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A Disturbance-Free Built-In Self-Test and Diagnosis Technique for DC-DC Converters

Published: 21 December 2017 Publication History

Abstract

Complex electronic systems include multiple power domains and drastically varying dynamic power consumption patterns, requiring the use of multiple power conversion and regulation units. High-frequency switching converters have been gaining prominence in the DC-DC converter market due to their high efficiency and smaller form factor. Unfortunately, they are also subject to higher process variations, and faster in-field degradation, jeopardizing stable operation of the power supply. This article presents a technique to track changes in the dynamic loop characteristics of DC-DC converters without disturbing the normal mode of operation using a white noise–based excitation and correlation. Using multiple points for injection and analysis, we show that the degraded part can be diagnosed to take remedial action. White noise excitation is generated via a pseudo-random disturbance at reference, load current, and pulse-width modulation (PWM) nodes of the converter with the test signal energy being spread over a wide bandwidth, without significantly affecting the converter noise and ripple floor. The impulse response is extracted by correlating the random input sequence with the disturbed output generated. Test signal analysis is achieved by correlating the pseudo-random input sequence with the output response and thereby accumulating the desired behavior over time and pulling it above the noise floor of the measurement set-up. An off-the-shelf power converter, LM27402, is used as the device-under-test (DUT) for experimental verification. Experimental results show that the proposed technique can estimate converter natural frequency and quality factor (Q-factor) within ±2.5% and ±0.7% error margin respectively, over changes in load inductance and capacitance. For the diagnosis purpose, a measure of inductor's DC resistance (DCR) value, which is the inductor's series resistance and indicative of the degradation in inductor's Q-factor, is estimated within less than ±1.6% error margin.

References

[1]
N. Kurd, M. Chowdhury, E. Burton, T. P. Thomas, C. Mozak, B. Boswell, P. Mosalikanti, M. Neidengard, A. Deval, A. Khanna, N. Chowdhury, R. Rajwar, T. M. Wilson and R. Kumar. 2014. Haswell: A family of IA 22 nm processors. In Proceedings of the IEEE International Solid-State Circuits Conference (ISSCC) Digest Technical Papers. 112--113.
[2]
W. G. Hurley and W. H. Wolfe. 2013. Transformers and Inductors for Power Electronics: Theory, Design and Applications (1st ed.). Wiley 8 Sons.
[3]
T. Liu, C. Fu, S. Ozev, and B. Bakkaloglu. 2014. A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters. In Proceedings of the IEEE 32nd VLSI Test Symposium. 1--6.
[4]
L. Ljung. 1999. System Identification: Theory for the User (2nd ed.). Prentice-Hall, Englewood Cliffs, N.J.
[5]
G. F. Franklin, J. D. Powell, and M. L. Workman. 1997. Digital Control of Dynamic Systems (3rd ed.). Addison-Wesley.
[6]
D. Maksimovic. 2000. Computer-aided small-signal analysis based on impulse response of DC/DC switching power converters. IEEE Transactions on Power Electronics 15, 6 (Nov. 2000), 1183--1191.
[7]
B. Johansson and M. Lenells. 2000. Possibilities of obtaining small-signal models of DC-to-DC power converters by means of system identification. In Proceedings of the IEEE 22nd Telecommunications Energy Conference. 65--75.
[8]
P. Huynh and B. H. Cho. 1995. Empirical small-signal modeling of switching converters using PSpice. In Proceedings of the IEEE 26th Power Electronics Specialists Conference (Jun. 1995), 801--808.
[9]
A. Costabeber, P. Mattavelli, S. Saggini, and A. Bianco. 2011. Digital autotuning of DC-DC converters based on a model reference impulse response. IEEE Transactions on Power Electronics 26, 10 (Oct. 2011), 2915--2924.
[10]
X. Wang, K. Blanchard, S. Estella, and A. Chatterjee. 2014. Alternative “safe” test of hysteretic power converters. In Proceedings of the IEEE 32nd VLSI Test Symposium (Apr. 2014), 1--6.
[11]
B. Miao, R. Zane, and D. Maksimovic. 2005. System identification of power converters with digital control through cross-correlation methods. IEEE Transactions on Power Electronics 20, 5 (Sept. 2005), 1093--1099.
[12]
A. Barkley and E. Santi. 2009. Improved online identification of a DC-DC converter and its control loop gain using cross-correlation methods. IEEE Transactions on Power Electronics 24, 8 (Aug. 2009), 2021--2031.
[13]
T. Roinila, T. Helin, M. Vilkko, T. Suntio, and H. Koivisto. 2009. Circular correlation based identification of switching power converter with uncertainty analysis using fuzzy density approach. Simulation Modelling Practice and Theory 17, 6 (July 2009), 1043--1058.
[14]
E. Pazouki, J. A. De Abreu-Garcia, and Y. Sozer. 2016. Fault diagnosis method for DC-DC converters based on the inductor current emulator. In Proceedings of the IEEE Energy Conversion Congress and Exposition (Sept. 2016), 1--6.
[15]
K. Yao, W. Tang, W. Hu, and J. Lyu. 2015. A current-sensorless online ESR and C identification method for output capacitor of buck converter. IEEE Transactions on Power Electronics 30, 12 (Dec. 2015), 6993--7005.
[16]
M. Shirazi, R. Zane, and D. Maksimovic. 2009. An autotuning digital controller for DC--DC power converters based on online frequency-response measurement. IEEE Transactions on Power Electronics 24, 11 (Nov. 2009), 2578--2588.
[17]
V. Aggarwal, M. Mao, and U.-M. O’Reilly. 2006. A self-tuning analog proportional-integral-derivative (PID) controller. In Proceedings of the IEEE 1st NASA/ESA Conference on Adaptive Hardware and Systems. 12--19.
[18]
N. Beohar, P. Bakliwal, S. Roy, D. Mandal, P. Adell, B. Vermeire, B. Bakkaloglu and S. Ozev. 2015. Disturbance-free BIST for loop characterization of DC-DC buck converters. In Proceedings of the IEEE 33rd VLSI Test Symposium. 1--6.
[19]
R. W. Erickson and D. Maksimovic. 2001. Fundamentals of Power Electronics (2nd ed.). Kluwer, Boston, MA.
[20]
R. Ahmadi, D. Paschedag and M. Ferdowsi. 2010. Closed-loop input and output impedances of DC-DC switching converters operating in voltage and current mode control. In Proceedings of the IEEE 36th Industrial Electronics Society (Nov. 2010), 2311--2316.
[21]
K. R. Godfrey. 1991. Introduction to binary signals used in system identification. In Proceedings of the IEEE International Conference on Control. 161--166.
[22]
B. H. Karnopp and F. E. Fisher. 1990. Determination of vibration parameters in moderately damped systems. Journal of the Franklin Institute 327, 4 (1990), 611--620.
[23]
N. Beohar, V. N. K. Malladi, D. Mandal, S. Ozev, and B. Bakkaloglu. 2017. Online built-in self-test of high switching frequency DC-DC converters using model reference based system identification techniques. IEEE Transactions on Circuits and Systems I, Regular Papers 99, 1--14.
[24]
A. Boyer, H. Huang, and S. Ben Dhia. 2014. Impact of thermal aging on emission of a buck DC-DC converter. In Proceedings of the IEEE International Symposium on Electromagnetic Compatibility. 77--80.
[25]
H. Huang, A. Boyer, and S. Ben Dhia. 2015. Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC--DC converter. Microelectronics Reliability, 55, 9-10 (Jun. 2015), 2061--2066.
[26]
K. J. Åström. 1987. Adaptive feedback control. Proceedings of IEEE 75, 2 (Feb. 1987), 185--217.
[27]
Texas Instruments. 2013. AN-1992 LM27402 evaluation board: User’s guide. Retrieved from https://www.ti.com/lit/ug/snva406b/snva406b.pdf.
[28]
H. Wang, S. Kulkarni, and S. Tragoudas. 2004. Online testing field programmable analog array circuits. In Proceedings of the IEEE International Test Conference (Oct. 2004), 1340--1348.

Cited By

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  • (2024)Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538672(1-7)Online publication date: 22-Apr-2024
  • (2023)Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable OperationIEEE Design & Test10.1109/MDAT.2023.326699740:4(5-16)Online publication date: Aug-2023
  • (2022)Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components2022 IEEE 40th VLSI Test Symposium (VTS)10.1109/VTS52500.2021.9794141(1-7)Online publication date: 25-Apr-2022

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  1. A Disturbance-Free Built-In Self-Test and Diagnosis Technique for DC-DC Converters

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    Published In

    cover image ACM Transactions on Design Automation of Electronic Systems
    ACM Transactions on Design Automation of Electronic Systems  Volume 23, Issue 2
    March 2018
    341 pages
    ISSN:1084-4309
    EISSN:1557-7309
    DOI:10.1145/3149546
    • Editor:
    • Naehyuck Chang
    Issue’s Table of Contents
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Publication History

    Published: 21 December 2017
    Accepted: 01 October 2017
    Revised: 01 September 2017
    Received: 01 March 2017
    Published in TODAES Volume 23, Issue 2

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    Author Tags

    1. Built-In Self-Test
    2. DC DC buck converter
    3. PRBS test method
    4. diagnosis method
    5. stability

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    Funding Sources

    • Space Micro Inc.
    • Semiconductor Research Corporation, National Science Foundation

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    View all
    • (2024)Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538672(1-7)Online publication date: 22-Apr-2024
    • (2023)Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable OperationIEEE Design & Test10.1109/MDAT.2023.326699740:4(5-16)Online publication date: Aug-2023
    • (2022)Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components2022 IEEE 40th VLSI Test Symposium (VTS)10.1109/VTS52500.2021.9794141(1-7)Online publication date: 25-Apr-2022

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