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An Efficient Non-Gaussian Sampling Method for High Sigma SRAM Yield Analysis

Authors:

Sheng-Guo Wang,

Xuan ZengAuthors Info & Claims

ACM Transactions on Design Automation of Electronic Systems (TODAES), Volume 23, Issue 3

Article No.: 36, Pages 1 - 23

https://doi.org/10.1145/3174866

Published: 16 March 2018 Publication History

Abstract

Yield¹ analysis of SRAM is a challenging issue, because the failure rates of SRAM cells are extremely small. In this article, an efficient non-Gaussian sampling method of cross entropy optimization is proposed for estimating the high sigma SRAM yield. Instead of sampling with the Gaussian distribution in existing methods, a non-Gaussian distribution, i.e., a joint one-dimensional generalized Pareto distribution and (n-1)-dimensional Gaussian distribution, is taken as the function family of practical distribution, which is proved to be more suitable to fit the ideal distribution in the view of extreme failure event. To minimize the cross entropy between practical and ideal distributions, a sequential quadratic programing solver with multiple starting points strategy is applied for calculating the optimal parameters of practical distributions. Experimental results show that the proposed non-Gaussian sampling is a 2.2--4.1× speedup over the Gaussian sampling, on the whole, it is about a 1.6--2.3× speedup over state-of-the-art methods with low- and high-dimensional cases without loss of accuracy

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Cited By

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https://dl.acm.org/doi/10.1145/3577017
Pereira DGhose AGhosh SDey S(2023)Inferencing on Edge Devices: A Time- and Space-aware Co-scheduling ApproachACM Transactions on Design Automation of Electronic Systems10.1145/357619728:3(1-33)Online publication date: 19-Mar-2023
https://dl.acm.org/doi/10.1145/3576197
Wang JDu HDing BXu QChen SKang Y(2023)DDAM: Data Distribution-Aware Mapping of CNNs on Processing-In-Memory SystemsACM Transactions on Design Automation of Electronic Systems10.1145/357619628:3(1-30)Online publication date: 19-Mar-2023
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Index Terms

An Efficient Non-Gaussian Sampling Method for High Sigma SRAM Yield Analysis
1. Hardware
  1. Robustness
    1. Design for manufacturability
      1. Yield and cost modeling

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Published In

cover image ACM Transactions on Design Automation of Electronic Systems

ACM Transactions on Design Automation of Electronic Systems Volume 23, Issue 3

May 2018

341 pages

ISSN:1084-4309

EISSN:1557-7309

DOI:10.1145/3184476

Editor:
Naehyuck Chang
Korea Advanced Institute of Science and Technology, Korea

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Copyright © 2018 ACM.

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Association for Computing Machinery

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ACM Journals for the Design of Smart and Connected Systems

Publication History

Published: 16 March 2018

Accepted: 01 December 2017

Received: 01 July 2017

Published in TODAES Volume 23, Issue 3

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National Major Science and Technology Special Project of China
National Science Foundation (NSF)
National Natural Science Foundation of China (NSFC) research projects
Recruitment Program of Global Experts (the Thousand Talents Plan)
NSF
National Key Research and Development Program of China

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Cited By

Nie QMalik S(2023)CNNFlow: Memory-driven Data Flow Optimization for Convolutional Neural NetworksACM Transactions on Design Automation of Electronic Systems10.1145/357701728:3(1-36)Online publication date: 19-Mar-2023
https://dl.acm.org/doi/10.1145/3577017
Pereira DGhose AGhosh SDey S(2023)Inferencing on Edge Devices: A Time- and Space-aware Co-scheduling ApproachACM Transactions on Design Automation of Electronic Systems10.1145/357619728:3(1-33)Online publication date: 19-Mar-2023
https://dl.acm.org/doi/10.1145/3576197
Wang JDu HDing BXu QChen SKang Y(2023)DDAM: Data Distribution-Aware Mapping of CNNs on Processing-In-Memory SystemsACM Transactions on Design Automation of Electronic Systems10.1145/357619628:3(1-30)Online publication date: 19-Mar-2023
https://dl.acm.org/doi/10.1145/3576196
Choudhury DXiang LRajam AKalyanaraman APande P(2023)Accelerating Graph Computations on 3D NoC-Enabled PIM ArchitecturesACM Transactions on Design Automation of Electronic Systems10.1145/356429028:3(1-16)Online publication date: 19-Mar-2023
https://dl.acm.org/doi/10.1145/3564290
Rawat BMittal P(2022)A Switching NMOS Based Single Ended Sense Amplifier for High Density SRAM ApplicationsACM Transactions on Design Automation of Electronic Systems10.1145/357619828:3(1-14)Online publication date: 12-Dec-2022
https://dl.acm.org/doi/10.1145/3576198
Feng LLiu WGuo CTang KZhuo CWang Z(2022)GANDSE: Generative Adversarial Network-based Design Space Exploration for Neural Network Accelerator DesignACM Transactions on Design Automation of Electronic Systems10.1145/357092628:3(1-20)Online publication date: 9-Nov-2022
https://dl.acm.org/doi/10.1145/3570926
Yin SJin XShi LWang KXing WOshana R(2022)Efficient bayesian yield analysis and optimization with active learningProceedings of the 59th ACM/IEEE Design Automation Conference10.1145/3489517.3530607(1195-1200)Online publication date: 10-Jul-2022
https://dl.acm.org/doi/10.1145/3489517.3530607

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