changed Temperature Sensor and Power Supply sections (specification values
were not changed) in Electrical Characteristics table............................................................................................................. 8
• Changed SPI Timing Requirements and Figure 1 (specification values were not changed), added SPI Switching
Characteristics and Figure 2 .................................................................................................................................................. 9
• Changed format of Typical Characteristics section (actual curves did not change) ............................................................ 10
Changes from Original (August 2013) to Revision A Page
• Released to production........................................................................................................................................................... 1
Copyright © 2013–2017, Texas Instruments Incorporated Submit Documentation Feedback 3

ADS1120
5 Pin Configuration and Functions
RVA Package PW Package

16-Pin VQFN 16-Pin TSSOP
Top View Top View
DOUT/DRDY
DOUT/DRDY
SCLK
DIN
CS
16 15 14 13 SCLK 1 16 DIN
CS 2 15 DOUT/DRDY
CLK 1 12 DRDY
CLK 3 14 DRDY
DGND 2 11 DVDD DGND 4 13 DVDD
Thermal Pad
AVSS 3 10 AVDD AVSS 5 12 AVDD
AIN3/REFN1 6 11 AIN0/REFP1
AIN3/REFN1 4 9 AIN0/REFP1
AIN2 7 10 AIN1
5 6 7 8 REFN0 8 9 REFP0
AIN2
REFN0
REFP0
AIN1
Pin Functions
PIN
NO.
ANALOG OR DIGITAL
NAME RVA PW INPUT/OUTPUT DESCRIPTION (1)
AIN0/REFP1 9 11 Analog input Analog input 0, positive reference input 1
AIN1 8 10 Analog input Analog input 1
AIN2 5 7 Analog input Analog input 2
Analog input 3, negative reference input 1.
AIN3/REFN1 4 6 Analog input
Internal low-side power switch connected between AIN3/REFN1 and AVSS.
AVDD 10 12 Analog Positive analog power supply
AVSS 3 5 Analog Negative analog power supply
CLK 1 3 Digital input External clock source pin. Connect to DGND if not used.
CS 16 2 Digital input Chip select; active low. Connect to DGND if not used.
DGND 2 4 Digital Digital ground
DIN 14 16 Digital input Serial data input
DOUT/DRDY 13 15 Digital output Serial data output combined with data ready; active low
Data ready, active low.
DRDY 12 14 Digital output
Leave unconnected or tie to DVDD using a weak pull-up resistor if not used.
DVDD 11 13 Digital Positive digital power supply
REFN0 6 8 Analog input Negative reference input 0
REFP0 7 9 Analog input Positive reference input 0
SCLK 15 1 Digital input Serial clock input
Thermal pad — — Thermal power pad. Do not connect or only connect to AVSS.
(1) See the Unused Inputs and Outputs section for unused pin connections.

ADS1120
6 Specifications
6.1 Absolute Maximum Ratings (1)
MIN MAX UNIT
AVDD to AVSS –0.3 7
Power-supply voltage DVDD to DGND –0.3 7 V
AVSS to DGND –2.8 0.3
Analog input voltage AIN0/REFP1, AIN1, AIN2, AIN3/REFN1, REFP0, REFN0 AVSS – 0.3 AVDD + 0.3 V
Digital input voltage CS, SCLK, DIN, DOUT/DRDY, DRDY, CLK DGND – 0.3 DVDD + 0.3 V
Input current Continuous, any pin except power supply pins –10 10 mA
Junction, TJ –40 150
Temperature °C
Storage, Tstg –60 150
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
6.2 ESD Ratings

VALUE UNIT
Human-body model (HBM),
±2000
per ANSI/ESDA/JEDEC JS-001 (1)
V(ESD) Electrostatic discharge V
Charged-device model (CDM),
±500
per JEDEC specification JESD22-C101 (2)
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process..
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

ADS1120
6.3 Recommended Operating Conditions

over operating ambient temperature range (unless otherwise noted)
MIN NOM MAX UNIT
POWER SUPPLY
AVDD to AVSS 2.3 5.5
Unipolar analog power supply V
AVSS to DGND –0.1 0 0.1
AVDD to DGND 2.3 2.5 2.75
Bipolar analog power supply V
AVSS to DGND –2.75 –2.5 –2.3
Digital power supply DVDD to DGND 2.3 5.5 V
ANALOG INPUTS (1)
VIN Differential input voltage VIN = V(AINP) – V(AINN) (2) –Vref / Gain Vref / Gain V
PGA disabled, gain = 1 to 4 AVSS – 0.1 AVDD + 0.1 V
V(AINx) Absolute input voltage
PGA enabled, gain = 1 to 128 See the Low-Noise PGA section
PGA disabled, gain = 1 to 4 AVSS – 0.1 AVDD + 0.1 V
VCM Common-mode input voltage
PGA enabled, gain = 1 to 128 See the Low-Noise PGA section
VOLTAGE REFERENCE INPUTS (3)
Vref Differential reference input voltage Vref = V(REFPx) – V(REFNx) 0.75 2.5 AVDD V
V(REFNx) Absolute negative reference voltage AVSS – 0.1 V(REFPx) – 0.75 V
V(REFPx) Absolute positive reference voltage V(REFNx) + 0.75 AVDD + 0.1 V
EXTERNAL CLOCK SOURCE
f(CLK) External clock frequency 0.5 4.096 4.5 MHz
Duty cycle 40% 60%
DIGITAL INPUTS
Input voltage DGND DVDD V
TEMPERATURE RANGE
TA Operating ambient temperature –40 125 °C
(1) AINP and AINN denote the positive and negative inputs of the PGA. AINx denotes one of the four available analog inputs.
PGA disabled means the low-noise PGA is powered down and bypassed. Gains of 1, 2, and 4 are still possible in this case.
See the Bypassing the PGA section for more information.
(2) Excluding the effects of offset and gain error.
Limited to ±[(AVDD – AVSS) – 0.4 V] / Gain, when the PGA is enabled.
(3) REFPx and REFNx denote one of two available differential reference input pairs.
6.4 Thermal Information

ADS1120
THERMAL METRIC (1) VQFN (RVA) TSSOP (PW) UNIT
16 PINS 16 PINS
RθJA Junction-to-ambient thermal resistance 43.4 99.5 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 47.3 35.2 °C/W
RθJB Junction-to-board thermal resistance 18.4 44.3 °C/W
ψJT Junction-to-top characterization parameter 0.6 2.4 °C/W
ψJB Junction-to-board characterization parameter 18.4 43.8 °C/W
RθJC(bot) Junction-to-case (bottom) thermal resistance 2.0 n/a °C/W
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.

ADS1120
6.5 Electrical Characteristics

Minimum and maximum specifications apply from TA = –40°C to +125°C. Typical specifications are at TA = 25°C.
All specifications are at AVDD = 3.3 V, AVSS = 0 V, DVDD = 3.3 V, PGA enabled, DR = 20 SPS, and external Vref = 2.5 V
(unless otherwise noted). (1)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
ANALOG INPUTS
Absolute input current See the Typical Characteristics
Differential input current See the Typical Characteristics
SYSTEM PERFORMANCE
Resolution (no missing codes) 16 Bits
Normal mode 20, 45, 90, 175, 330, 600, 1000
DR Data rate Duty-cycle mode 5, 11.25, 22.5, 44, 82.5, 150, 250 SPS
Turbo mode 40, 90, 180, 350, 660, 1200, 2000
Noise (input-referred) See the Noise Performance section
INL Integral nonlinearity Gain = 1 to 128, VCM = 0.5 AVDD, best fit (2) 8 20 ppmFSR
PGA disabled, gain = 1 to 4, differential inputs ±4
VIO Input offset voltage µV
Gain = 1 to 128, differential inputs ±4
PGA disabled, gain = 1 to 4 0.25
Offset drift Gain = 1 to 128, TA = –40°C to +85°C (2) 0.08 0.3 µV/°C
Gain = 1 to 128 0.25
PGA disabled, gain = 1 to 4 ±0.015%
Gain error
Gain = 1 to 128, TA = 25°C –0.1% ±0.015% 0.1%
PGA disabled, gain = 1 to 4 1
Gain drift ppm/°C
Gain = 1 to 128 (2) 1 4
50 Hz ±3%, DR = 20 SPS, external CLK,
105
50/60 bit = 10
60 Hz ±3%, DR = 20 SPS, external CLK,
NMRR Normal-mode rejection ratio (2) 105 dB
50/60 bit = 11
50 Hz or 60 Hz ±3%, DR = 20 SPS,
90
external CLK, 50/60 bit = 01
At dc, gain = 1 90 105
CMRR Common-mode rejection ratio f(CM) = 50 Hz, DR = 2000 SPS (2) 95 115 dB
f(CM) = 60 Hz, DR = 2000 SPS (2) 95 115
AVDD at dc, VCM = 0.5 AVDD, gain = 1 80 105
PSRR Power-supply rejection ratio dB
DVDD at dc, VCM = 0.5 AVDD, gain = 1 (2) 100 115
INTERNAL VOLTAGE REFERENCE
Initial accuracy TA = 25°C 2.045 2.048 2.051 V
Reference drift (2) 5 40 ppm/°C
Long-term drift 1000 hours 110 ppm
VOLTAGE REFERENCE INPUTS
Reference input current REFP0 = Vref, REFN0 = AVSS ±10 nA
INTERNAL OSCILLATOR
Internal oscillator accuracy Normal mode –2% ±1% 2%
(1) PGA disabled means the low-noise PGA is powered down and bypassed. Gains of 1, 2, and 4 are still possible in this case.
See the Bypassing the PGA section for more information.
(2) Minimum and maximum values are ensured by design and characterization data.

ADS1120
Electrical Characteristics (continued)

Minimum and maximum specifications apply from TA = –40°C to +125°C. Typical specifications are at TA = 25°C.
All specifications are at AVDD = 3.3 V, AVSS = 0 V, DVDD = 3.3 V, PGA enabled, DR = 20 SPS, and external Vref = 2.5 V
(unless otherwise noted).(1)
EXCITATION CURRENT SOURCES (IDACs)
Current settings 50, 100, 250, 500, 1000, 1500 µA
Compliance voltage All current settings AVDD – 0.9 V
Accuracy All current settings, each IDAC –6% ±1% 6%
Current match Between IDACs ±0.3%
Temperature drift Each IDAC 50 ppm/°C
Temperature drift matching Between IDACs 10 ppm/°C
TEMPERATURE SENSOR
Conversion resolution 14 Bits
Temperature resolution 0.03125 °C
TA = 0°C to +75°C ±0.25
Accuracy °C
TA = –40°C to +125°C ±0.5
Accuracy vs analog supply voltage 0.0625 0.25 °C/V
LOW-SIDE POWER SWITCH
RON On-resistance 3.5 Ω
Current through switch 30 mA
DIGITAL INPUTS/OUTPUTS
VIH High-level input voltage 0.7 DVDD DVDD V
VIL Low-level input voltage DGND 0.3 DVDD V
VOH High-level output voltage IOH = 3 mA 0.8 DVDD V
VOL Low-level output voltage IOL = 3 mA 0.2 DVDD V
IH Input leakage, high VIH = 5.5 V –10 10 µA
IL Input leakage, low VIL = DGND –10 10 µA
POWER SUPPLY
Power-down mode 0.1 3
Duty-cycle mode, PGA disabled 65
Duty-cycle mode, gain = 1 to 16 95
Duty-cycle mode, gain = 32 115
Duty-cycle mode, gain = 64, 128 135
Normal mode, PGA disabled 240
IAVDD Analog supply current (3) Normal mode, gain = 1 to 16 340 490 µA
Normal mode, gain = 32 425
Normal mode, gain = 64, 128 510
Turbo mode, PGA disabled 360
Turbo mode, gain = 1 to 16 540
Turbo mode, gain = 32 715
Turbo mode, gain = 64, 128 890
Power-down mode 0.3 5
Duty-cycle mode 55
IDVDD Digital supply current (3) µA
Normal mode 75 110
Turbo mode 95
Duty-cycle mode, PGA disabled 0.4
PD Power dissipation (3) Normal mode, gain = 1 to 16 1.4 mW
Turbo mode, gain = 1 to 16 2.1
(3) Internal voltage reference selected, internal oscillator enabled, IDACs turned off, and continuous conversion mode.
Analog supply current increases by 70 µA, typ (normal mode, turbo mode) when selecting an external reference.
Analog supply current increases by 190 µA (typ) when enabling the IDACs (excludes the actual IDAC current).

ADS1120
6.6 SPI Timing Requirements

over operating ambient temperature range and DVDD = 2.3 V to 5.5 V (unless otherwise noted)
MIN MAX UNIT
td(CSSC) Delay time, CS falling edge to first SCLK rising edge (1) 50 ns
td(SCCS) Delay time, final SCLK falling edge to CS rising edge 25 ns
tw(CSH) Pulse duration, CS high 50 ns
tc(SC) SCLK period 150 ns
tw(SCH) Pulse duration, SCLK high 60 ns
tw(SCL) Pulse duration, SCLK low 60 ns
tsu(DI) Setup time, DIN valid before SCLK falling edge 50 ns
th(DI) Hold time, DIN valid after SCLK falling edge 25 ns
Normal mode, duty-cycle mode 13955 t(MOD)
SPI timeout (2)
Turbo mode 27910 t(MOD)
(1) CS can be tied low permanently in case the serial bus is not shared with any other device.
(2) See the SPI Timeout section for more information.
t(MOD) = 1 / f(MOD). Modulator frequency f(MOD) = 256 kHz (normal mode, duty-cycle mode) and 512 kHz (turbo mode), when using the
internal oscillator or an external 4.096-MHz clock.
6.7 SPI Switching Characteristics

over operating ambient temperature range, DVDD = 2.3 V to 5.5 V (unless otherwise noted)
Propagation delay time,
tp(CSDO) DOUT load = 20 pF || 10 kΩ to DGND 50 ns
CS falling edge to DOUT driven
tp(SCDO) DOUT load = 20 pF || 10 kΩ to DGND 0 50 ns
SCLK rising edge to valid new DOUT
tp(CSDOZ) DOUT load = 20 pF || 10 kΩ to DGND 50 ns
CS rising edge to DOUT high impedance
tw(CSH)
CS
ttd(CSSC)t ttc(SC)t tw(SCH) ttd(SCCS)t
SCLK
tsu(DI) th(DI) tw(SCL)
DIN
NOTE: Single-byte communication is shown. Actual communication may be multiple bytes.
Figure 1. Serial Interface Timing Requirements
CS
SCLK
tp(CSDO) tp(SCDO) tp(CSDOZ)
Hi-Z Hi-Z
DOUT/DRDY
NOTE: Single-byte communication is shown. Actual communication may be multiple bytes.
Figure 2. Serial Interface Switching Characteristics

ADS1120
6.8 Typical Characteristics

At TA = 25°C, AVDD = 3.3 V, AVSS = 0 V, and PGA enabled using external Vref = 2.5 V (unless otherwise noted).
40 40
Gain = 1 Gain = 1
Gain = 128 Gain = 128
30 PGA Disabled 30
PGA Disabled
Offset Voltage (µV)
Offset Voltage (µV)

20 20
10 10
0 0
±10 ±10
±40 ±20 0 20 40 60 80 100 120 ±40 ±20 0 20 40 60 80 100 120
Temperature (ƒC) C017 Temperature (ƒC) C018
AVDD = 3.3 V AVDD = 5.0 V
Figure 3. Input-Referred Offset Voltage vs Temperature Figure 4. Input-Referred Offset Voltage vs Temperature
500 500
Gain = 1 Gain = 1
Gain = 128 Gain = 128
400 PGA Disabled 400
PGA Disabled
Gain Error (ppm of FS)
Gain Error (ppm of FS)
300 300
200 200
100 100
0 0
±40 ±20 0 20 40 60 80 100 120 ±40 ±20 0 20 40 60 80 100 120
Figure 5. Gain Error vs Temperature Figure 6. Gain Error vs Temperature

15 15
Gain = 1 Gain = 1
Gain = 32 Gain = 32
10 PGA Disabled 10 PGA Disabled
INL (ppm of FS)
INL (ppm of FS)
5 5
0 0
±5 ±5
±10 ±10
±15 ±15
±100 ±75 ±50 ±25 0 25 50 75 100 ±100 ±75 ±50 ±25 0 25 50 75 100
VIN (% of FS) C025 VIN (% of FS) C029
AVDD = 3.3 V, external 2.5-V reference, normal mode AVDD = 5.0 V, external 2.5-V reference, normal mode
Figure 7. Integral Nonlinearity vs Figure 8. Integral Nonlinearity vs

Differential Input Signal Differential Input Signal

ADS1120
Typical Characteristics (continued)

20 20
Gain = 1 Gain = 1
15 Gain = 32 15 Gain = 32
PGA Disabled PGA Disabled
10 10
INL (ppm of FS)
INL (ppm of FS)

5 5
0 0
±5 ±5
±10 ±10
±15 ±15
±20 ±20
±100 ±75 ±50 ±25 0 25 50 75 100 ±100 ±75 ±50 ±25 0 25 50 75 100
VIN (% of FS) C043 VIN (% of FS) C044
AVDD = 3.3 V, internal reference, normal mode AVDD = 5.0 V, internal reference, normal mode
Figure 9. Integral Nonlinearity vs Figure 10. Integral Nonlinearity vs

Differential Input Signal Differential Input Signal
1000 2.051
AVDD = 3.3 V
800 Reference Voltage (V) 2.050 AVDD = 5.0 V
2.049
600
Counts
2.048
400
2.047
200
2.046
0
2.045
2.046
2.047
2.048
2.049
2.050
2.051
2.045
±40 ±20 0 20 40 60 80 100 120
Initial Reference Voltage (V) C042 Temperature (ƒC) C021
TA = 25°C, data from 5490 devices
Figure 11. Internal Reference Voltage Histogram Figure 12. Internal Reference Voltage vs Temperature
1.00 0
Gain = 1
0.75 ±20
Gain = 128
0.50 ±40
Frequency Error (%)
0.25 ±60
PSRR (dB)
0.00 ±80
±0.25 ±100
±0.50 ±120
±0.75 ±140
±1.00 ±160
±40 ±20 0 20 40 60 80 100 120 0.1 1 10 100 1000
Temperature (ƒC) C002 Frequency (kHz) C016
DVDD = 3.3 V, normal mode
Figure 13. Internal Oscillator Accuracy vs Temperature Figure 14. AVDD Power-Supply Rejection Ratio vs
Frequency

ADS1120

15 15
AIN0 AIN0
AIN1 AIN1
10 10
Absolute Input Current (nA)

AIN2 AIN2
AIN3 AIN3
5 5
0 0
±5 ±5
±10 ±10
±15 ±15
0.5 1.0 1.5 2.0 2.5 3.0 0.5 1.0 1.5 2.0 2.5 3.0
Absolute Input Voltage V(AINx) (V) C030 Absolute Input Voltage V(AINx) (V) C031
AVDD = 3.3 V, PGA enabled, TA = –40°C AVDD = 3.3 V, PGA enabled, TA = 25°C
Figure 15. Absolute Input Current vs Figure 16. Absolute Input Current vs
Absolute Input Voltage Absolute Input Voltage
20 100
AIN0 AIN0
AIN1 AIN1
10 AIN2 50
AIN2

AIN3 AIN3
0 0
±10 ±50
±20 ±100
±30 ±150
±40 ±200
±50 ±250
0.5 1.0 1.5 2.0 2.5 3.0 0.5 1.0 1.5 2.0 2.5 3.0
AVDD = 3.3 V, PGA enabled, TA = 85°C AVDD = 3.3 V, PGA enabled, TA = 125°C
40 40
Ta = ±40ƒC Ta = ±40ƒC
Ta = 25°C Ta = 25°C
Differential Input Current (nA)
20 Ta = 85°C 20 Ta = 85°C
Ta = 125°C Ta = 125°C
0 0
±20 ±20
±40 ±40
±60 ±60
±2.0 ±1.5 ±1.0 ±0.5 0.0 0.5 1.0 1.5 2.0 ±2.0 ±1.5 ±1.0 ±0.5 0.0 0.5 1.0 1.5 2.0
Differential Input Voltage VIN (V) C038 Differential Input Voltage VIN (V) C039
AVDD = 3.3 V, PGA enabled, AINP = AIN0, AINN = AIN1 AVDD = 3.3 V, PGA enabled, AINP = AIN3, AINN = AIN2
Figure 19. Differential Input Current vs Figure 20. Differential Input Current vs
Differential Input Voltage Differential Input Voltage

ADS1120

15 15
AIN0 AIN0
AIN1 AIN1
10 10

AIN2 AIN2
AIN3 AIN3
5 5
0 0
±5 ±5
±10 ±10
±15 ±15
0.5 1.0 1.5 2.0 2.5 3.0 0.5 1.0 1.5 2.0 2.5 3.0
AVDD = 3.3 V, PGA disabled, TA = –40°C AVDD = 3.3 V, PGA disabled, TA = 25°C
20 100
AIN0 AIN0
AIN1 AIN1
10 50 AIN2
AIN2

AIN3 AIN3
0 0
±10 ±50
±20 ±100
±30 ±150
±40 ±200
±50 ±250
0.5 1.0 1.5 2.0 2.5 3.0 0.5 1.0 1.5 2.0 2.5 3.0
AVDD = 3.3 V, PGA disabled, TA = 85°C AVDD = 3.3 V, PGA disabled, TA = 125°C
40 40
Ta = ±40ƒC Ta = ±40ƒC
Ta = 25°C Ta = 25°C
20 Ta = 85°C 20 Ta = 85°C
Ta = 125°C Ta = 125°C
0 0
±20 ±20
±40 ±40
±60 ±60
±2.0 ±1.5 ±1.0 ±0.5 0.0 0.5 1.0 1.5 2.0 ±2.0 ±1.5 ±1.0 ±0.5 0.0 0.5 1.0 1.5 2.0
Differential Input Voltage VIN (V) C040 Differential Input Voltage VIN (V) C041
AVDD = 3.3 V, PGA disabled, AINP = AIN0, AINN = AIN1 AVDD = 3.3 V, PGA disabled, AINP = AIN3, AINN = AIN2
Figure 25. Differential Input Current vs Figure 26. Differential Input Current vs
Differential Input Voltage Differential Input Voltage

ADS1120

6 6
IDAC = 1000 µA
4 IDAC = 500 µA 4
Absolute IDAC Error (%)

IDAC = 100 µA
2 2
IDAC Error (%)
0 0
±2 ±2
±4 ±4
±6 ±6
0.5 0.6 0.7 0.8 0.9 1.0 ±40 ±20 0 20 40 60 80 100 120
Compliance Voltage (V) C006 Temperature (ƒC) C005
Figure 27. IDAC Accuracy vs Compliance Voltage Figure 28. IDAC Accuracy vs Temperature
1.00 600
IDAC = 1000 µA
0.75 IDAC = 500 µA 500
IDAC Matching Error (%)
0.50 IDAC = 100 µA

400
0.25
IAVDD (µA)
0.00 300
±0.25
200
±0.50 Gain = 64, 128
100 Gain = 1 to 16
±0.75
PGA Disabled
±1.00 0
±40 ±20 0 20 40 60 80 100 120 ±40 ±20 0 20 40 60 80 100 120
AVDD = 3.3 V, internal reference, normal mode
Figure 29. IDAC Matching vs Temperature Figure 30. IAVDD vs Temperature

1000 150
125
800
100
600
IAVDD (µA)
IAVDD (µA)
75
400
50
Gain = 64, 128 Gain = 64, 128
200
Gain = 1 to 16 25 Gain = 1 to 16
PGA Disabled PGA Disabled
0 0
±40 ±20 0 20 40 60 80 100 120 ±40 ±20 0 20 40 60 80 100 120
AVDD = 3.3 V, internal reference, turbo mode AVDD = 3.3 V, internal reference, duty-cycle mode
Figure 31. IAVDD vs Temperature Figure 32. IAVDD vs Temperature

ADS1120

600 120
500 100
400 80
IDVDD (µA)
IAVDD (µA)
300 60
200 40
Gain = 64, 128 Turbo Mode
100 Gain = 1 to 16 20 Normal Mode
PGA Disabled Duty-Cycle Mode
0 0
2.5 3.0 3.5 4.0 4.5 5.0 5.5 2.5 3.0 3.5 4.0 4.5 5.0 5.5
AVDD (V) C004 DVDD (V) C010
Normal mode, internal reference
Figure 33. IAVDD vs AVDD Figure 34. IDVDD vs DVDD

120 1.00
Mean + 61
0.75 Mean
100
Temperature Error (ƒC) 0.50 Mean - 61
80
0.25
IDVDD (µA)
60 0.00
±0.25
40
Turbo Mode ±0.50
20 Normal Mode ±0.75
Duty-Cycle Mode
0 ±1.00
±40 ±20 0 20 40 60 80 100 120 ±40 ±20 0 20 40 60 80 100 120
DVDD = 3.3 V
Figure 35. IDVDD vs Temperature Figure 36. Internal Temperature Sensor Accuracy vs
Temperature
6
4
RON (
2
AVDD = 2.3 V
1 AVDD = 3.3 V
AVDD = 5.0 V
0
±40 ±20 0 20 40 60 80 100 120
Temperature (ƒC) C001
Figure 37. Low-Side Power Switch RON vs Temperature

ADS1120
7 Parameter Measurement Information

7.1 Noise Performance
Delta-sigma (ΔΣ) analog-to-digital converters (ADCs) are based on the principle of oversampling. The input
signal of a ΔΣ ADC is sampled at a high frequency (modulator frequency) and subsequently filtered and
decimated in the digital domain to yield a conversion result at the respective output data rate. The ratio between
modulator frequency and output data rate is called oversampling ratio (OSR). By increasing the OSR, and thus
reducing the output data rate, the noise performance of the ADC can be optimized. In other words, the input-
referred noise drops when reducing the output data rate because more samples of the internal modulator are
averaged to yield one conversion result. Increasing the gain also reduces the input-referred noise, which is
particularly useful when measuring low-level signals.
Table 1 to Table 8 summarize the device noise performance. Data are representative of typical noise
performance at TA = 25°C using the internal 2.048-V reference. Data shown are the result of averaging readings
from a single device over a time period of approximately 0.75 seconds and are measured with the inputs
internally shorted together. Table 1, Table 3, Table 5 and Table 7 list the input-referred noise in units of μVRMS for
the conditions shown. Note that µVPP values are shown in parenthesis. Table 2, Table 4, Table 6 and Table 8 list
the corresponding data in effective number of bits (ENOB) calculated from μVRMS values using Equation 1. Note
that noise-free bits calculated from peak-to-peak noise values using Equation 2 are shown in parenthesis.
The input-referred noise (Table 1, Table 3, Table 5 and Table 7) only changes marginally when using an external
low-noise reference, such as the REF5020. To calculate ENOB numbers and noise-free bits when using a
reference voltage other than 2.048 V, use Equation 1 to Equation 3:
ENOB = ln (Full-Scale Range / VRMS-Noise) / ln(2) (1)

Noise-Free Bits = ln (Full-Scale Range / VPP-Noise) / ln(2) (2)
Full-Scale Range = 2 · Vref / Gain (3)
Table 1. Noise in μVRMS (μVPP)

at AVDD = 3.3 V, AVSS = 0 V, Normal Mode, and Internal Reference = 2.048 V
DATA GAIN (PGA Enabled)
RATE
(SPS) 1 2 4 8 16 32 64 128
20 62.50 (62.50) 31.25 (31.25) 15.63 (15.63) 7.81 (7.81) 3.91 (3.91) 1.95 (1.95) 0.98 (0.98) 0.49 (0.49)
45 62.50 (62.50) 31.25 (31.25) 15.63 (15.63) 7.81 (7.81) 3.91 (3.91) 1.95 (1.95) 0.98 (0.98) 0.49 (0.51)
90 62.50 (62.50) 31.25 (31.25) 15.63 (15.63) 7.81 (7.81) 3.91 (3.91) 1.95 (2.14) 0.98 (1.22) 0.49 (0.85)
175 62.50 (63.72) 31.25 (34.06) 15.63 (17.76) 7.81 (11.20) 3.91 (5.13) 1.95 (3.09) 0.98 (2.14) 0.49 (1.60)
330 62.50 (106.93) 31.25 (50.78) 15.63 (26.25) 7.81 (14.13) 3.91 (7.52) 1.95 (4.66) 0.98 (2.69) 0.49 (1.99)
600 62.50 (151.61) 31.25 (72.27) 15.63 (39.43) 7.81 (19.26) 3.91 (12.77) 1.95 (6.87) 0.98 (4.76) 0.55 (3.34)
1000 62.50 (227.29) 31.25 (122.68) 15.63 (58.53) 7.81 (31.52) 3.91 (18.08) 1.95 (10.71) 1.03 (6.52) 0.70 (4.01)
Table 2. ENOB from RMS Noise (Noise-free Bits from Peak-to-Peak Noise)
RATE
(SPS) 1 2 4 8 16 32 64 128
20 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (16)
45 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (15.49)
90 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (15.87) 16 (15.67) 16 (15.20)
175 16 (15.97) 16 (15.88) 16 (15.82) 16 (15.48) 16 (15.61) 16 (15.34) 16 (14.87) 16 (14.29)
330 16 (15.23) 16 (15.30) 16 (15.25) 16 (15.15) 16 (15.05) 16 (14.74) 16 (14.54) 16 (13.97)
600 16 (14.72) 16 (14.79) 16 (14.66) 16 (14.70) 16 (14.29) 16 (14.18) 16 (13.72) 15.83 (13.23)
1000 16 (14.14) 16 (14.03) 16 (14.09) 16 (13.99) 16 (13.79) 16 (13.54) 15.92 (13.26) 15.49 (12.96)

ADS1120
Table 3. Noise in μVRMS (μVPP) with PGA Disabled

GAIN (PGA Disabled)
DATA RATE
(SPS) 1 2 4
20 62.50 (62.50) 31.25 (31.25) 15.63 (15.63)
45 62.50 (62.50) 31.25 (31.25) 15.63 (15.63)
90 62.50 (62.50) 31.25 (31.25) 15.63 (15.63)
175 62.50 (65.92) 31.25 (35.40) 15.63 (18.92)
330 62.50 (94.24) 31.25 (50.17) 15.63 (28.75)
600 62.50 (138.67) 31.25 (78.13) 15.63 (39.79)
1000 62.50 (260.50) 31.25 (120.97) 15.63 (63.72)
Table 4. ENOB from RMS Noise (Noise-free Bits from Peak-to-Peak Noise) with PGA Disabled
GAIN (PGA Disabled)
DATA RATE
(SPS) 1 2 4
20 16 (16) 16 (16) 16 (16)
45 16 (16) 16 (16) 16 (16)
90 16 (16) 16 (16) 16 (16)
175 16 (15.92) 16 (15.82) 16 (15.72)
330 16 (15.41) 16 (15.32) 16 (15.12)
600 16 (14.85) 16 (14.68) 16 (14.65)
1000 16 (13.94) 16 (14.05) 16 (13.97)
Table 5. Noise in μVRMS (μVPP)

at AVDD = 3.3 V, AVSS = 0 V, Turbo Mode, and Internal Reference = 2.048 V
RATE
(SPS) 1 2 4 8 16 32 64 128
40 62.50 (62.50) 31.25 (31.25) 15.63 (15.63) 7.81 (7.81) 3.91 (3.91) 1.95 (1.95) 0.98 (0.98) 0.49 (0.55)
90 62.50 (62.50) 31.25 (31.25) 15.63 (15.63) 7.81 (7.81) 3.91 (3.91) 1.95 (1.95) 0.98 (1.13) 0.49 (0.69)
180 62.50 (62.50) 31.25 (31.25) 15.63 (15.63) 7.81 (7.81) 3.91 (4.82) 1.95 (2.57) 0.98 (1.47) 0.49 (1.34)
350 62.50 (84.72) 31.25 (40.04) 15.63 (19.04) 7.81 (10.13) 3.91 (6.15) 1.95 (3.59) 0.98 (2.29) 0.49 (1.39)
660 62.50 (120.36) 31.25 (47.36) 15.63 (27.83) 7.81 (17.36) 3.91 (10.21) 1.95 (4.43) 0.98 (3.67) 0.49 (2.93)
1200 62.50 (162.35) 31.25 (85.94) 15.63 (44.01) 7.81 (21.55) 3.91 (15.14) 1.95 (7.58) 0.98 (5.31) 0.57 (3.51)
2000 62.50 (265.14) 31.25 (127.32) 15.63 (65.43) 7.81 (37.02) 3.91 (18.89) 1.95 (12.00) 1.13 (7.60) 0.82 (5.81)
Table 6. ENOB from RMS Noise (Noise-Free Bits from Peak-to-Peak Noise)
RATE
(SPS) 1 2 4 8 16 32 64 128
40 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (15.83)
90 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (16) 16 (15.80) 16 (15.49)
180 16 (16) 16 (16) 16 (16) 16 (16) 16 (15.70) 16 (15.60) 16 (15.41) 16 (14.54)
350 16 (15.56) 16 (15.64) 16 (15.71) 16 (15.62) 16 (15.35) 16 (15.12) 16 (14.77) 16 (14.49)
660 16 (15.05) 16 (15.40) 16 (15.17) 16 (14.85) 16 (14.61) 16 (14.82) 16 (14.09) 16 (13.42)
1200 16 (14.62) 16 (14.54) 16 (14.51) 16 (14.54) 16 (14.05) 16 (14.04) 16 (13.56) 15.77 (13.15)
2000 16 (13.92) 16 (13.97) 16 (13.93) 16 (13.76) 16 (13.73) 16 (13.38) 15.79 (13.04) 15.25 (12.43)

ADS1120
Table 7. Noise in μVRMS (μVPP) with PGA Disabled

GAIN (PGA Disabled)
DATA RATE
(SPS) 1 2 4
40 62.50 (62.50) 31.25 (31.25) 15.63 (15.63)
90 62.50 (62.50) 31.25 (31.25) 15.63 (15.63)
180 62.50 (62.50) 31.25 (31.25) 15.63 (15.63)
350 62.50 (75.20) 31.25 (34.18) 15.63 (17.64)
660 62.50 (111.08) 31.25 (56.76) 15.63 (24.47)
1200 62.50 (176.03) 31.25 (89.23) 15.63 (40.95)
2000 62.50 (250.98) 31.25 (131.35) 15.63 (68.18)
Table 8. ENOB from RMS Noise (Noise-Free Bits from Peak-to-Peak Noise) with PGA Disabled
GAIN (PGA Disabled)
DATA RATE
(SPS) 1 2 4
40 16 (16) 16 (16) 16 (16)
90 16 (16) 16 (16) 16 (16)
180 16 (16) 16 (16) 16 (16)
350 16 (15.73) 16 (15.87) 16 (15.83)
660 16 (15.17) 16 (15.14) 16 (15.19)
1200 16 (14.51) 16 (14.49) 16 (14.61)
2000 16 (13.99) 16 (13.93) 16 (13.87)

ADS1120
8 Detailed Description
8.1 Overview
The ADS1120 is a small, low-power, 16-bit, ΔΣ ADC that offers many integrated features to reduce system cost
and component count in applications measuring small sensor signals.
In addition to the ΔΣ ADC core and single-cycle settling digital filter, the device offers a low-noise, high input
impedance, programmable gain amplifier (PGA), an internal voltage reference, and a clock oscillator. The device
also integrates a highly linear and accurate temperature sensor as well as two matched programmable current
sources (IDACs) for sensor excitation. All of these features are intended to reduce the required external circuitry
in typical sensor applications and improve overall system performance. An additional low-side power switch
eases the design of low-power bridge sensor applications. The device is fully configured through four registers
and controlled by six commands through a mode 1 SPI-compatible interface. The Functional Block Diagram
section shows the device functional block diagram.
The ADS1120 ADC measures a differential signal, VIN, which is the difference in voltage between nodes AINP
and AINN. The converter core consists of a differential, switched-capacitor, ΔΣ modulator followed by a digital
filter. The digital filter receives a high-speed bitstream from the modulator and outputs a code proportional to the
input voltage. This architecture results in a very strong attenuation of any common-mode signal.
The device has two available conversion modes: single-shot and continuous conversion mode. In single-shot
mode, the ADC performs one conversion of the input signal upon request and stores the value in an internal data
buffer. The device then enters a low-power state to save power. Single-shot mode is intended to provide
significant power savings in systems that require only periodic conversions, or when there are long idle periods
between conversions. In continuous conversion mode, the ADC automatically begins a conversion of the input
signal as soon as the previous conversion is completed. New data are available at the programmed data rate.
Data can be read at any time without concern of data corruption and always reflect the most recently completed
conversion.
8.2 Functional Block Diagram
AVDD REFP0 REFN0 DVDD
50 A to
1.5 mA
Internal Reference
AIN0/REFP1 TI Device
Reference MUX
AIN1 CS
AINP
Digital Filter SCLK
16-Bit and
MUX PGA DIN
û ADC SPI
Interface DOUT/DRDY
AIN2 AINN
DRDY
Precision
Low-Drift
AIN3/REFN1 Temperature
Oscillator
Sensor
AVSS CLK DGND


ADS1120
8.3 Feature Description

8.3.1 Multiplexer
The device contains a very flexible input multiplexer, as shown in Figure 38. Either four single-ended signals, two
differential signals, or a combination of two single-ended signals and one differential signal can be measured.
The multiplexer is configured by four bits (MUX[3:0]) in the configuration register. When single-ended signals are
measured, the negative ADC input (AINN) is internally connected to AVSS by a switch within the multiplexer. For
system-monitoring purposes, the analog supply (AVDD – AVSS) / 4 or the currently-selected external reference
voltage (V(REFPx) – V(REFNx)) / 4 can be selected as inputs to the ADC. The multiplexer also offers the possibility to
route any of the two programmable current sources to any analog input (AINx) or to any dedicated reference pin
(REFP0, REFN0).
System Monitors
(V(REFPx) ± V(REFNx)) / 4
(AVDD ± AVSS) / 4
AVDD AVDD
IDAC1 IDAC2 (AVDD + AVSS) / 2
AVDD AVSS
AIN0/REFP1
AVDD AVSS
AVDD
AIN1
Burnout Current Source (10 µA)
AVDD AVSS
AIN2
AINP
AVDD AVSS
PGA To ADC
AINN
AIN3/REFN1
AVDD AVSS
REFP0 Burnout Current Source (10 µA)
AVDD AVSS
AVSS AVSS
REFN0
Figure 38. Analog Input Multiplexer
Electrostatic discharge (ESD) diodes to AVDD and AVSS protect the inputs. To prevent the ESD diodes from
turning on, the absolute voltage on any input must stay within the range provided by Equation 4:
AVSS – 0.3 V < V(AINx) < AVDD + 0.3 V (4)
If the voltages on the input pins have any potential to violate these conditions, external Schottky clamp diodes or
series resistors may be required to limit the input current to safe values (see the Absolute Maximum Ratings
table). Overdriving an unused input on the device may affect conversions taking place on other input pins. If any
overdrive on unused inputs is possible, TI recommends clamping the signal with external Schottky diodes.

ADS1120
Feature Description (continued)

8.3.2 Low-Noise PGA
The device features a low-noise, low-drift, high input impedance, programmable gain amplifier (PGA). The PGA
can be set to gains of 1, 2, 4, 8, 16, 32, 64, or 128. Three bits (GAIN[2:0]) in the configuration register are used
to configure the gain. A simplified diagram of the PGA is shown in Figure 39. The PGA consists of two chopper-
stabilized amplifiers (A1 and A2) and a resistor feedback network that sets the PGA gain. The PGA input is
equipped with an electromagnetic interference (EMI) filter.
200 O
AINP +
25 pF A1
-
RF
OUTP
VIN RG VOUT = Gain·VIN
RF
OUTN
200 O A2
AINN +
25 pF
Figure 39. Simplified PGA Diagram
VIN denotes the differential input voltage VIN = (V(AINP) – V(AINN)). The gain of the PGA can be calculated with
Equation 5:
Gain = 1 + 2 · RF / RG (5)
Gain is changed inside the device using a variable resistor, RG. The differential full-scale input voltage range
(FSR) of the PGA is defined by the gain setting and the reference voltage used, as shown in Equation 6:
FSR = ±Vref / Gain (6)
Table 9 shows the corresponding full-scale ranges when using the internal 2.048-V reference.
Table 9. PGA Full-Scale Range

GAIN SETTING FSR
1 ±2.048 V
2 ±1.024 V
4 ±0.512 V
8 ±0.256 V
16 ±0.128 V
32 ±0.064 V
64 ±0.032 V
128 ±0.016 V

ADS1120
8.3.2.1 PGA Common-Mode Voltage Requirements

To stay within the linear operating range of the PGA, the input signals must meet certain requirements that are
discussed in this section.
The outputs of both amplifiers (A1 and A2) in Figure 39 can not swing closer to the supplies (AVSS and AVDD)
than 200 mV. If the outputs OUTP and OUTN are driven to within 200 mV of the supply rails, the amplifiers
saturate and consequently become nonlinear. To prevent this nonlinear operating condition the output voltages
must meet Equation 7:
AVSS + 0.2 V ≤ V(OUTN), V(OUTP) ≤ AVDD – 0.2 V (7)
Translating the requirements of Equation 7 into requirements referred to the PGA inputs (AINP and AINN) is
beneficial because there is no direct access to the outputs of the PGA. The PGA employs a symmetrical design,
therefore the common-mode voltage at the output of the PGA can be assumed to be the same as the common-
mode voltage of the input signal, as shown in Figure 40.
AINP +
A1
-
½ V IN RF OUTP
½ Gain·V IN
VCM = ½ (V (AINP) + V(AINN)) RG
½ Gain·V IN
RF
½ V IN OUTN
-
A2
AINN +
Figure 40. PGA Common-Mode Voltage
The common-mode voltage is calculated using Equation 8:

VCM = ½ (V(AINP) + V(AINN)) = ½ (V(OUTP) + V(OUTN)) (8)
The voltages at the PGA inputs (AINP and AINN) can be expressed as Equation 9 and Equation 10:
V(AINP) = VCM + ½ VIN (9)
V(AINN) = VCM – ½ VIN (10)
The output voltages (V(OUTP) and V(OUTN)) can then be calculated as Equation 11 and Equation 12:
V(OUTP) = VCM + ½ Gain · VIN (11)
V(OUTN) = VCM – ½ Gain · VIN (12)
The requirements for the output voltages of amplifiers A1 and A2 (Equation 7) can now be translated into
requirements for the input common-mode voltage range using Equation 11 and Equation 12, which are given in
Equation 13 and Equation 14:
VCM (MIN) ≥ AVSS + 0.2 V + ½ Gain · VIN (MAX) (13)
VCM (MAX) ≤ AVDD – 0.2 V – ½ Gain · VIN (MAX) (14)
In order to calculate the minimum and maximum common-mode voltage limits, the maximum differential input
voltage (VIN (MAX)) that occurs in the application must be used. VIN (MAX) can be less than the maximum possible
FS value.
In addition to Equation 13, the minimum VCM must also meet Equation 15 because of the specific design
implementation of the PGA.
VCM (MIN) ≥ AVSS + ¼ (AVDD – AVSS) (15)

ADS1120
Figure 41 and Figure 42 show a graphical representation of the common-mode voltage limits for AVDD = 3.3 V
and AVSS = 0 V, with gain = 1 and gain = 16, respectively.
3.30 3.30
2.75 2.75
2.20 2.20
VCM Range (V)
VCM Range (V)

1.65 1.65
AVDD / 4 AVDD / 4
1.10 1.10
0.55 0.55
0.00 0.00
0.0 0.5 1.0 1.5 2.0 2.5 3.0 0.00 0.03 0.06 0.09 0.12 0.15 0.18
VIN (V) C009 VIN (V) C008
Figure 41. Common-Mode Voltage Limits (Gain = 1) Figure 42. Common-Mode Voltage Limits (Gain = 16)
The following discussion explains how to apply Equation 13 through Equation 15 to a hypothetical application.
The setup for this example is AVDD = 3.3 V, AVSS = 0 V, and gain = 16, using an external reference,
Vref = 2.5 V. The maximum possible differential input voltage VIN = (V(AINP) – V(AINN)) that can be applied is then
limited to the full-scale range of FSR = ±2.5 V / 16 = ±0.156 V. Consequently, Equation 13 through Equation 15
yield an allowed VCM range of 1.45 V ≤ VCM ≤ 1.85 V.
If the sensor signal connected to the inputs in this hypothetical application does not make use of the entire full-
scale range but is limited to VIN (MAX) = ±0.1 V, for example, then this reduced input signal amplitude relaxes the
VCM restriction to 1.0 V ≤ VCM ≤ 2.3 V.
In the case of a fully-differential sensor signal, each input (AINP, AINN) can swing up to ±50 mV around the
common-mode voltage (V(AINP) + V(AINN)) / 2, which must remain between the limits of 1.0 V and 2.3 V. The
output of a symmetrical wheatstone bridge is an example of a fully-differential signal. Figure 43 shows a situation
where the common-mode voltage of the input signal is at the lowest limit. V(OUTN) is exactly at 0.2 V in this case.
Any further decrease in common-mode voltage (VCM) or increase in differential input voltage (VIN) drives V(OUTN)
below 0.2 V and saturates amplifier A2.
V(AINP) = 1.05 V +
A1
-
50 mV RF V(OUTP) = 1.8 V
800 mV
VCM = 1.0 V RF/7.5
800 mV
RF
50 mV V(OUTN) = 0.2 V
-
A2
V(AINN) = 0.95 V +
Figure 43. Example where VCM is at Lowest Limit

ADS1120
In contrast, the signal of an RTD is of a pseudo-differential nature (if implemented as shown in the RTD
Measurement section), where the negative input is held at a constant voltage other than 0 V and only the voltage
on the positive input changes. When a pseudo-differential signal must be measured, the negative input in this
example must be biased at a voltage between 0.95 V and 2.25 V. The positive input can then swing up to
VIN (MAX) = 100 mV above the negative input. Note that in this case the common-mode voltage changes at the
same time the voltage on the positive input changes. That is, while the input signal swings between 0 V ≤ VIN ≤
VIN (MAX), the common-mode voltage swings between V(AINN) ≤ VCM ≤ V(AINN) + ½ VIN (MAX). Satisfying the
common-mode voltage requirements for the maximum input voltage VIN (MAX) ensures the requirements are met
throughout the entire signal range.
Figure 44 and Figure 45 show examples of both fully-differential and pseudo-differential signals, respectively.
AINP
AINP VCM
100 mV
VCM
1.0 V 100 mV 1.0 V
AINN
AINN
0V 0V
Figure 44. Fully-Differential Input Signal Figure 45. Pseudo-Differential Input Signal
NOTE
Remember, common-mode voltage requirements with PGA enabled (Equation 13 to
Equation 15) are as follows:
• VCM (MIN) ≥ AVSS + ¼ (AVDD – AVSS)
• VCM (MIN) ≥ AVSS + 0.2 V + ½ Gain · VIN (MAX)
• VCM (MAX) ≤ AVDD – 0.2 V – ½ Gain · VIN (MAX)
8.3.2.2 Bypassing the PGA
At gains of 1, 2, and 4, the device can be configured to disable and bypass the low-noise PGA by setting the
PGA_BYPASS bit in the configuration register. Disabling the PGA lowers the overall power consumption and
also removes the restrictions of Equation 13 through Equation 15 for the common-mode input voltage range,
VCM. The usable absolute and common-mode input voltage range is (AVSS – 0.1 V ≤ V(AINx), VCM ≤ AVDD +
0.1 V) when the PGA is disabled.
In order to measure single-ended signals that are referenced to AVSS (AINP = VIN, AINN = AVSS), the PGA must
be bypassed. Configure the device for single-ended measurements by either connecting one of the analog inputs
to AVSS externally or by using the internal AVSS connection of the multiplexer (MUX[3:0] settings 1000 through
1011). When configuring the internal multiplexer for settings where AINN = AVSS (MUX[3:0] = 1000 through
1011) the PGA is automatically bypassed and disabled irrespective of the PGA_BYPASS setting and gain is
limited to 1, 2, and 4. In case gain is set to greater than 4, the device limits gain to 4.
When the PGA is disabled, the device uses a buffered switched-capacitor stage to obtain gains of 1, 2, and 4. An
internal buffer in front of the switched-capacitor stage ensures that the effect on the input loading resulting from
the capacitor charging and discharging is minimal. See Figure 21 to Figure 26 for the typical values of absolute
input currents (current flowing into or out of each input) and differential input currents (difference in absolute
current between positive and negative input) when the PGA is disabled.
For signal sources with high output impedance, external buffering may still be necessary. Note that active buffers
introduce noise and also introduce offset and gain errors. Consider all of these factors in high-accuracy
applications.

ADS1120
8.3.3 Modulator
A ΔΣ modulator is used in the ADS1120 to convert the analog input voltage into a pulse code modulated (PCM)
data stream. The modulator runs at a modulator clock frequency of f(MOD) = f(CLK) / 16 in normal and duty-cycle
mode and f(MOD) = f(CLK) / 8 in turbo mode, where f(CLK) is either provided by the internal oscillator or the external
clock source. Table 10 shows the modulator frequency for each operating mode using either the internal
oscillator or an external clock of 4.096 MHz.
Table 10. Modulator Clock Frequency for Different

Operating Modes (1)
OPERATING MODE f(MOD)
Duty-cycle mode 256 kHz
Normal mode 256 kHz
Turbo mode 512 kHz
(1) Using the internal oscillator or an external 4.096-MHz clock.
8.3.4 Digital Filter

The device uses a linear-phase finite impulse response (FIR) digital filter that performs both filtering and
decimation of the digital data stream coming from the modulator. The digital filter is automatically adjusted for the
different data rates and always settles within a single cycle. At data rates of 5 SPS and 20 SPS, the filter can be
configured to reject 50-Hz or 60-Hz line frequencies or to simultaneously reject 50 Hz and 60 Hz. Two bits
(50/60[1:0]) in the configuration register are used to configure the filter accordingly. The frequency responses of
the digital filter are shown in Figure 46 to Figure 59 for different output data rates using the internal oscillator or
an external 4.096-MHz clock.
The filter notches and output data rate scale proportionally with the clock frequency. For example, a notch that
appears at 20 Hz when using a 4.096-MHz clock appears at 10 Hz if a 2.048-MHz clock is used. Note that the
internal oscillator can vary over temperature as specified in the Electrical Characteristics table. The data rate or
conversion time, respectively, and filter notches consequently vary by the same amount. Consider using an
external precision clock source if a digital filter notch at a specific frequency with a tighter tolerance is required.
0 0
±40 ±40
Magnitude (dB)
Magnitude (dB)
±80 ±80
±120 ±120
±160 ±160
±200 ±200
0 20 40 60 80 100 120 140 160 180 200 46 48 50 52 54 56 58 60 62 64
Frequency (Hz) C049 Frequency (Hz) C050
Simultaneous 50-Hz and 60-Hz Rejection, 50/60[1:0] = 01 Simultaneous 50-Hz and 60-Hz Rejection, 50/60[1:0] = 01
Figure 46. Filter Response Figure 47. Detailed View of Filter Response
(DR = 20 SPS) (DR = 20 SPS)

ADS1120
0 0
±40 ±40
Magnitude (dB)
Magnitude (dB)
±80 ±80
±120 ±120
±160 ±160
±200 ±200
0 20 40 60 80 100 120 140 160 180 200 46 47 48 49 50 51 52 53 54
50-Hz Rejection Only, 50/60[1:0] = 10 50-Hz Rejection Only, 50/60[1:0] = 10
(DR = 20 SPS) (DR = 20 SPS)
0 0
±40 ±40
Magnitude (dB)
±80 Magnitude (dB) ±80
±120 ±120
±160 ±160
±200 ±200
0 20 40 60 80 100 120 140 160 180 200 56 57 58 59 60 61 62 63 64
60-Hz Rejection Only, 50/60[1:0] = 11 60-Hz Rejection Only, 50/60[1:0] = 11
(DR = 20 SPS) (DR = 20 SPS)
0 0
±20 ±20
Magnitude (dB)
Magnitude (dB)
±40 ±40
±60 ±60
±80 ±80
0 20 40 60 80 100 120 140 160 180 200 0 20 40 60 80 100 120 140 160 180 200
50/60[1:0] = 00
Figure 52. Filter Response Figure 53. Filter Response

(DR = 20 SPS) (DR = 45 SPS)

ADS1120
0 0
±20 ±20
Magnitude (dB)
Magnitude (dB)
±40 ±40
±60 ±60
±80 ±80
0 100 200 300 400 500 600 700 800 900 1000 0 100 200 300 400 500 600 700 800 900 1000

(DR = 90 SPS) (DR = 175 SPS)
0 0
±20 ±20
Magnitude (dB)
Magnitude (dB)
±40 ±40
±60 ±60
±80 ±80
0 200 400 600 800 1000 1200 1400 1600 1800 2000 0 500 1000 1500 2000 2500 3000 3500 4000

(DR = 330 SPS) (DR = 600 SPS)
0 0
±20 ±20
Magnitude (dB)
Magnitude (dB)
±40 ±40
±60 ±60
±80 ±80
0 1 2 3 4 5 6 7 8 9 10 0 1 2 3 4 5 6 7 8 9 10
Frequency (kHz) C057 Frequency (kHz) C058

(DR = 1 kSPS) (DR = 2 kSPS)

ADS1120
8.3.5 Output Data Rate

Table 11 shows the actual conversion times for each data rate setting. The values provided are in terms of t(CLK)
cycles using an external clock with a clock frequency of f(CLK) = 4.096 MHz. The data rates scale proportionally in
case an external clock with a frequency other than 4.096 MHz is used.
Continuous conversion mode data rates are timed from one DRDY falling edge to the next DRDY falling edge.
The first conversion starts 210 · t(CLK) (normal mode, duty-cycle mode) or 114 · t(CLK) (turbo mode) after the last
SCLK falling edge of the START/SYNC command.
Single-shot mode data rates are timed from the last SCLK falling edge of the START/SYNC command to the
DRDY falling edge and rounded to the next t(CLK). In case the internal oscillator is used, an additional oscillator
wake-up time of up to 50 µs (normal mode, duty-cycle mode) or 25 µs (turbo mode) must be added in single-shot
mode. The internal oscillator starts to power up at the first SCLK rising edge of the START/SYNC command. If
an SCLK frequency higher than 160 kHz (normal mode, duty-cycle mode) or 320 kHz (turbo mode) is used, the
oscillator may not be fully powered up at the end of the START/SYNC command. The ADC then waits until the
internal oscillator is fully powered up before starting a conversion.
Single-shot conversion times in duty-cycle mode are the same as in normal mode. See the Duty-Cycle Mode
section for more details on duty-cycle mode operation.
Table 11. Conversion Times

NOMINAL DATA RATE –3-dB BANDWIDTH ACTUAL CONVERSION TIME (t(CLK))
(SPS) (Hz) CONTINUOUS CONVERSION MODE SINGLE-SHOT MODE
Normal Mode
20 13.1 204768 204850
45 20.0 91120 91218
90 39.6 46128 46226
175 77.8 23664 23762
330 150.1 12464 12562
600 279.0 6896 6994
1000 483.8 4144 4242
Duty-Cycle Mode
5 13.1 823120 n/a
11.25 20.0 364560 n/a
22.5 39.6 184592 n/a
44 77.8 94736 n/a
82.5 150.1 49936 n/a
150 279.0 27664 n/a
250 483.8 16656 n/a
Turbo Mode
40 26.2 102384 102434
90 39.9 45560 45618
180 79.2 23064 23122
350 155.6 11832 11890
660 300.3 6232 6290
1200 558.1 3448 3506
2000 967.6 2072 2130
Note that even though the conversion time at the 20-SPS setting is not exactly 1 / 20 Hz = 50 ms, this
discrepancy does not affect the 50-Hz or 60-Hz rejection. To achieve the 50-Hz and 60-Hz rejection specified in
the Electrical Characteristics, the external clock frequency must be 4.096 MHz. When using the internal
oscillator, the conversion time and filter notches vary by the amount specified in the Electrical Characteristics
table for oscillator accuracy.

ADS1120
8.3.6 Voltage Reference

The device offers an integrated low-drift, 2.048-V reference. For applications that require a different reference
voltage value or a ratiometric measurement approach, the device offers two differential reference input pairs
(REFP0, REFN0 and REFP1, REFN1). In addition, the analog supply (AVDD – AVSS) can be used as a
reference.
The reference source is selected by two bits (VREF[1:0]) in the configuration register. By default, the internal
reference is selected. The internal voltage reference requires less than 25 µs to fully settle after power-up, when
coming out of power-down mode, or when switching from an external reference source to the internal reference.
The differential reference inputs allow freedom in the reference common-mode voltage. REFP0 and REFN0 are
dedicated reference inputs whereas REFP1 and REFN1 are shared with inputs AIN0 and AIN3, respectively. All
reference inputs are internally buffered to increase input impedance. Therefore, additional reference buffers are
usually not required when using an external reference. When used in ratiometric applications, the reference
inputs do not load the external circuitry. Note that the analog supply current increases when using an external
reference because the reference buffers are enabled.
In most cases the conversion result is directly proportional to the stability of the reference source. Any noise and
drift of the voltage reference is reflected in the conversion result.
8.3.7 Clock Source

The device system clock can either be provided by the internal low-drift oscillator or by an external clock source
on the CLK input. Connect the CLK pin to DGND before power-up or reset to activate the internal oscillator.
Connecting an external clock to the CLK pin at any time deactivates the internal oscillator after two rising edges
on the CLK pin are detected. The device then operates on the external clock. After the ADS1120 switches to the
external clock, the device can only be switched back to the internal oscillator by cycling the power supplies or by
sending a RESET command.
8.3.8 Excitation Current Sources

The device provides two matched programmable excitation current sources (IDACs) for RTD applications. The
output current of the current sources can be programmed to 50 μA, 100 μA, 250 μA, 500 μA, 1000 μA, or 1500
μA using the respective bits (IDAC[2:0]) in the configuration register. Each current source can be connected to
any of the analog inputs (AINx) as well as to any of the dedicated reference inputs (REFP0 and REFN0). Both
current sources can also be connected to the same pin. Routing of the IDACs is configured by bits (I1MUX[2:0],
I2MUX[2:0]) in the configuration register. Care must be taken not to exceed the compliance voltage of the IDACs.
In other words, limit the voltage on the pin where the IDAC is routed to ≤ (AVDD – 0.9 V), otherwise the specified
accuracy of the IDAC current is not met. For three-wire RTD applications, the matched current sources can be
used to cancel errors caused by sensor lead resistance (see the 3-Wire RTD Measurement section for more
details).
The IDACs require up to 200 µs to start up after the IDAC current is programmed to the respective value using
bits IDAC[2:0]. If configuration registers 2 and 3 are not written during the same WREG command, TI
recommends to first set the IDAC current to the respective value using bits IDAC[2:0] and thereafter select the
routing for each IDAC (I1MUX[2:0], I2MUX[2:0]).
In single-shot mode, the IDACs remain active between any two conversions if the IDAC[2:0] bits are set to a
value other than 000. However, the IDACs are powered down whenever the POWERDOWN command is issued.
Note that the analog supply current increases when enabling the IDACs (that is, when the IDAC[2:0] bits are set
to a value other than 000). The IDAC circuit needs this bias current to operate even when the IDACs are not
routed to any pin (I1MUX[2:0] = I2MUX[2:0] = 000). In addition, the selected output current is drawn from the
analog supply when I1MUX[2:0] or I2MUX[2:0] are set to a value other than 000.

ADS1120
8.3.9 Low-Side Power Switch

A low-side power switch with low on-resistance connected between the analog input AIN3/REFN1 and AVSS is
integrated in the device as well. This power switch can be used to reduce system power consumption in bridge
sensor applications by powering down the bridge circuit between conversions. When the respective bit (PSW) in
the configuration register is set, the switch automatically closes when the START/SYNC command is sent and
opens when the POWERDOWN command is issued. Note that the switch stays closed between conversions in
single-shot mode in case the PSW bit is set to 1. The switch can be opened at any time by setting the PSW bit to
0. By default, the switch is always open.
8.3.10 Sensor Detection

To help detect a possible sensor malfunction, the device provides internal 10-µA, burn-out current sources.
When enabled by setting the respective bit (BCS) in the configuration register, one current source sources
current to the positive analog input (AINP) currently selected while the other current source sinks current form the
selected negative analog input (AINN).
In case of an open circuit in the sensor, these burn-out current sources pull the positive input towards AVDD and
the negative input towards AVSS, resulting in a full-scale reading. A full-scale reading may also indicate that the
sensor is overloaded or that the reference voltage is absent. A near-zero reading may indicate a shorted sensor.
Note that the absolute value of the burn-out current sources typically varies by ±10% and the internal multiplexer
adds a small series resistance. Therefore, distinguishing a shorted sensor condition from a normal reading can
be difficult, especially if an RC filter is used at the inputs. In other words, even if the sensor is shorted, the
voltage drop across the external filter resistance and the residual resistance of the multiplexer causes the output
to read a value higher than zero.
Keep in mind that ADC readings of a functional sensor may be corrupted when the burn-out current sources are
enabled. TI recommends disabling the burn-out current sources when preforming the precision measurement,
and only enabling them to test for sensor fault conditions.
8.3.11 System Monitor

The device provides some means for monitoring the analog power supply and the external voltage reference. To
select a monitoring voltage, the internal multiplexer (MUX[3:0]) must be configured accordingly in the
configuration register. The device automatically bypasses the PGA and sets the gain to 1, irrespective of the
configuration register settings while the monitoring feature is used. Note that the system monitor function only
provides a coarse result and is not meant to be a precision measurement.
When measuring the analog power supply (MUX[3:0] = 1101), the resulting conversion is approximately (AVDD –
AVSS) / 4. The device uses the internal 2.048-V reference for the measurement regardless of what reference
source is selected in the configuration register (VREF[1:0]).
When monitoring one of the two possible external reference voltage sources (MUX[3:0] = 1100), the result is
approximately (V(REFPx) – V(REFNx)) / 4. REFPx and REFNx denote the external reference input pair selected in
the configuration register (VREF[1:0]). The device automatically uses the internal reference for the measurement.
8.3.12 Offset Calibration

The internal multiplexer offers the option to short both PGA inputs (AINP and AINN) to mid-supply (AVDD +
AVSS) / 2. This option can be used to measure and calibrate the device offset voltage by storing the result of the
shorted input voltage reading in a microcontroller and consequently subtracting the result from each following
reading. TI recommends taking multiple readings with the inputs shorted and averaging the result to reduce the
effect of noise.

ADS1120
8.3.13 Temperature Sensor

The ADS1120 offers an integrated precision temperature sensor. The temperature sensor mode is enabled by
setting bit TS = 1 in the configuration register. When in temperature sensor mode, the settings of configuration
register 0 have no effect and the device uses the internal reference for measurement, regardless of the selected
voltage reference source. Temperature readings follow the same process as the analog inputs for starting and
reading conversion results. Temperature data are represented as a 14-bit result that is left-justified within the 16-
bit conversion result. Data are output starting with the most significant byte (MSB). When reading the two data
bytes, the first 14 bits are used to indicate the temperature measurement result. One 14-bit LSB equals
0.03125°C. Negative numbers are represented in binary twos complement format, as shown in Table 12.
Table 12. 14-Bit Temperature Data Format

DIGITAL OUTPUT
TEMPERATURE (°C)
BINARY HEX
128 01 0000 0000 0000 1000
127.96875 00 1111 1111 1111 0FFF
100 00 1100 1000 0000 0C80
75 00 1001 0110 0000 0960
50 00 0110 0100 0000 0640
25 00 0011 0010 0000 0320
0.25 00 0000 0000 1000 0008
0.03125 00 0000 0000 0001 0001
0 00 0000 0000 0000 0000
–0.25 11 1111 1111 1000 3FF8
–25 11 1100 1110 0000 3CE0
–55 11 1001 0010 0000 3920
8.3.13.1 Converting from Temperature to Digital Codes
8.3.13.1.1 For Positive Temperatures (for Example, 50°C):

Twos complement is not performed on positive numbers. Therefore, simply convert the number to binary code in
a 14-bit, left-justified format with the MSB = 0 to denote the positive sign.
Example: 50°C / (0.03125°C per count) = 1600 = 0640h = 00 0110 0100 0000
8.3.13.1.2 For Negative Temperatures (for Example, –25°C):

Generate the twos complement of a negative number by complementing the absolute binary number and adding
1. Then, denote the negative sign with the MSB = 1.
Example: |–25°C| / (0.03125°C per count) = 800 = 0320h = 00 0011 0010 0000
Twos complement format: 11 1100 1101 1111 + 1 = 11 1100 1110 0000
8.3.13.2 Converting from Digital Codes to Temperature

To convert from digital codes to temperature, first check whether the MSB is a 0 or a 1. If the MSB is a 0, simply
multiply the decimal code by 0.03125°C to obtain the result. If the MSB = 1, subtract 1 from the result and
complement all bits. Then, multiply the result by –0.03125°C.
Example: The device reads back 0960h: 0960h has an MSB = 0.
0960h · 0.03125°C = 2400 · 0.03125°C = 75°C
Example: The device reads back 3CE0h: 3CE0h has an MSB = 1.
Subtract 1 and complement the result: 3CE0h → 0320h
0320h · (–0.03125°C) = 800 · (–0.03125°C) = –25°C

ADS1120
8.4 Device Functional Modes

8.4.1 Power-Up and Reset
When the device powers up, a reset is performed. The reset process takes approximately 50 µs. After this
power-up reset time, all internal circuitry (including the voltage reference) are stable and communication with the
device is possible. As part of the reset process, the device sets all bits in the configuration registers to the
respective default settings. By default, the device is set to single-shot mode. After power-up, the device performs
a single conversion using the default register settings and then enters a low-power state. When the conversion is
complete, the DRDY pin transitions from high to low. The high-to-low transition of the DRDY pin can be used to
signal that the ADS1120 is operational and ready to use. The power-up behavior is intended to prevent systems
with tight power-supply requirements from encountering a current surge during power-up.
8.4.2 Conversion Modes

The device can be operated in one of two conversion modes that can be selected by the CM bit in the
configuration register. These conversion modes are single-shot and continuous conversion mode.
8.4.2.1 Single-Shot Mode

In single-shot mode, the device only performs a conversion when a START/SYNC command is issued. The
device consequently performs one single conversion and returns to a low-power state afterwards. The internal
oscillator and all analog circuitry (except for the excitation current sources) are turned off while the device waits
in this low-power state until the next conversion is started. In addition, every write access to any configuration
register also starts a new conversion. Writing to any configuration register while a conversion is ongoing
functions as a new START/SYNC command that stops the current conversion and restarts a single new
conversion. Each conversion is fully settled (assuming the analog input signal settles to its final value before the
conversion starts) because the device digital filter settles within a single cycle.
8.4.2.2 Continuous Conversion Mode

In continuous conversion mode, the device continuously performs conversions. When a conversion completes,
the device places the result in the output buffer and immediately begins another conversion.
In order to start continuous conversion mode, the CM bit must be set to 1 followed by a START/SYNC command.
The first conversion starts 210 · t(CLK) (normal mode, duty-cycle mode) or 114 · t(CLK) (turbo mode) after the last
SCLK falling edge of the START/SYNC command. Writing to any configuration register during an ongoing
conversion restarts the current conversion. TI recommends always sending a START/SYNC command
immediately after the CM bit is set to 1.

ADS1120
Device Functional Modes (continued)

8.4.3 Operating Modes
In addition to the different conversion modes, the device can also be operated in different operating modes that
can be selected to trade-off power consumption, noise performance, and output data rate. These modes are:
normal mode, duty-cycle mode, turbo mode, and power-down mode.
8.4.3.1 Normal Mode

Normal mode is the default mode of operation after power-up. In this mode, the internal modulator of the ΔΣ ADC
runs at a modulator clock frequency of f(MOD) = f(CLK) / 16, where the system clock (f(CLK)) is either provided by the
internal oscillator or the external clock source. The modulator frequency is 256 kHz when using the internal
oscillator. Normal mode offers output data rate options ranging from 20 SPS to 1 kSPS with the internal
oscillator. The data rate is selected by the DR[2:0] bits in the configuration register. In case an external clock
source with a clock frequency other than 4.096 MHz is used, the data rates scale accordingly. For example,
using an external clock with f(CLK) = 2.048 MHz yields data rates ranging from 10 SPS to 500 SPS.
8.4.3.2 Duty-Cycle Mode

The noise performance of a ΔΣ ADC generally improves when lowering the output data rate because more
samples of the internal modulator can be averaged to yield one conversion result. In applications where power
consumption is critical, the improved noise performance at low data rates may not be required. For these
applications, the device supports an automatic duty-cycle mode that can yield significant power savings by
periodically entering a low-power state between conversions. In principle, the device runs in normal mode with a
duty cycle of 25%. This functionality means the device performs one conversion in the same manner as when
running in normal mode but then automatically enters a low power-state for three consecutive conversion cycles.
The noise performance in duty-cycle mode is therefore comparable to the noise performance in normal mode at
four times the data rate. Data rates in duty-cycle mode range from 5 SPS to 250 SPS with the internal oscillator.
8.4.3.3 Turbo Mode

Applications that require higher data rates up to 2 kSPS can operate the device in turbo mode. In this mode, the
internal modulator runs at a higher frequency of f(MOD) = f(CLK) / 8. f(MOD) equals 512 kHz when the internal
oscillator or an external 4.096-MHz clock is used. Note that the device power consumption increases because
the modulator runs at a higher frequency. Running the ADS1120 in turbo mode at a comparable output data rate
as in normal mode yields better noise performance. For example, the input-referred noise at 90 SPS in turbo
mode is lower than the input-referred noise at 90 SPS in normal mode.
8.4.3.4 Power-Down Mode

When the POWERDOWN command is issued, the device enters power-down mode after completing the current
conversion. In this mode, all analog circuitry (including the voltage reference and both IDACs) are powered
down, the low-side power switch is opened, and the device typically only uses 400 nA of current. While in power-
down mode, the device holds the configuration register settings and responds to commands, but does not
perform any data conversions.
Issuing a START/SYNC command wakes up the device and either starts a single conversion or starts continuous
conversion mode, depending on the conversion mode selected by the CM bit. Note that writing to any
configuration register wakes up the device as well, but only starts a single conversion regardless of the selected
conversion mode (CM).

ADS1120
8.5 Programming
8.5.1 Serial Interface
The SPI-compatible serial interface of the device is used to read conversion data, read and write the device
configuration registers, and control device operation. Only SPI mode 1 (CPOL = 0, CPHA = 1) is supported. The
interface consists of five control lines (CS, SCLK, DIN, DOUT/DRDY, and DRDY) but can be used with only four
or even three control signals as well. The dedicated data-ready signal (DRDY) can be configured to be shared
with DOUT/DRDY. If the serial bus is not shared with any other device, CS can be tied low permanently so that
only signals SCLK, DIN, and DOUT/DRDY are required to communicate with the device.
8.5.1.1 Chip Select (CS)

Chip select (CS) is an active-low input that selects the device for SPI communication. This feature is useful when
multiple devices share the same serial bus. CS must remain low for the duration of the serial communication.
When CS is taken high, the serial interface is reset, SCLK is ignored, and DOUT/DRDY enters a high-impedance
state; as such, DOUT/DRDY cannot indicate when data are ready. In situations where multiple devices are
present on the bus, the dedicated DRDY pin can provide an uninterrupted monitor of the conversion status. If the
serial bus is not shared with another peripheral, CS can be tied low.
8.5.1.2 Serial Clock (SCLK)

The serial clock (SCLK) features a Schmitt-triggered input and is used to clock data into and out of the device on
the DIN and DOUT/DRDY pins, respectively. Even though the input has hysteresis, TI recommends keeping the
SCLK signal as clean as possible to prevent glitches from accidentally shifting the data. When the serial interface
is idle, hold SCLK low.
8.5.1.3 Data Ready (DRDY)

DRDY indicates when a new conversion result is ready for retrieval. When DRDY falls low, new conversion data
are ready. DRDY transitions back high on the next SCLK rising edge. When no data are read during continuous
conversion mode, DRDY remains low but pulses high for a duration of 2 · t(MOD) prior to the next DRDY falling
edge. The DRDY pin is always actively driven, even when CS is high.
8.5.1.4 Data Input (DIN)

The data input pin (DIN) is used along with SCLK to send data (commands and register data) to the device. The
device latches data on DIN on the SCLK falling edge. The device never drives the DIN pin.
8.5.1.5 Data Output and Data Ready (DOUT/DRDY)

DOUT/DRDY serves a dual-purpose function. This pin is used with SCLK to read conversion and register data
from the device. Data on DOUT/DRDY are shifted out on the SCLK rising edge. DOUT/DRDY goes to a high-
impedance state when CS is high.
In addition, the DOUT/DRDY pin can also be configured as a data-ready indicator by setting the DRDYM bit high
in the configuration register. DOUT/DRDY then transitions low at the same time that the DRDY pin goes low to
indicate new conversion data are available. Both signals can be used to detect if new data are ready. However,
because DOUT/DRDY is disabled when CS is high, the recommended method of monitoring the end of a
conversion when multiple devices are present on the SPI bus is to use the dedicated DRDY pin.
8.5.1.6 SPI Timeout

The ADS1120 offers an SPI timeout feature that can be used to recover communication when a serial interface
transmission is interrupted. This feature is especially useful in applications where CS is permanently tied low and
is not used to frame a communication sequence. Whenever a complete command is not sent within 13955 ·
t(MOD) (normal mode, duty-cycle mode) or 27910 · t(MOD) (turbo mode), the serial interface resets and the next
SCLK pulse starts a new communication cycle. See the Modulator section for details on the modulator frequency
(f(MOD) = 1 / t(MOD)) in the different operating modes. For the RREG and WREG commands, a complete command
includes the command byte itself plus the register bytes that are read or written.

ADS1120
Programming (continued)
8.5.2 Data Format
The device provides 16 bits of data in binary twos complement format. The size of one code (LSB) is calculated
using Equation 16.
1 LSB = (2 · Vref / Gain) / 216 = +FS / 215 (16)
A positive full-scale input [VIN ≥ (+FS – 1 LSB) = (Vref / Gain – 1 LSB)] produces an output code of 7FFFh and a
negative full-scale input (VIN ≤ –FS = –Vref / Gain) produces an output code of 8000h. The output clips at these
codes for signals that exceed full-scale.
Table 13 summarizes the ideal output codes for different input signals.
Table 13. Ideal Output Code versus Input Signal

INPUT SIGNAL
VIN = (V(AINP) – V(AINN)) IDEAL OUTPUT CODE (1)
15 15
≥ +FS (2 – 1) / 2 7FFFh
+FS / 215 0001h
0 0000h
15
–FS / 2 FFFFh
≤ –FS 8000h
(1) Excludes the effects of noise, INL, offset, and gain errors.
Mapping of the analog input signal to the output codes is shown in Figure 60.
0x7FFF
0x7FFE
¼
Output Code
0x0001
0x0000
0xFFFF
¼
0x8001
0x8000
-FS ¼ 0 ¼ FS
Input Voltage (VIN)
15 15
2 -1 2 -1
-FS FS
15 15
2 2
Figure 60. Code Transition Diagram

ADS1120
8.5.3 Commands
The device offers six different commands to control device operation, as shown in Table 14. Four commands are
stand-alone instructions (RESET, START/SYNC, POWERDOWN, and RDATA). The commands to read (RREG)
and write (WREG) configuration register data from and to the device require additional information as part of the
instruction.
Table 14. Command Definitions

COMMAND DESCRIPTION COMMAND BYTE (1)
RESET Reset the device 0000 011x
START/SYNC Start or restart conversions 0000 100x
POWERDOWN Enter power-down mode 0000 001x
RDATA Read data by command 0001 xxxx
RREG Read nn registers starting at address rr 0010 rrnn
WREG Write nn registers starting at address rr 0100 rrnn
(1) Operands: rr = configuration register (00 to 11), nn = number of bytes – 1 (00 to 11), and x = don't care.
8.5.3.1 RESET (0000 011x)

Resets the device to the default values. Wait at least (50 µs + 32 · t(CLK)) after the RESET command is sent
before sending any other command.
8.5.3.2 START/SYNC (0000 100x)

In single-shot mode, the START/SYNC command is used to start a single conversion, or (when sent during an
ongoing conversion) to reset the digital filter, and then restarts a single new conversion. When the device is set
to continuous conversion mode, the START/SYNC command must be issued one time to start converting
continuously. Sending the START/SYNC command while converting in continuous conversion mode resets the
digital filter and restarts continuous conversions.
8.5.3.3 POWERDOWN (0000 001x)

The POWERDOWN command places the device into power-down mode. This command shuts down all internal
analog components, opens the low-side switch, turns off both IDACs, but holds all register values. In case the
POWERDOWN command is issued while a conversion is ongoing, the conversion completes before the
ADS1120 enters power-down mode. As soon as a START/SYNC command is issued, all analog components
return to their previous states.
8.5.3.4 RDATA (0001 xxxx)

The RDATA command loads the output shift register with the most recent conversion result. This command can
be used when DOUT/DRDY or DRDY are not monitored to indicate that a new conversion result is available. If a
conversion finishes in the middle of the RDATA command byte, the state of the DRDY pin at the end of the read
operation signals whether the old or the new result is loaded. If the old result is loaded, DRDY stays low,
indicating that the new result is not read out. The new conversion result loads when DRDY is high.
8.5.3.5 RREG (0010 rrnn)

The RREG command reads the number of bytes specified by nn (number of bytes to be read – 1) from the
device configuration register, starting at register address rr. The command is completed after nn + 1 bytes are
clocked out after the RREG command byte. For example, the command to read three bytes (nn = 10) starting at
configuration register 1 (rr = 01) is 0010 0110.
8.5.3.6 WREG (0100 rrnn)

The WREG command writes the number of bytes specified by nn (number of bytes to be written – 1) to the
device configuration register, starting at register address rr. The command is completed after nn + 1 bytes are
clocked in after the WREG command byte. For example, the command to write two bytes (nn = 01) starting at
configuration register 0 (rr = 00) is 0100 0001. The configuration registers are updated on the last SCLK falling
edge.

ADS1120
8.5.4 Reading Data

Output pins DRDY and DOUT/DRDY (if the DRDYM bit is set high in the configuration register) transition low
when new data are ready for retrieval. The conversion data are written to an internal data buffer. Data can be
read directly from this buffer on DOUT/DRDY when DRDY falls low without concern of data corruption. An
RDATA command does not have to be sent. Data are shifted out on the SCLK rising edges, MSB first, and
consist of two bytes of data.
Figure 61 to Figure 63 show the timing diagrams for reading conversion data in continuous conversion mode and
single-shot mode when not using the RDATA command.
CS
§
§
1 9
SCLK
§ § § § §
§ § § §
Hi-Z
DOUT/DRDY DATA MSB DATA LSB
DRDY Next Data Ready

2· t(MOD)
DIN
§
§
Figure 61. Continuous Conversion Mode (DRDYM = 0)
CS
§
§
1 9
SCLK
§ § § § §
§ § § §
Hi-Z

2· t(MOD)
DIN
§
§
Figure 62. Continuous Conversion Mode (DRDYM = 1)
CS
§
1 1 9
SCLK
§ § § § §
§ § § §
Hi-Z
DIN START/SYNC
§
Figure 63. Single-Shot Mode (DRDYM = 0)
Data can also be read at any time without synchronizing to the DRDY signal using the RDATA command. When
an RDATA command is issued, the conversion result currently stored in the data buffer is shifted out on
DOUT/DRDY on the following SCLK rising edges. Data can be read continuously with the RDATA command as
an alternative to monitoring DRDY or DOUT/DRDY. The DRDY pin can be polled after the LSB is clocked out to
determine if a new conversion result was loaded. If a new conversion completes during the read operation but
data from the previous conversion are read, then DRDY is low. Otherwise, if the most recent result is read,
DRDY is high. Figure 64 and Figure 65 illustrate the behavior for both cases.

ADS1120
CS
§
1 1 9
SCLK
§ § § § §
§ § §
Hi-Z
DIN RDATA
§
§
Figure 64. State of DRDY when a New Conversion Finishes During an RDATA Command
CS
§
§
1 1 9
SCLK
§ § § § §
§ § § §
Hi-Z
DIN RDATA
§
§
Figure 65. State of DRDY when the Most Recent Conversion Result is Read During an RDATA Command
8.5.5 Sending Commands

The device serial interface is capable of full-duplex operation while reading conversion data when not using the
RDATA command. Full-duplex operation means commands are decoded at the same time that conversion data
are read. Commands can be sent on any 8-bit data boundary during a data read operation. When a RREG or
RDATA command is recognized, the current data read operation is aborted and the conversion data are
corrupted, unless the command is sent while the last byte of the conversion result is retrieved. The device starts
to output the requested data on DOUT/DRDY at the first SCLK rising edge after the command byte. To read data
without interruption, keep DIN low while clocking out data.
A WREG command can be sent without corrupting an ongoing read operation. Figure 66 shows an example for
sending a WREG command to write two configuration registers while reading conversion data in continuous
conversion mode. After the command is clocked in (after the 32nd SCLK falling edge), the device resets the
digital filter and starts converting with the new register settings. The WREG command can be sent on any of the
8-bit boundaries.
CS
§
1 9 17 25
SCLK
§ § § § §
§ §
Hi-Z
§

2· t(MOD)
DIN WREG REG_DATA REG_DATA
§
Figure 66. Example of Reading Data while Simultaneously Sending a WREG Command
Note that the serial interface does not decode commands while an RDATA or RREG command is executed. That
is, all 16 bits of the conversion result must be read after the RDATA command is issued and all requested
registers must be read after a RREG command is sent before a new command can be issued.

ADS1120
8.5.6 Interfacing with Multiple Devices

When connecting multiple ADS1120 devices to a single SPI bus, SCLK, DIN, and DOUT/DRDY can be safely
shared by using a dedicated chip-select (CS) line for each SPI-enabled device. When CS transitions high for the
respective device, DOUT/DRDY enters a 3-state mode. Therefore, DOUT/DRDY cannot be used to indicate
when new data are available if CS is high, regardless of the DRDYM bit setting in the configuration register. Only
the dedicated DRDY pin indicates that new data are available, because the DRDY pin is actively driven even
when CS is high.
In some cases the DRDY pin cannot be interfaced to the microcontroller. This scenario can occur if there are
insufficient GPIO channels available on the microcontroller or if the serial interface must be galvanically isolated
and thus the amount of channels must be limited. Therefore, in order to evaluate when a new conversion of one
of the devices is ready, the microcontroller can periodically drop CS to the respective device and poll the state of
the DOUT/DRDY pin. When CS goes low, the DOUT/DRDY pin immediately drives either high or low, provided
that the DRDYM bit is configured to 1. If the DOUT/DRDY line drives low, when CS is taken low, new data are
currently available. If the DOUT/DRDY line drives high, no new data are available. This procedure requires that
DOUT/DRDY is high after reading each conversion result and before taking CS high. To make sure DOUT/DRDY
is taken high, send 16 additional SCLKs with DIN held low after each data read operation. DOUT/DRDY reads
low during the first eight SCLKs after the conversion result is read, and reads high during the following eight
SCLKs, as shown in Figure 67. Alternatively, valid data can be retrieved from the device at any time without
concern of data corruption by using the RDATA command.
§
CS
§
1 9 17 25
SCLK
§ § § §
§
Hi-Z
§
§
DIN
§
§
Figure 67. Example of Taking DOUT/DRDY High After Reading a Conversion Result
8.6 Register Map

8.6.1 Configuration Registers
The device has four 8-bit configuration registers that are accessible through the serial interface using the RREG
and WREG commands. The configuration registers control how the device operates and can be changed at any
time without causing data corruption. After power-up or reset, all registers are set to the default values (which are
all 0). All registers retain their values during power-down mode. Table 15 shows the register map of the
configuration registers.
Table 15. Configuration Register Map

REGISTER
BIT 7 BIT 6 BIT 5 BIT 4 BIT 3 BIT 2 BIT 1 BIT 0
(Hex)
00h MUX[3:0] GAIN[2:0] PGA_BYPASS
01h DR[2:0] MODE[1:0] CM TS BCS
02h VREF[1:0] 50/60[1:0] PSW IDAC[2:0]
03h I1MUX[2:0] I2MUX[2:0] DRDYM 0

ADS1120
8.6.1.1 Configuration Register 0 (offset = 00h) [reset = 00h]
Figure 68. Configuration Register 0

7 6 5 4 3 2 1 0
MUX[3:0] GAIN[2:0] PGA_BYPASS
R/W-0h R/W-0h R/W-0h
LEGEND: R/W = Read/Write; -n = value after reset
Table 16. Configuration Register 0 Field Descriptions

Bit Field Type Reset Description
Input multiplexer configuration
These bits configure the input multiplexer.
For settings where AINN = AVSS, the PGA must be disabled (PGA_BYPASS = 1)
and only gains 1, 2, and 4 can be used.
0000 : AINP = AIN0, AINN = AIN1 (default)
0001 : AINP = AIN0, AINN = AIN2
7:4 MUX[3:0] R/W 0h 0101 : AINP = AIN2, AINN = AIN3
1000 : AINP = AIN0, AINN = AVSS
1100 : (V(REFPx) – V(REFNx)) / 4 monitor (PGA bypassed)
1101 : (AVDD – AVSS) / 4 monitor (PGA bypassed)
1110 : AINP and AINN shorted to (AVDD + AVSS) / 2
1111 : Reserved
Gain configuration
These bits configure the device gain.
Gains 1, 2, and 4 can be used without the PGA. In this case, gain is obtained by
a switched-capacitor structure.
000 : Gain = 1 (default)
3:1 GAIN[2:0] R/W 0h 001 : Gain =2
010 : Gain =4
011 : Gain =8
100 : Gain = 16
101 : Gain = 32
110 : Gain = 64
111 : Gain = 128
Disables and bypasses the internal low-noise PGA
Disabling the PGA reduces overall power consumption and allows the common-
mode voltage range (VCM) to span from AVSS – 0.1 V to AVDD + 0.1 V.
The PGA can only be disabled for gains 1, 2, and 4.
0 PGA_BYPASS R/W 0h The PGA is always enabled for gain settings 8 to 128, regardless of the
PGA_BYPASS setting.
0 : PGA enabled (default)
1 : PGA disabled and bypassed

ADS1120

7 6 5 4 3 2 1 0
DR[2:0] MODE[1:0] CM TS BCS
R/W-0h R/W-0h R/W-0h R/W-0h R/W-0h

Data rate
7:5 DR[2:0] R/W 0h These bits control the data rate setting depending on the selected operating
mode. Table 18 lists the bit settings for normal, duty-cycle, and turbo mode.
Operating mode
These bits control the operating mode the device operates in.
4:3 MODE[1:0] R/W 0h 00 : Normal mode (256-kHz modulator clock, default)
01 : Duty-cycle mode (internal duty cycle of 1:4)
10 : Turbo mode (512-kHz modulator clock)
11 : Reserved
Conversion mode
This bit sets the conversion mode for the device.
2 CM R/W 0h
0 : Single-shot mode (default)
1 : Continuous conversion mode
Temperature sensor mode
This bit enables the internal temperature sensor and puts the device in
temperature sensor mode.
1 TS R/W 0h The settings of configuration register 0 have no effect and the device uses the
internal reference for measurement when temperature sensor mode is enabled.
0 : Disables temperature sensor (default)
1 : Enables temperature sensor
Burn-out current sources
This bit controls the 10-µA, burn-out current sources.
The burn-out current sources can be used to detect sensor faults such as wire
0 BCS R/W 0h breaks and shorted sensors.
0 : Current sources off (default)
1 : Current sources on
Table 18. DR Bit Settings (1)

NORMAL MODE DUTY-CYCLE MODE TURBO MODE
000 = 20 SPS 000 = 5 SPS 000 = 40 SPS
001 = 45 SPS 001 = 11.25 SPS 001 = 90 SPS
010 = 90 SPS 010 = 22.5 SPS 010 = 180 SPS
011 = 175 SPS 011 = 44 SPS 011 = 350 SPS
100 = 330 SPS 100 = 82.5 SPS 100 = 660 SPS
101 = 600 SPS 101 = 150 SPS 101 = 1200 SPS
110 = 1000 SPS 110 = 250 SPS 110 = 2000 SPS
111 = Reserved 111 = Reserved 111 = Reserved
(1) Data rates provided are calculated using the internal oscillator or an external 4.096-MHz clock. The data rates scale proportionally with
the external clock frequency when an external clock other than 4.096 MHz is used.

ADS1120

7 6 5 4 3 2 1 0
VREF[1:0] 50/60[1:0] PSW IDAC[2:0]
R/W-0h R/W-0h R/W-0h R/W-0h

Voltage reference selection
These bits select the voltage reference source that is used for the conversion.
7:6 VREF[1:0] R/W 0h 00 : Internal 2.048-V reference selected (default)
01 : External reference selected using dedicated REFP0 and REFN0 inputs
10 : External reference selected using AIN0/REFP1 and AIN3/REFN1 inputs
11 : Analog supply (AVDD – AVSS) used as reference
FIR filter configuration
These bits configure the filter coefficients for the internal FIR filter.
Only use these bits together with the 20-SPS setting in normal mode and the 5-
SPS setting in duty-cycle mode. Set to 00 for all other data rates.
5:4 50/60[1:0] R/W 0h
00 : No 50-Hz or 60-Hz rejection (default)
01 : Simultaneous 50-Hz and 60-Hz rejection
10 : 50-Hz rejection only
11 : 60-Hz rejection only
Low-side power switch configuration
This bit configures the behavior of the low-side switch connected between
AIN3/REFN1 and AVSS.
3 PSW R/W 0h
0 : Switch is always open (default)
1 : Switch automatically closes when the START/SYNC command is sent and
opens when the POWERDOWN command is issued
IDAC current setting
These bits set the current for both IDAC1 and IDAC2 excitation current sources.
000 : Off (default)
001 : Reserved
2:0 IDAC[2:0] R/W 0h 010 : 50 µA
011 : 100 µA
100 : 250 µA
101 : 500 µA
110 : 1000 µA
111 : 1500 µA

ADS1120

7 6 5 4 3 2 1 0
I1MUX[2:0] I2MUX[2:0] DRDYM 0
R/W-0h R/W-0h R/W-0h R/W-0h

IDAC1 routing configuration
These bits select the channel where IDAC1 is routed to.
000 : IDAC1 disabled (default)
001 : IDAC1 connected to AIN0/REFP1
7:5 I1MUX[2:0] R/W 0h 010 : IDAC1 connected to AIN1
011 : IDAC1 connected to AIN2
100 : IDAC1 connected to AIN3/REFN1
101 : IDAC1 connected to REFP0
110 : IDAC1 connected to REFN0
111 : Reserved
IDAC2 routing configuration
These bits select the channel where IDAC2 is routed to.
000 : IDAC2 disabled (default)
001 : IDAC2 connected to AIN0/REFP1
4:2 I2MUX[2:0] R/W 0h 010 : IDAC2 connected to AIN1
011 : IDAC2 connected to AIN2
100 : IDAC2 connected to AIN3/REFN1
101 : IDAC2 connected to REFP0
110 : IDAC2 connected to REFN0
111 : Reserved
DRDY mode
This bit controls the behavior of the DOUT/DRDY pin when new data are ready.
1 DRDYM R/W 0h
0 : Only the dedicated DRDY pin is used to indicate when data are ready (default)
1 : Data ready is indicated simultaneously on DOUT/DRDY and DRDY
Reserved
0 Reserved R/W 0h
Always write 0

ADS1120
9 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information

The ADS1120 is a precision, 16-bit, ΔΣ ADC that offers many integrated features to ease the measurement of
the most common sensor types including various types of temperature and bridge sensors. Primary
considerations when designing an application with the ADS1120 include analog input filtering, establishing an
appropriate external reference for ratiometric measurements, and setting the common-mode input voltage for the
internal PGA. Connecting and configuring the serial interface appropriately is another concern. These
considerations are discussed in the following sections.
9.1.1 Serial Interface Connections

The principle serial interface connections for the ADS1120 are shown in Figure 72.
Microcontroller with SPI Interface
GPIO/IRQ
DOUT
DVDD
DVSS
SCLK
GPIO
DIN
47 O
47 O
47 O
47 O
0.1 PF
47 O
3.3 V
1 SCLK DIN 16
2 CS DOUT/DRDY 15
3 CLK DRDY 14 3.3 V
4 DGND DVDD 13
Device
5 AVSS AVDD 12 3.3 V
0.1 PF
6 AIN3/REFN1 AIN0/REFP1 11
0.1 PF
7 AIN2 AIN1 10
8 REFN0 REFP0 9
Figure 72. Serial Interface Connections
Most microcontroller SPI peripherals can operate with the ADS1120. The interface operates in SPI mode 1
where CPOL = 0 and CPHA = 1. In SPI mode 1, SCLK idles low and data are launched or changed only on
SCLK rising edges; data are latched or read by the master and slave on SCLK falling edges. Details of the SPI
communication protocol employed by the device can be found in the SPI Timing Requirements section.
TI recommends placing 47-Ω resistors in series with all digital input and output pins (CS, SCLK, DIN,
DOUT/DRDY, and DRDY). This resistance smooths sharp transitions, suppresses overshoot, and offers some
overvoltage protection. Care must be taken to meet all SPI timing requirements because the additional resistors
interact with the bus capacitances present on the digital signal lines.

ADS1120
Application Information (continued)

9.1.2 Analog Input Filtering
Analog input filtering serves two purposes: first, to limit the effect of aliasing during the sampling process and
second, to reduce external noise from being a part of the measurement.
As with any sampled system, aliasing can occur if proper antialias filtering is not in place. Aliasing occurs when
frequency components are present in the input signal that are higher than half the sampling frequency of the
ADC (also known as the Nyquist frequency). These frequency components are folded back and show up in the
actual frequency band of interest below half the sampling frequency. Note that inside a ΔΣ ADC, the input signal
is sampled at the modulator frequency f(MOD) and not at the output data rate. The filter response of the digital filter
repeats at multiples of the sampling frequency (f(MOD)), as shown in Figure 73. Signals or noise up to a frequency
where the filter response repeats are attenuated to a certain amount by the digital filter depending on the filter
architecture. Any frequency components present in the input signal around the modulator frequency or multiples
thereof are not attenuated and alias back into the band of interest, unless attenuated by an external analog filter.
Magnitude
Sensor
Signal
Unwanted
Unwanted Signals
Signals
Output f(MOD)/2 f(MOD) Frequency

Data Rate
Magnitude
Digital Filter
Aliasing of
Unwanted Signals

Data Rate
Magnitude
External
Antialiasing Filter
Roll-Off

Data Rate
Figure 73. Effect of Aliasing

ADS1120

Many sensor signals are inherently bandlimited; for example, the output of a thermocouple has a limited rate of
change. In this case the sensor signal does not alias back into the pass-band when using a ΔΣ ADC. However,
any noise pick-up along the sensor wiring or the application circuitry can potentially alias into the pass-band.
Power line-cycle frequency and harmonics are one common noise source. External noise can also be generated
from electromagnetic interference (EMI) or radio frequency interference (RFI) sources, such as nearby motors
and cellular phones. Another noise source typically exists on the printed circuit board (PCB) itself in the form of
clocks and other digital signals. Analog input filtering helps remove unwanted signals from affecting the
measurement result.
A first-order resistor-capacitor (RC) filter is (in most cases) sufficient to either totally eliminate aliasing, or to
reduce the effect of aliasing to a level within the noise floor of the sensor. Ideally, any signal beyond f(MOD) / 2 is
attenuated to a level below the noise floor of the ADC. The digital filter of the ADS1120 attenuates signals to a
certain degree, as illustrated in the filter response plots in the Digital Filter section. In addition, noise components
are usually smaller in magnitude than the actual sensor signal. Therefore, using a first-order RC filter with a
cutoff frequency set at the output data rate or 10x higher is generally a good starting point for a system design.
Internal to the device, prior to the PGA inputs, is an EMI filter as shown in Figure 39. The cutoff frequency of this
filter is approximately 31.8 MHz, which helps reject high-frequency interferences.
9.1.3 External Reference and Ratiometric Measurements

The full-scale range of the ADS1120 is defined by the reference voltage and the PGA gain (FSR = ±Vref / Gain).
An external reference can be used instead of the integrated 2.048-V reference to adapt the FSR to the specific
system needs. An external reference must be used if VIN > 2.048 V. For example, an external 5-V reference and
an AVDD = 5 V are required in order to measure a single-ended signal that can swing between 0 V and 5 V.
The reference inputs of the device also allow the implementation of ratiometric measurements. In a ratiometric
measurement the same excitation source that is used to excite the sensor is also used to establish the reference
for the ADC. As an example, a simple form of a ratiometric measurement uses the same current source to excite
both the resistive sensor element (such as an RTD) and another resistive reference element that is in series with
the element being measured. The voltage that develops across the reference element is used as the reference
source for the ADC. Because current noise and drift are common to both the sensor measurement and the
reference, these components cancel out in the ADC transfer function. The output code is only a ratio of the
sensor element and the value of the reference resistor. The value of the excitation current source itself is not part
of the ADC transfer function.
9.1.4 Establishing a Proper Common-Mode Input Voltage

The ADS1120 can be used to measure various types of input signal configurations: single-ended, pseudo-
differential, and fully-differential signals (which can be either unipolar or bipolar). However, configuring the device
properly for the respective signal type is important.
Signals where the negative analog input is fixed and referenced to analog ground (V(AINN) = 0 V) are commonly
called single-ended signals. The common-mode voltage of a single-ended signal consequently varies between
0 V and VIN / 2. If the PGA is disabled and bypassed, the common-mode input voltage of the ADS1120 can be
as low as 100 mV below AVSS and as large as 100 mV above AVDD. Therefore, the PGA_BYPASS bit must be
set in order to measure single-ended signals when a unipolar analog supply is used (AVSS = 0 V). Gains of 1, 2,
and 4 are still possible in this configuration. Measuring a 0-mA to 20-mA or 4-mA to 20-mA signal across a load
resistor of 100 Ω referenced to GND is a typical example. The ADS1120 can directly measure the signal across
the load resistor using a unipolar supply, the internal 2.048-V reference, and gain = 1 when the PGA is
bypassed.
If gains larger than 4 are needed to measure a single-ended signal, the PGA must be enabled. In this case, a
bipolar supply is required for the ADS1120 to meet the common-mode voltage requirement of the PGA.
Signals where the negative analog input (AINN) is fixed at a voltage other the 0 V are referred to as pseudo-
differential signals. The common-mode voltage of a pseudo-differential signal varies between V(AINN) and V(AINN) +
VIN / 2.
Fully-differential signals in contrast are defined as signals having a constant common-mode voltage where the
positive and negative analog inputs swing 180° out-of-phase but have the same amplitude.

ADS1120

The ADS1120 can measure pseudo-differential and fully-differential signals both with the PGA enabled or
bypassed. However, the PGA must be enabled in order to use gains greater than 4. The common-mode voltage
of the input signal must meet the input-common mode voltage restrictions of the PGA (as explained in the PGA
Common-Mode Voltage Requirements section) when the PGA is enabled. Setting the common-mode voltage at
or near (AVSS + AVDD) / 2 in most cases satisfies the PGA common-mode voltage requirements.
Signals where both the positive and negative inputs are always ≥ 0 V are called unipolar signals. These signals
can in general be measured with the ADS1120 using a unipolar analog supply (AVSS = 0 V). As mentioned
previously, the PGA must be bypassed in order to measure single-ended, unipolar signals when using a unipolar
supply.
A signal is called bipolar when either the positive or negative input can swing below 0 V. A bipolar analog supply
(such as AVDD = 2.5 V, AVSS = –2.5 V) is required in order to measure bipolar signals with the ADS1120. A
typical application task is measuring a single-ended, bipolar ±10 V signal where AINN is fixed at 0 V while AINP
swings between –10 V and 10 V. The ADS1120 cannot directly measure this signal because the 10 V exceeds
the analog power-supply limits. However, one possible solution is to use a bipolar analog supply (AVDD = 2.5 V,
AVSS = –2.5 V), gain = 1, and a resistor divider in front of the ADS1120. The resistor divider must divide the
voltage down to ≤ ±2.048 V to be able to measure it using the internal 2.048-V reference.
9.1.5 Unused Inputs and Outputs
To minimize leakage currents on the analog inputs, leave unused analog and reference inputs floating, or
connect the inputs to mid-supply or to AVDD. AIN3/REFN1 is an exception. Leave the AIN3/REFN1 pin floating
when not used in order to avoid accidently shorting the pin to AVSS through the internal low-side switch.
Connecting unused analog or reference inputs to AVSS is possible as well, but can yield higher leakage currents
than the previously mentioned options.
Do not float unused digital inputs; excessive power-supply leakage current can result. Tie all unused digital
inputs to the appropriate levels, DVDD or DGND, even when in power-down mode. If CS is not used, tie this pin
to DGND. If the internal oscillator is used, tie the CLK pin to DGND. If the DRDY output is not used, leave the pin
unconnected or tie the pin to DVDD using a weak pullup resistor.

ADS1120

9.1.6 Pseudo Code Example
The following list shows a pseudo code sequence with the required steps to set up the device and the
microcontroller that interfaces to the ADC in order to take subsequent readings from the ADS1120 in continuous
conversion mode. The dedicated DRDY pin is used to indicate availability of new conversion data. The default
configuration register settings are changed to gain = 16, continuous conversion mode, and simultaneous 50-Hz
and 60-Hz rejection.
Power-up;
Delay to allow power supplies to settle and power-up reset to complete; minimum of 50 µs;
Configure the SPI interface of the microcontroller to SPI mode 1 (CPOL = 0, CPHA = 1);
If the CS pin is not tied low permanently, configure the microcontroller GPIO connected to CS as an output;
Configure the microcontroller GPIO connected to the DRDY pin as a falling edge triggered interrupt input;
Set CS to the device low;
Delay for a minimum of td(CSSC);
Send the RESET command (06h) to make sure the device is properly reset after power-up;
Delay for a minimum of 50 µs + 32 · t(CLK);
Write the respective register configuration with the WREG command (43h, 08h, 04h, 10h, and 00h);
As an optional sanity check, read back all configuration registers with the RREG command (23h);
Send the START/SYNC command (08h) to start converting in continuous conversion mode;
Delay for a minimum of td(SCCS);
Clear CS to high (resets the serial interface);
Loop
{
Wait for DRDY to transition low;
Take CS low;
Send 16 SCLK rising edges to read out conversion data on DOUT/DRDY;
Delay for for a minimum of td(SCCS);
Clear CS to high;
}
Take CS low;
Send the POWERDOWN command (02h) to stop conversions and put the device in power-down mode;
Delay for a minimum of td(SCCS);
Clear CS to high;
TI recommends running an offset calibration before performing any measurements or when changing the gain of
the PGA. The internal offset of the device can, for example, be measured by shorting the inputs to mid-supply
(MUX[3:1] = 1110). The microcontroller then takes multiple readings from the device with the inputs shorted and
stores the average value in the microcontroller memory. When measuring the sensor signal, the microcontroller
then subtracts the stored offset value from each device reading to obtain an offset compensated result. Note that
the offset can be either positive or negative in value.

ADS1120
9.2 Typical Applications

9.2.1 K-Type Thermocouple Measurement (–200°C to +1250°C)
Figure 74 shows the basic connections of a thermocouple measurement system when using the internal high-
precision temperature sensor for cold-junction compensation. Apart from the thermocouple itself, the only
external circuitry required are two biasing resistors, a simple low-pass, antialiasing filter, and the power-supply
decoupling capacitors.
3.3 V 3.3 V
0.1 PF 0.1 PF
3.3 V REFP0 REFN0
50 A to AVDD DVDD
RB2 CCM2 1.5 mA
RF2
TI Device
Reference MUX
CDIF
RF1
AIN1 CS
AINP
Digital Filter SCLK
Thermocouple 16-Bit and
RB1 CCM1 MUX PGA DIN
û ADC SPI
Interface DOUT/DRDY
AIN2 AINN
DRDY
Isothermal
Block
Precision
Low-Drift
AIN3 Temperature
Oscillator
Sensor
AVSS CLK DGND
Figure 74. Thermocouple Measurement
9.2.1.1 Design Requirements
Table 21. Design Requirements

DESIGN PARAMETER VALUE
Supply voltage 3.3 V
Reference voltage Internal 2.048-V reference
Update rate ≥10 readings per second
Thermocouple type K
Temperature measurement range –200°C to +1250°C
Measurement accuracy at TA = 25°C (1) ±0.5°C
(1) Not accounting for error of the thermocouple and cold-junction temperature measurement;
offset calibration at T(TC) = T(CJ) = 25°C; no gain calibration.
9.2.1.2 Detailed Design Procedure
The biasing resistors RB1 and RB2 are used to set the common-mode voltage of the thermocouple to within the
specified common-mode voltage range of the PGA (in this example, to mid-supply AVDD / 2). If the application
requires the thermocouple to be biased to GND, either a bipolar supply (for example, AVDD = 2.5 V and AVSS =
–2.5 V) must be used for the device to meet the common-mode voltage requirement of the PGA, or the PGA
must be bypassed. When choosing the values of the biasing resistors, care must be taken so that the biasing
current does not degrade measurement accuracy. The biasing current flows through the thermocouple and can
cause self-heating and additional voltage drops across the thermocouple leads. Typical values for the biasing
resistors range from 1 MΩ to 50 MΩ.

ADS1120
In addition to biasing the thermocouple, RB1 and RB2 are also useful for detecting an open thermocouple lead.
When one of the thermocouple leads fails open, the biasing resistors pull the analog inputs (AIN0 and AIN1) to
AVDD and AVSS, respectively. The ADC consequently reads a full-scale value, which is outside the normal
measurement range of the thermocouple voltage, to indicate this failure condition.
Although the device digital filter attenuates high-frequency components of noise, TI recommends providing a first-
order, passive RC filter at the inputs to further improve performance. The differential RC filter formed by RF1, RF2,
and the differential capacitor CDIF offers a cutoff frequency that is calculated using Equation 17.
fC = 1 / [2π · (RF1 + RF2) · CDIF] (17)
Two common-mode filter capacitors (CM1 and CM2) are also added to offer attenuation of high-frequency,
common-mode noise components. TI recommends that the differential capacitor CDIF be at least an order of
magnitude (10x) larger than the common-mode capacitors (CM1 and CM2) because mismatches in the common-
mode capacitors can convert common-mode noise into differential noise.
The filter resistors RF1 and RF2 also serve as current-limiting resistors. These resistors limit the current into the
analog inputs (AIN0 and AIN1) of the device to safe levels if an overvoltage on the inputs occur. Care must be
taken when choosing the filter resistor values because the input currents flowing into and out of the device cause
a voltage drop across the resistors. This voltage drop shows up as an additional offset error at the ADC inputs.
TI recommends limiting the filter resistor values to below 1 kΩ.
The filter component values used in this design are: RF1 = RF2 = 1 kΩ, CDIF = 100 nF, and CCM1 = CCM2 = 10 nF.
The highest measurement resolution is achieved when matching the largest potential input signal to the FSR of
the ADC by choosing the highest possible gain. From the design requirement, the maximum thermocouple
voltage occurs at T(TC) = 1250°C and is V(TC) = 50.644 mV as defined in the tables published by the National
Institute of Standards and Technology (NIST) using a cold-junction temperature of T(CJ) = 0°C. A thermocouple
produces an output voltage that is proportional to the temperature difference between the thermocouple tip and
the cold junction. If the cold junction is at a temperature below 0°C, the thermocouple produces a voltage larger
than 50.644 mV. The isothermal block area is constrained by the operating temperature range of the device.
Therefore, the isothermal block temperature is limited to –40°C. A K-type thermocouple at T(TC) = 1250°C
produces an output voltage of V(TC) = 50.644 mV – (–1.527 mV) = 52.171 mV when referenced to a cold-junction
temperature of T(CJ) = –40°C. The maximum gain that can be applied when using the internal 2.048-V reference
is then calculated as (2.048 V / 52.171 mV) = 39.3. The next smaller PGA gain setting the device offers is 32.
The device integrates a high-precision temperature sensor that can be used to measure the temperature of the
cold junction. To measure the internal temperature of the ADS1120, the device must be set to internal
temperature sensor mode by setting the TS bit to 1 in the configuration register. For best performance, careful
board layout is critical to achieve good thermal conductivity between the cold junction and the device package.
However, the device does not perform automatic cold-junction compensation of the thermocouple. This
compensation must be done in the microcontroller that interfaces to the device. The microcontroller requests one
or multiple readings of the thermocouple voltage from the device and then sets the device to internal temperature
sensor mode (TS = 1) to acquire the temperature of the cold junction. An algorithm similar to the following must
be implemented on the microcontroller to compensate for the cold-junction temperature:
1. Measure the thermocouple voltage, V(TC), between AIN0 and AIN1.
2. Measure the temperature of the cold junction, T(CJ), using the temperature sensor mode of the ADS1120.
3. Convert the cold-junction temperature into an equivalent thermoelectric voltage, V(CJ), using the tables or
equations provided by NIST.
4. Add V(TC) and V(CJ) and translate the summation back into a thermocouple temperature using the NIST tables
or equations again.
In some applications, the integrated temperature sensor of the ADS1120 cannot be used (for example, if the
accuracy is not high enough or if the device cannot be placed close enough to the cold junction). The additional
analog input channels of the device can be used in this case to measure the cold-junction temperature with a
thermistor, RTD, or an analog temperature sensor.
The device is capable of 16-bit, noise-free resolution using a gain of 32, the internal 2.048-V reference, and a
data rate of 20 SPS (see Table 1 and Table 2). Accordingly the device is able to resolve signals as small as one
LSB. The LSB size is calculated using Equation 18:
1 LSB = (2 · Vref / Gain) / 216 = (2 · 2.048 V / 32) / 216 = 1.953 µV (18)

ADS1120
To get an approximation of the achievable temperature resolution per ADC code, the LSB size is divided by the
average sensitivity of a K-type thermocouple (41 µV/°C), as shown in Equation 19.
Temperature Resolution per Code = 1.953 µV / 41 µV/°C = 0.05°C (19)
The register settings for this design are shown in Table 22.
Table 22. Register Settings

REGISTER SETTING DESCRIPTION
00h 0Ah AINP = AIN0, AINN = AIN1, gain = 32, PGA enabled
01h 04h DR = 20 SPS, normal mode, continuous conversion mode
02h 10h Internal voltage reference, simultaneous 50-Hz and 60-Hz rejection
03h 00h No IDACs used
9.2.1.3 Application Curves

Figure 75 and Figure 76 show the measurement results. The measurements are taken at TA = T(CJ) = 25°C. A
system offset calibration is performed at T(TC) = 25°C, which translates to a V(TC) = 0 V when T(CJ) = 25°C. No
gain calibration is implemented. The data in Figure 75 are taken using a precision voltage source as the input
signal instead of a thermocouple. The respective temperature measurement error in Figure 76 is calculated from
the data in Figure 75 using the NIST tables.
The design meets the required temperature measurement accuracy given in Table 21. Note that the
measurement error shown in Figure 76 does not include the error of the thermocouple itself and the
measurement error of the cold-junction temperature. Those two error sources are in general larger than 0.2°C
and therefore, in many cases, dominate the overall system measurement accuracy.
0.01 0.2
Measurement Error (mV)
0.005 0.1
Measurement Error (°C)
0 0
-0.005 -0.1
-0.01 -0.2
-10 0 10 20 30 40 50 -200 0 200 400 600 800 1000 1200
Thermocouple Voltage (mV) D002
Temperature (°C) D001
Figure 75. Voltage Measurement Error vs V(TC) Figure 76. Temperature Measurement Error vs T(TC)

ADS1120
9.2.2 3-Wire RTD Measurement (–200°C to +850°C)

The ADS1120 integrates all necessary features (such as dual-matched programmable current sources, buffered
reference inputs, and a PGA) to ease the implementation of ratiometric 2-, 3-, and 4-wire RTD measurements.
Figure 77 shows a typical implementation of a ratiometric 3-wire RTD measurement using the excitation current
sources integrated in the device to excite the RTD as well as to implement automatic RTD lead-resistance
compensation.
IIDAC1 + IIDAC2 RREF
3.3 V RF3 RF4 3.3 V
CCM3 CDIF2 CCM4

0.1 PF 0.1 PF
RLEAD3 50 A to AVDD REFP0 REFN0 DVDD

1.5 mA
CCM2
RLEAD2 RF2
TI Device
Reference MUX
3-Wire RTD CDIF1

RLEAD1 RF1
AIN1 CS
AINP
Digital Filter SCLK
CCM1
16-Bit and
MUX PGA DIN
û ADC SPI
AIN2 Interface DOUT/DRDY
AINN
(IDAC1) DRDY
AIN3 Precision
Low-Drift
Temperature
(IDAC2) Oscillator
Sensor
AVSS CLK DGND
Figure 77. 3-Wire RTD Measurement

Supply voltage 3.3 V
Update rate 20 readings per second
RTD type 3-wire Pt100
Maximum RTD lead resistance 15 Ω
RTD excitation current 500 µA
Temperature measurement range –200°C to +850°C
Measurement accuracy at TA = 25°C (1) ±0.2°C
(1) Not accounting for error of RTD;

offset calibration is performed with RRTD = 100 Ω; no gain calibration.
The circuit in Figure 77 employs a ratiometric measurement approach. In other words, the sensor signal (that is,
the voltage across the RTD in this case) and the reference voltage for the ADC are derived from the same
excitation source. Therefore, errors resulting from temperature drift or noise of the excitation source cancel out
because these errors are common to both the sensor signal and the reference.

ADS1120
In order to implement a ratiometric 3-wire RTD measurement using the device, IDAC1 is routed to one of the
leads of the RTD and IDAC2 is routed to the second RTD lead. Both currents have the same value, which is
programmable by the IDAC[2:0] bits in the configuration register. The design of the device ensures that both
IDAC values are closely matched, even across temperature. The sum of both currents flows through a precision,
low-drift reference resistor, RREF. The voltage, Vref, generated across the reference resistor (as shown in
Equation 20) is used as the ADC reference voltage. Equation 20 reduces to Equation 21 because IIDAC1 = IIDAC2.
Vref = (IIDAC1 + IIDAC2) · RREF (20)
Vref = 2 · IIDAC1 · RREF (21)
To simplify the following discussion, the individual lead resistance values of the RTD (RLEADx) are set to zero.
Only IDAC1 excites the RTD to produce a voltage (VRTD) proportional to the temperature-dependable RTD value
and the IDAC1 value, as shown in Equation 22.
VRTD = RRTD (at temperature) · IIDAC1 (22)
The device internally amplifies the voltage across the RTD using the PGA and compares the resulting voltage
against the reference voltage to produce a digital output code proportional to Equation 23 through Equation 25:
Code ∝ VRTD · Gain / Vref (23)
Code ∝ (RRTD (at temperature) · IIDAC1 · Gain) / (2 · IIDAC1 · RREF) (24)
Code ∝ (RRTD (at temperature) · Gain) / (2 · RREF) (25)
As can be seen from Equation 25, the output code only depends on the value of the RTD, the PGA gain, and the
reference resistor (RREF), but not on the IDAC1 value. The absolute accuracy and temperature drift of the
excitation current therefore does not matter. However, because the value of the reference resistor directly affects
the measurement result, choosing a reference resistor with a very low temperature coefficient is important to limit
errors introduced by the temperature drift of RREF.
The second IDAC2 is used to compensate for errors introduced by the voltage drop across the lead resistance of
the RTD. All three leads of a 3-wire RTD typically have the same length and, thus, the same lead resistance.
Also, IDAC1 and IDAC2 have the same value. Taking the lead resistance into account, the differential voltage
(VIN) across the ADC inputs, AIN0 and AIN1, is calculated using Equation 26:
VIN = IIDAC1 · (RRTD + RLEAD1) – IIDAC2 · RLEAD2 (26)
When RLEAD1 = RLEAD2 and IIDAC1 = IIDAC2, Equation 26 reduces to Equation 27:
VIN = IIDAC1 · RRTD (27)
In other words, the measurement error resulting from the voltage drop across the RTD lead resistance is
compensated, as long as the lead resistance values and the IDAC values are well matched.
A first-order differential and common-mode RC filter (RF1, RF2, CDIF1, CCM1, and CCM2) is placed on the ADC
inputs, as well as on the reference inputs (RF3, RF4, CDIF2, CCM3, and CCM4). The same guidelines for designing
the input filter apply as described in the Thermocouple Measurement section. For best performance, TI
recommends matching the corner frequencies of the input and reference filter. More detailed information on
matching the input and reference filter can be found in application report RTD Ratiometric Measurements and
Filtering Using the ADS1148 and ADS1248 (SBAA201).
The reference resistor RREF not only serves to generate the reference voltage for the device, but also sets the
common-mode voltage of the RTD to within the specified common-mode voltage range of the PGA.
When designing the circuit, care must also be taken to meet the compliance voltage requirement of the IDACs.
The IDACs require that the maximum voltage drop developed across the current path to AVSS be equal or less
than AVDD – 0.9 V in order to operate accurately. This requirement means that Equation 28 must be met at all
times.
AVSS + IIDAC1 · (RLEAD1 + RRTD) + (IIDAC1 + IIDAC2) · (RLEAD3 + RREF) ≤ AVDD – 0.9 V (28)
The device also offers the possibility to route the IDACs to the same inputs used for measurement. If the filter
resistor values RF1 and RF2 are small enough and well matched, IDAC1 can be routed to AIN1 and IDAC2 to
AIN0 in Figure 77. In this manner, even two 3-wire RTDs sharing the same reference resistor can be measured
with a single device.

ADS1120
This design example discusses the implementation of a 3-wire Pt100 measurement to be used to measure
temperatures ranging from –200°C to +850°C as stated in Table 23. The excitation current for the Pt100 is
chosen as IIDAC1 = 500 µA, which means a combined current of 1 mA is flowing through the reference resistor,
RREF. As mentioned previously, besides creating the reference voltage for the ADS1120, the voltage across RREF
also sets the common-mode voltage for the RTD measurement. In general, choose the largest reference voltage
possible while still maintaining the compliance voltage of the IDACs as well as meeting the common-mode
voltage requirement of the PGA. TI recommends setting the common-mode voltage at or near half the analog
supply (in this case 3.3 V / 2 = 1.65 V), which in most cases satisfies the common-mode voltage requirements of
the PGA. The value for RREF is then calculated by Equation 29:
RREF = Vref / (IIDAC1 + IIDAC2) = 1.65 V / 1 mA = 1.65 kΩ (29)
The stability of RREF is critical to achieve good measurement accuracy over temperature and time. Choosing a
reference resistor with a temperature coefficient of ±10 ppm/°C or better is advisable. If a 1.65 kΩ value is not
readily available, another value near 1.65 kΩ (such as 1.62 kΩ or 1.69 kΩ) can certainly be used as well.
As a last step, the PGA gain must be selected in order to match the maximum input signal to the FSR of the
ADC. The resistance of a Pt100 increases with temperature. Therefore, the maximum voltage to be measured
(VIN (MAX)) occurs at the positive temperature extreme. At 850°C, a Pt100 has an equivalent resistance of
approximately 391 Ω as per the NIST tables. The voltage across the Pt100 equates to Equation 30:
VIN (MAX) = VRTD (at 850°C) = RRTD (at 850°C) · IIDAC1 = 391 Ω · 500 µA = 195.5 mV (30)
The maximum gain that can be applied when using a 1.65-V reference is then calculated as (1.65 V / 195.5 mV)
= 8.4. The next smaller PGA gain setting available in the ADS1120 is 8. At a gain of 8, the ADS1120 offers a
FSR value as described in Equation 31:
FSR = ±Vref / Gain = ±1.65 V / 8 = ±206.25 mV (31)
This range allows for margin with respect to initial accuracy and drift of the IDACs and reference resistor.
After selecting the values for the IDACs, RREF, and PGA gain, make sure to double check that the settings meet
the common-mode voltage requirements of the PGA and the compliance voltage of the IDACs. To determine the
true common-mode voltage at the ADC inputs (AIN0 and AIN1) the lead resistance must be taken into account
as well.
The smallest common-mode voltage occurs at the lowest measurement temperature (–200°C) with RLEADx = 0 Ω
and is calculated using Equation 32 and Equation 33.
VCM (MIN) = Vref + (IIDAC1 + IIDAC2) · RLEAD3 + IIDAC2 · RLEAD2 + ½ IIDAC1 · RRTD (at –200°C) (32)
VCM (MIN) = 1.65 V + ½ 500 µA · 18.52 Ω = 1.655 V (33)
Actually, assuming VCM (MIN) = Vref is a sufficient approximation.
VCM (MIN) must meet two requirements: Equation 15 requires VCM (MIN) to be larger than AVDD / 4 = 3.3 V / 4 =
0.825 V and Equation 13 requires VCM (MIN) to meet Equation 34:
VCM (MIN) ≥ AVSS + 0.2 V + ½ Gain · VIN (MAX) = 0 V + 0.2 V + ( ½ · 8 · 195.5 mV) = 982 mV (34)
Both restrictions are satisfied in this design with a VCM (MIN) = 1.65 V.
The largest common-mode voltage occurs at the highest measurement temperature (850°C) and is calculated
using Equation 35 and Equation 36.
VCM (MAX) = Vref + (IIDAC1 + IIDAC2) · RLEAD3 + IIDAC2 · RLEAD2 + ½ IIDAC1 · RRTD (at 850°C) (35)
VCM (MAX) = 1.65 V + 1 mA · 15 Ω + 500 µA · 15 Ω + ½ 500 µA · 391 Ω = 1.77 V (36)
VCM (MAX) does meet the requirement given by Equation 14, which in this design equates to Equation 37:
VCM (MAX) ≤ AVDD – 0.2 V – ½ Gain · VIN (MAX) = 3.3 V – 0.2 V – ( ½ · 8 · 195.5 mV) = 2.318 V (37)
Finally, the maximum voltage that can occur on input AIN1 must be calculated to determine if the compliance
voltage (AVDD – 0.9 V = 3.3 V – 0.9 V = 2.4 V) of IDAC1 is met. Note that the voltage on input AIN0 is smaller
than the one on input AIN1. Equation 38 and Equation 39 show that the voltage on AIN1 is less than 2.4 V, even
when taking the worst-case lead resistance into account.
VAIN1 (MAX) = Vref + (IIDAC1 + IIDAC2) · RLEAD3 + IIDAC1 · (RRTD (at 850°C) + RLEAD1) (38)
VAIN1 (MAX) = 1.65 V + 1 mA · 15 Ω + 500 µA · (391 Ω + 15 Ω) = 1.868 V (39)

ADS1120

00h 66h AINP = AIN1, AINN = AIN0, gain = 8, PGA enabled
External reference (REFP0, REFN0), simultaneous 50-Hz and 60-Hz
02h 55h
rejection, IDAC = 500 µA
03h 70h IDAC1 = AIN2, IDAC2 = AIN3
9.2.2.2.1 Design Variations for 2-Wire and 4-Wire RTD Measurements

Implementing a 2- or 4-wire RTD measurement is very similar to the 3-wire RTD measurement illustrated in
Figure 77, except that only one IDAC is required.
Figure 78 shows a typical circuit implementation of a 2-wire RTD measurement. The main difference compared
to a 3-wire RTD measurement is with respect to the lead resistance compensation. The voltage drop across the
lead resistors, RLEAD1 and RLEAD2, in this configuration is directly part of the measurement (as shown in
Equation 40) because there is no means to compensate the lead resistance by use of the second current source.
Any compensation must be done by calibration.
VIN = IIDAC1 · (RLEAD1 + RRTD + RLEAD2) (40)
IIDAC1 RREF
3.3 V RF3 RF4 3.3 V
CCM3 CDIF2 CCM4

0.1 PF 0.1 PF
50 A to AVDD REFP0 REFN0 DVDD

1.5 mA
CCM2
RLEAD2 RF2 AIN0 Internal Reference
TI Device
Reference MUX
2-Wire RTD CDIF1

RLEAD1 RF1 AIN1 CS
AINP
Digital Filter SCLK
CCM1 16-Bit and
MUX PGA DIN
û ADC SPI
AINN
DRDY
AIN3 Precision
Low-Drift
Temperature
(IDAC1) Oscillator
Sensor
AVSS CLK DGND

ADS1120
Figure 79 shows a typical circuit implementation of a 4-wire RTD measurement. Similar to the 2-wire RTD
measurement, only one IDAC is required for exciting and measuring a 4-wire RTD in a ratiometric manner. The
main benefit of using a 4-wire RTD is that the ADC inputs are connected to the RTD in the form of a Kelvin
connection. Apart from the input leakage currents of the ADC, there is no current flow through the lead resistors
RLEAD2 and RLEAD3 and therefore no voltage drop is created across them. The voltage at the ADC inputs
consequently equals the voltage across the RTD and the lead resistance is of no concern.
IIDAC1 RREF
3.3 V RF3 RF4 3.3 V
CCM3 CDIF2 CCM4

0.1 PF 0.1 PF
RLEAD4 50 A to AVDD REFP0 REFN0 DVDD

1.5 mA
CCM2
RLEAD3 RF2
TI Device
Reference MUX
4-Wire RTD CDIF1

RLEAD2 RF1
AIN1 CS
AINP
Digital Filter SCLK
CCM1
16-Bit and
MUX PGA DIN
RLEAD1 û ADC SPI
AINN
DRDY
AIN3 Precision
Low-Drift
Temperature
(IDAC1) Oscillator
Sensor
AVSS CLK DGND
Note that because only one IDAC is used and flows through the reference resistor, RREF, the transfer function of
a 2- and 4-wire RTD measurement differs compared to the one of a 3-wire RTD measurement by a factor of 2,
as shown in Equation 41.
Code ∝ (RRTD (at Temperature) · Gain) / RREF (41)
In addition, the common-mode and reference voltage is reduced compared to the 3-wire RTD configuration.
Therefore, some further modifications may be required in case the 3-wire RTD design is used to measure 2- and
4-wire RTDs as well. If the decreased common-mode voltage does not meet the VCM (MIN) requirements of the
PGA anymore, either increase the value of RREF by switching in a larger resistor or, alternatively, increase the
excitation current while decreasing the gain at the same time.

ADS1120
9.2.2.3 Application Curves

Figure 80 and Figure 81 show the measurement results. The measurements are taken at TA = 25°C. A system
offset calibration is performed using a reference resistor of 100 Ω. No gain calibration is implemented. The data
in Figure 80 are taken using precision resistors instead of a 3-wire Pt100. The respective temperature
measurement error in Figure 81 is calculated from the data in Figure 80 using the NIST tables.
The design meets the required temperature measurement accuracy given in Table 23. Note that the
measurement error shown in Figure 81 does not include the error of the RTD itself.
0.1 0.2
0.05 0.1
Measurement Error (:)
Measurement Error (°C)

0 0
-0.05 -0.1
-0.1 -0.2
0 50 100 150 200 250 300 350 400 -200 0 200 400 600 800 1000
RTD Value (:) D003
Temperature (°C) D004
Figure 80. Resistance Measurement Error vs RRTD Figure 81. Temperature Measurement Error vs T(RTD)

ADS1120
9.2.3 Resistive Bridge Measurement

The device offers several features to ease the implementation of ratiometric bridge measurements (such as a
PGA with gains up to 128, buffered, differential reference inputs, and a low-side power switch).
5.0 V 3.3 V
0.1 PF 0.1 PF
REFP0 REFN0
5.0 V 50 A to AVDD DVDD

1.5 mA
REFP1 Internal Reference
TI Device
Reference MUX
CCM2
RF2 AIN1 CS
AINP
Digital Filter SCLK
16-Bit and
CDIF1 CDIF2 MUX PGA DIN
û ADC SPI
RF1 AIN2 Interface DOUT/DRDY
AINN
DRDY
CCM1
REFN1 Precision
Low-Drift
Temperature
Oscillator
Sensor
AVSS CLK DGND
Figure 82. Resistive Bridge Measurement

Analog supply voltage 5.0 V
Digital supply voltage 3.3 V
Load cell type 4-wire load cell
Load cell sensitivity 2 mV/V
Excitation voltage 5V
Noise-free counts 8000

To implement a ratiometric bridge measurement, the bridge excitation voltage is simultaneously used as the
reference voltage for the ADC; see Figure 82. With this configuration, any drift in excitation voltage also shows
up on the reference voltage, consequently canceling out drift error. Either of the two device reference input pairs
can be connected to the bridge excitation voltage. However, only the negative reference input (REFN1) can be
internally routed to a low-side power switch. By connecting the low side of the bridge to REFN1, the device can
automatically power-down the bridge by opening the low-side power switch. When the PSW bit in the
configuration register is set to 1, the device opens the switch every time a POWERDOWN command is issued
and closes the switch again when a START/SYNC command is sent.
The PGA offers gains up to 128, which helps amplify the small differential bridge output signal to make optimal
use of the ADC full-scale range. Using a symmetrical bridge with the excitation voltage equal to the supply
voltage of the device ensures that the output signal of the bridge meets the common-mode voltage requirement
of the PGA.

ADS1120
Note that the maximum input voltage of ADS1120 is limited to VIN (MAX) = ±[(AVDD – AVSS) – 0.4 V] / Gain,
which means the entire full-scale range, FSR = ±(AVDD – AVSS) / Gain, cannot be used in this configuration.
This limitation is a result of the output drive capability of the PGA amplifiers (A1 and A2); see Figure 39. The
output of each amplifier must stay 200 mV away from the rails (AVDD and AVSS), otherwise the PGA becomes
nonlinear. Consequently, the maximum output swing of the PGA is limited to VOUT = ±[(AVDD – AVSS) – 0.4 V].
Using a 2-mV/V load cell with a 5-V excitation yields a maximum differential output voltage of VIN (MAX) = ±10 mV,
which meets Equation 42 when using a gain of 128.
VIN (MAX) ≤ ±[(AVDD – AVSS) – 0.4 V] / Gain = ±(5 V – 0.4 V) / 128 = ±36 mV (42)
A first-order differential and common-mode RC filter (RF1, RF2, CDIF1, CCM1, and CCM2) is placed on the ADC
inputs. The reference has an additional capacitor CDIF2 to limit reference noise. Care must be taken to maintain a
limited amount of filtering or the measurement will no longer be ratiometric.
The device is capable of 16-bit, noise-free resolution using a gain of 128 at 20 SPS for the specified reference
voltage. Accordingly the device is able to resolve signals as small as one LSB. The LSB size is calculated using
Equation 43:
1 LSB = (2 · Vref / Gain) / 216 = (2 · 5.0 V / 128) / 216 = 1.192 µV (43)
To find the total number of counts available for the bridge measurement, the maximum output voltage is divided
by the LSB value. Dividing 10 mV by 1.192 µV equates to 8389 total counts available, which meets the design
parameter of 8000 counts.

00h 3Eh AINP = AIN1, AINN = AIN2, gain = 128, PGA enabled
External reference (REFP1, REFN1), simultaneous 50-Hz and 60-Hz
02h 98h
rejection, PSW = 1
03h 00h No IDACs used

ADS1120
10 Power Supply Recommendations

The device requires two power supplies: analog (AVDD, AVSS) and digital (DVDD, DGND). The analog power
supply can be bipolar (for example, AVDD = 2.5 V, AVSS = –2.5 V) or unipolar (for example, AVDD = 3.3 V,
AVSS = 0 V) and is independent of the digital power supply. The digital supply sets the digital I/O levels.
10.1 Power-Supply Sequencing
The power supplies can be sequenced in any order, but in no case must any analog or digital inputs exceed the
respective analog or digital power-supply voltage and current limits. Ramping DVDD together with or before
AVDD minimizes any leakage current through AIN3/REFN1 because of the low-side switch connected to this
input. If AVDD ramps before DVDD, then the low-side switch is in an unknown state and can short the
AIN3/REFN1 input to AVSS until DVDD has ramped. Wait approximately 50 µs after all power supplies are
stabilized before communicating with the device to allow the power-up reset process to complete.
10.2 Power-Supply Ramp Rate

For proper device power-up over the entire temperature range, the power-supply ramp rate must be monotonic
and slower than 1 V per 50 µs, as shown in Figure 83.
DVDD
1V
-50 s-
Figure 83. Power-Supply Ramp Rate
10.3 Power-Supply Decoupling

Good power-supply decoupling is important to achieve optimum performance. AVDD, AVSS (when using a
bipolar supply) and DVDD must be decoupled with at least a 0.1-µF capacitor, as shown in Figure 84 and
Figure 85. Place the bypass capacitors as close to the power-supply pins of the device as possible using low-
impedance connections. TI recommends using multi-layer ceramic chip capacitors (MLCCs) that offer low
equivalent series resistance (ESR) and inductance (ESL) characteristics for power-supply decoupling purposes.
For very sensitive systems, or for systems in harsh noise environments, avoiding the use of vias for connecting
the capacitors to the device pins may offer superior noise immunity. The use of multiple vias in parallel lowers
the overall inductance and is beneficial for connections to ground planes. TI recommends connecting analog and
digital ground together as close to the device as possible.
1 SCLK DIN 16 1 SCLK DIN 16
2 CS DOUT/DRDY 15 2 CS DOUT/DRDY 15
3 CLK DRDY 14 3.3 V 3 CLK DRDY 14 3.3 V
4 DGND DVDD 13 4 DGND DVDD 13

Device Device
5 AVSS AVDD 12 3.3 V -2.5 V 5 AVSS AVDD 12 2.5 V
0.1 PF 0.1 PF
6 AIN3/REFN1 AIN0/REFP1 11 6 AIN3/REFN1 AIN0/REFP1 11
0.1 PF 0.1 PF 0.1 PF
7 AIN2 AIN1 10 7 AIN2 AIN1 10
8 REFN0 REFP0 9 8 REFN0 REFP0 9
Figure 84. Unipolar Analog Power Supply Figure 85. Bipolar Analog Power Supply

ADS1120
11 Layout
11.1 Layout Guidelines

TI recommends employing best design practices when laying out a printed circuit board (PCB) for both analog
and digital components. This recommendation generally means that the layout separates analog components
[such as ADCs, amplifiers, references, digital-to-analog converters (DACs), and analog MUXs] from digital
components [such as microcontrollers, complex programmable logic devices (CPLDs), field-programmable gate
arrays (FPGAs), radio frequency (RF) transceivers, universal serial bus (USB) transceivers, and switching
regulators]. An example of good component placement is shown in Figure 86. Although Figure 86 provides a
good example of component placement, the best placement for each application is unique to the geometries,
components, and PCB fabrication capabilities employed. That is, there is no single layout that is perfect for every
design and careful consideration must always be used when designing with any analog component.
Ground Fill or Ground Fill or
Optional: Split
Ground Cut
Ground Plane Ground Plane
Supply
Generation
Signal
Conditioning
(RC Filters
Interface
Device Microcontroller
and Transceiver
Optional: Split
Ground Cut
Amplifiers) Connector
or Antenna
Ground Fill or Ground Fill or
Ground Plane Ground Plane
Figure 86. System Component Placement
The use of split analog and digital ground planes is not necessary for improved noise performance (although for
thermal isolation this option is a worthwhile consideration). However, the use of a solid ground plane or ground
fill in PCB areas with no components is essential for optimum performance. If the system being used employs a
split digital and analog ground plane, TI generally recommends that the ground planes be connected together as
close to the device as possible. A two-layer board is possible using common grounds for both analog and digital
grounds. Additional layers can be added to simplify PCB trace routing. Ground fill may also reduce EMI and RFI
issues.
TI also strongly recommends that digital components, especially RF portions, be kept as far as practically
possible from analog circuitry in a given system. Additionally, minimize the distance that digital control traces run
through analog areas and avoid placing these traces near sensitive analog components. Digital return currents
usually flow through a ground path that is as close to the digital path as possible. If a solid ground connection to
a plane is not available, these currents may find paths back to the source that interfere with analog performance.
The implications that layout has on the temperature-sensing functions are much more significant than for ADC
functions.
Supply pins must be bypassed to ground with a low-ESR ceramic capacitor. The optimum placement of the
bypass capacitors is as close as possible to the supply pins. If AVSS is connected to a negative supply, then
connect an additional bypass capacitor from AVSS to AGND as well. The ground-side connections of the bypass
capacitors must be low-impedance connections for optimum performance. The supply current flows through the
bypass capacitor terminal first and then to the supply pin to make the bypassing most effective.
Analog inputs with differential connections must have a capacitor placed differentially across the inputs. Best
input combinations for differential measurements are AIN0, AIN1 and AIN2, AIN3. The differential capacitors
must be of high quality. The best ceramic chip capacitors are C0G (NPO), which have stable properties and low
noise characteristics. Thermally isolate a copper region around the thermocouple input connections to create a
thermally-stable cold junction. Obtaining acceptable performance with alternate layout schemes is possible as
long as the above guidelines are followed.

ADS1120
11.2 Layout Example
REFP0
REFN0
Vias connect to either the bottom layer or
an internal plane. The bottom layer or
internal plane are dedicated GND planes
(GND = DGND = AVSS).
AIN1
AIN2
AIN0
9: REFP0 8: REFN0
AIN3
10: AIN1 7: AIN2
11: AIN0 6: AIN3
12: AVDD 5: AVSS
13: DVDD 4: DGND
14: DRDY 3: CLK

AVDD
15: DOUT 2: CS
16: DIN 1: SCLK
DVDD
DRDY
DOUT
SCLK
DIN
CS
Figure 87. Layout Example

ADS1120
12 Device and Documentation Support
12.1 Documentation Support

12.1.1 Related Documentation
For related documentation see the following:
• REF50xx Low-Noise, Very Low Drift, Precision Voltage Reference
• RTD Ratiometric Measurements and Filtering Using the ADS1148 and ADS1248 Family of Devices
12.2 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper
right corner, click on Alert me to register and receive a weekly digest of any product information that has
changed. For change details, review the revision history included in any revised document.
12.3 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.4 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.6 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
13 Mechanical, Packaging, and Orderable Information

The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.

PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
PACKAGING INFORMATION
Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)
ADS1120IPW ACTIVE TSSOP PW 16 90 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 ADS1120
ADS1120IPWR ACTIVE TSSOP PW 16 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 ADS1120
ADS1120IRVAR ACTIVE VQFN RVA 16 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 1120
ADS1120IRVAT ACTIVE VQFN RVA 16 250 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 1120
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com 10-Dec-2020
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF ADS1120 :
• Automotive: ADS1120-Q1
NOTE: Qualified Version Definitions:
• Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com 23-Feb-2023
TAPE AND REEL INFORMATION
REEL DIMENSIONS TAPE DIMENSIONS

K0 P1
B0 W
Reel
Diameter
Cavity A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
W Overall width of the carrier tape
P1 Pitch between successive cavity centers
Reel Width (W1)

QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE
Sprocket Holes
Q1 Q2 Q1 Q2
Q3 Q4 Q3 Q4 User Direction of Feed
Pocket Quadrants
*All dimensions are nominal

Device Package Package Pins SPQ Reel Reel A0 B0 K0 P1 W Pin1
Type Drawing Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
ADS1120IPWR TSSOP PW 16 2000 330.0 12.4 6.9 5.6 1.6 8.0 12.0 Q1
ADS1120IRVAR VQFN RVA 16 3000 330.0 12.4 3.75 3.75 1.15 8.0 12.0 Q2
ADS1120IRVAT VQFN RVA 16 250 180.0 12.4 3.75 3.75 1.15 8.0 12.0 Q2
Pack Materials-Page 1
TAPE AND REEL BOX DIMENSIONS
Width (mm)
H
W

Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
ADS1120IPWR TSSOP PW 16 2000 367.0 367.0 35.0
ADS1120IRVAR VQFN RVA 16 3000 367.0 367.0 35.0
ADS1120IRVAT VQFN RVA 16 250 210.0 185.0 35.0
TUBE
T - Tube
height L - Tube length
W - Tube
width
B - Alignment groove width

Device Package Name Package Type Pins SPQ L (mm) W (mm) T (µm) B (mm)
ADS1120IPW PW TSSOP 16 90 530 10.2 3600 3.5
PACKAGE OUTLINE
PW0016A SCALE 2.500
TSSOP - 1.2 mm max height
SMALL OUTLINE PACKAGE
SEATING
PLANE
6.6 C
TYP
A 6.2
0.1 C
PIN 1 INDEX AREA
14X 0.65
16
1
2X
5.1 4.55
4.9
NOTE 3
8
9
0.30
4.5 16X 1.2 MAX
B 0.19
4.3
NOTE 4 0.1 C A B
(0.15) TYP
SEE DETAIL A
0.25
GAGE PLANE
0.15
0.05
0.75
0.50
0 -8
DETAIL A
A 20
TYPICAL
4220204/A 02/2017
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm per side.
5. Reference JEDEC registration MO-153.
www.ti.com
EXAMPLE BOARD LAYOUT
PW0016A TSSOP - 1.2 mm max height
16X (1.5) SYMM

(R0.05) TYP
1
16X (0.45) 16
SYMM
14X (0.65)
8 9
(5.8)
LAND PATTERN EXAMPLE

EXPOSED METAL SHOWN
SCALE: 10X
SOLDER MASK METAL UNDER SOLDER MASK

METAL SOLDER MASK OPENING
OPENING
EXPOSED METAL EXPOSED METAL
0.05 MAX 0.05 MIN

ALL AROUND ALL AROUND
NON-SOLDER MASK SOLDER MASK

DEFINED DEFINED
(PREFERRED) SOLDER MASK DETAILS
15.000
4220204/A 02/2017
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.

7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
www.ti.com
EXAMPLE STENCIL DESIGN
PW0016A TSSOP - 1.2 mm max height
16X (1.5) SYMM

(R0.05) TYP
1
16X (0.45) 16
SYMM
14X (0.65)
8 9
(5.8)
SOLDER PASTE EXAMPLE

BASED ON 0.125 mm THICK STENCIL
SCALE: 10X
4220204/A 02/2017
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
IMPORTANT NOTICE AND DISCLAIMER
TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATA SHEETS), DESIGN RESOURCES (INCLUDING REFERENCE
DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS”
AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY
IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD
PARTY INTELLECTUAL PROPERTY RIGHTS.
These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate
TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable
standards, and any other safety, security, regulatory or other requirements.
These resources are subject to change without notice. TI grants you permission to use these resources only for development of an
application that uses the TI products described in the resource. Other reproduction and display of these resources is prohibited. No license
is granted to any other TI intellectual property right or to any third party intellectual property right. TI disclaims responsibility for, and you
will fully indemnify TI and its representatives against, any claims, damages, costs, losses, and liabilities arising out of your use of these
resources.
TI’s products are provided subject to TI’s Terms of Sale or other applicable terms available either on ti.com or provided in conjunction with
such TI products. TI’s provision of these resources does not expand or otherwise alter TI’s applicable warranties or warranty disclaimers for
TI products.
TI objects to and rejects any additional or different terms you may have proposed. IMPORTANT NOTICE
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265

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Product Order Technical Tools & Support & Reference

Folder Now Documents Software Community Design

K-Type Thermocouple Measurement

3.3 V REFP0 REFN0

AIN0 Internal Reference

AVSS CLK DGND

Copyright © 2017, Texas Instruments Incorporated

Changes from Revision B (January 2015) to Revision C Page

• Changed document title ......................................................................................................................................................... 1

2 Submit Documentation Feedback Copyright © 2013–2017, Texas Instruments Incorporated

Product Folder Links: ADS1120

Changes from Revision A (January 2014) to Revision B Page

Changes from Original (August 2013) to Revision A Page

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5 Pin Configuration and Functions

RVA Package PW Package

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Product Folder Links: ADS1120

6.2 ESD Ratings

Copyright © 2013–2017, Texas Instruments Incorporated Submit Documentation Feedback 5

6.3 Recommended Operating Conditions

6.4 Thermal Information

6 Submit Documentation Feedback Copyright © 2013–2017, Texas Instruments Incorporated

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6.5 Electrical Characteristics

Copyright © 2013–2017, Texas Instruments Incorporated Submit Documentation Feedback 7

Electrical Characteristics (continued)

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Product Folder Links: ADS1120

6.6 SPI Timing Requirements

6.7 SPI Switching Characteristics

ttd(CSSC)t ttc(SC)t tw(SCH) ttd(SCCS)t

tsu(DI) th(DI) tw(SCL)

NOTE: Single-byte communication is shown. Actual communication may be multiple bytes.

Figure 1. Serial Interface Timing Requirements

tp(CSDO) tp(SCDO) tp(CSDOZ)

NOTE: Single-byte communication is shown. Actual communication may be multiple bytes.

Figure 2. Serial Interface Switching Characteristics

6.8 Typical Characteristics

Offset Voltage (µV)

AVDD = 3.3 V AVDD = 5.0 V

Gain Error (ppm of FS)

AVDD = 3.3 V AVDD = 5.0 V

Figure 5. Gain Error vs Temperature Figure 6. Gain Error vs Temperature

INL (ppm of FS)

Figure 7. Integral Nonlinearity vs Figure 8. Integral Nonlinearity vs

10 Submit Documentation Feedback Copyright © 2013–2017, Texas Instruments Incorporated

Product Folder Links: ADS1120

Typical Characteristics (continued)

INL (ppm of FS)

Figure 9. Integral Nonlinearity vs Figure 10. Integral Nonlinearity vs

800 Reference Voltage (V) 2.050 AVDD = 5.0 V

TA = 25°C, data from 5490 devices

DVDD = 3.3 V, normal mode

Copyright © 2013–2017, Texas Instruments Incorporated Submit Documentation Feedback 11

Typical Characteristics (continued)

Absolute Input Current (nA)

Absolute Input Current (nA)

Differential Input Current (nA)

12 Submit Documentation Feedback Copyright © 2013–2017, Texas Instruments Incorporated