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View all- Kashyap SRaghavendra CNatarajan SOzev S(2024)Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors2024 IEEE 42nd VLSI Test Symposium (VTS)10.1109/VTS60656.2024.10538672(1-7)Online publication date: 22-Apr-2024
- Bilgic BOzev S(2023)Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable OperationIEEE Design & Test10.1109/MDAT.2023.326699740:4(5-16)Online publication date: Aug-2023
- Bilgic BOzev S(2022)Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components2022 IEEE 40th VLSI Test Symposium (VTS)10.1109/VTS52500.2021.9794141(1-7)Online publication date: 25-Apr-2022