Low-overhead F_max calibration at multiple operating points using delay-sensitivity-based path selection

Maximum operating frequency (F_max) of a system often needs to be determined at multiple operating points, defined by voltage and temperatures. Such calibration is important for the speed binning process, where the voltage-frequency (V-F_max) relation needs to be accurately determined to sort chips into different bins that can be used for different applications. Moreover, adaptive systems typically require F_max calibration at multiple operating points in order to dynamically change operating condition such as supply voltage or body bias for power, temperature, or throughput management. For example, a Dynamic Voltage and Frequency Scaling (DVFS) system requires accurate delay calibration at multiple operating voltages in order to apply the correct operating frequency corresponding to a scaled supply. In this article, we propose a low-overhead design technique that allows efficient characterization of F_max at different operating voltages and temperatures. The proposed method selects a set of representative timing paths in a circuit based on their temperature and voltage sensitivities and dynamically configures them into a ring oscillator to compute the critical path delay. Compared to existing F_max calibration approaches, the proposed approach provides the following two main advantages: (1) it introduces a delay sensitivity metric to isolate few representative timing paths; (2) it considers actual timing paths instead of critical path replicas, thereby accounting for local within-die delay variations. The all-digital calibration method is robust under process variations and achieves high delay estimation accuracy (> 4% error) at the cost of negligible design overhead (1.7% in delay, 0.3% in power, and 3.5% in die-area).