Bipolar-Junction (BJT) Transistors: NPN Transistor PNP Transistor
Bipolar-Junction (BJT) Transistors: NPN Transistor PNP Transistor
Bipolar-Junction (BJT) Transistors: NPN Transistor PNP Transistor
n+ p+
E E E E
At the first glance, a BJT looks like 2 diodes placed back to back.
Indeed this is the case if we apply voltage to only two of the three
terminals, letting the third terminal float. This is also the way that
we check if a transistor is working: use an ohm-meter to ensure both
diodes are in working conditions. (One should also check the resistance
between CE terminals and read a vary high resistance as one may have
a burn through the base connecting collector and emitter.)
The behavior of the BJT is different, however, when voltage sources are
attached to both BE and CE terminals. The BE junction acts like a
diode. When this junction is forward biased, electrons flow from emitter
to the base (and a small current of holes from base to emitter). The
base region is narrow and when a voltage is applied between collector
and emitter, most of the electrons that were flowing from emitter to
base, cross the narrow base region and are collected at the collector
region. So while the BC junction is reversed biased, a large current can
flow through that region and BC junction does not act as a diode.
The amount of the current that crosses from emitter to collector region depends strongly
on the voltage applied to the BE junction, vBE . (It also depends weakly on voltage applied
Thus, only four of these 6 parameters are independent parameters. The relationship among
these four parameters represents the “iv” characteristics of the BJT, usually shown as i B vs
vBE and iC vs vCE graphs.
The above graphs show several characteristics of BJT. First, the BE junction acts likes
a diode. Secondly, BJT has three main states: cut-off, active-linear, and saturation. A
description of these regions are given below. Lastly, The transistor can be damaged if (1) a
large positive voltage is applied across the CE junction (breakdown region), or (2) product
of iC vCE exceed power handling of the transistor, or (3) a large reverse voltage is applied
between any two terminals.
Several “models” available for a BJT. These are typically divided into two general categories:
“large-signal” models that apply to the entire range of values of current and voltages, and
“small-signal” models that apply to AC signals with small amplitudes. “Low-frequency” and
“high-frequency” models also exist (high-frequency models account for capacitance of each
junction). Obviously, the simpler the model, the easier the circuit calculations are. More
complex models describe the behavior of a BJT more accurately but analytical calculations
become difficult. PSpice program uses a high-frequency, Eber-Mos large-signal model which
is a quite accurate representation of BJT. For analytical calculations here, we will discuss a
simple low-frequency, large-signal model (below) and a low-frequency, small-signal model in
the context of BJT amplifiers later.
Since the collector and emitter currents are very small for any vCE , the effective resistance
between collector and emitter is very large (100’s of MΩ) making the transistor behave as
an open circuit in the cut-off region.
When the BE junction is forward-biased, transistor is ON. The behavior of the transistor,
however, depends on how much voltage is applied between collector and emitter. If vCE > vγ ,
the BE junction is forward biased while BC junction is reversed-biased and transistor is in
active-linear region. In this region, iC scales linearly with iB and transistor acts as an
amplifier.
iC
Active-Linear: vBE = vγ , iB > 0, = β ≈ constant, vCE ≥ vγ
iB
If vCE < vγ , both BE and BC junctions are forward biased. This region is called the
saturation region. As vCE is small while iC can be substantial, the effective resistance
between collector and emitter in saturation region is small and the BJT acts as a closed-
circuit.
iC
Saturation: vBE = vγ , iB > 0, < β, vCE ≈ vsat
iB
Our model specifies vCE ≈ vsat , the saturation voltage. In reality in the saturation region
0 < vCE < vγ . As we are mainly interested in the value of the collector current in this region,
vCE is set to a value in the middle of its range in our simple model: vCE ≈ vsat ∼ 0.5vγ .
Typically a value of vsat ≈ 0.2 − 0.3 V is used for Si semiconductors.
BJT OFF
iC
BE-KVL: 4 = 40 × 103 iB + vBE +
40 kΩ iB
CE-KVL: 3
12 = 10 iC + vCE , vCE
+
+ 4V vBE _ _
-
Assume BJT is in cut-off. Set iB = 0 in BE-KVL: iE
So BJT is not in cut off and BJT is ON. Set vBE = 0.7 V and use BE-KVL to find iB .
4 − 0.7
BE-KVL: 4 = 40 × 103 iB + vBE → iB = = 82.5 µA
40, 000
Assume BJT is in active linear, Find iC = βiB and use CE-KVL to find vCE :
As vCE = 3.75 > vγ , the BJT is indeed in active-linear and we have: vBE = 0.7 V, iB =
82.5 µA, iE ≈ iC = 8.25 mA, and vCE = 3.75 V.
40 kΩ iB +
CE-KVL: 12 = 1, 000iC + vCE + 1, 000iE vCE
+
+ 4V vBE _ _
Assume BJT is in cut-off. -
iE
Set iB = 0 and iE = iC = 0 in BE-KVL:
1 kΩ
So BJT is not in cut off and vBE = 0.7 V and iB > 0. Here, we cannot find iB right away
from BE-KVL as it also contains iE .
As vCE = 7.2 > vγ , the BJT is indeed in active-linear and we have: vBE = 0.7 V, iB = 24 µA,
iE ≈ iC = 2.4 mA, and vCE = 7.2 V.
Load line
The operating point of a BJT can be found graphically using the concept of a load line. A
load line is the relationship between iC and vCE that is imposed on BJT by the external
circuit. For a given value of iB , the iC vCE characteristics curve of a BJT is the relationship
between iC and VCE as is set by BJT internals. The intersection of the load line with the
BJT characteristics represent a pair of iC and vCE values which satisfy both conditions and,
therefore, is the operating point of the BJT (often called the Q point for Quiescent point)
The equation of a load line for a BJT should include only iC and vCE (no other unknowns).
This equation is usually found by writing a KVL around a loop containing vCE . For the
example above, we have (using iE ≈ iC ):
An example of a load line, iC vCE characteristics of a BJT, and the Q-point is shown below.
VCC
The basic element of logic circuits is the transistor switch. A
schematic of such a switch is shown. When the switch is open, iC RC
The above BJT circuit is also an “inverter” or a “NOT” logic gate. Let’s assume that the
“low” states are voltages between 0 to 0.5 V, “high” states voltages are between 4 to 5 V,
and VCC = 5 V. When the input voltage is “low” (vi ≈ 0), BJT will be in cut-off and
vo = VCC = 5 V (“high” state). When input voltage is “high,” with proper choice of RB ,
BJT will be in saturation, and vo = vCE = Vsat ≈ 0.2 V (“low” state).
vi − v γ
iB =
RB
VCC − Vsat
v i = v γ + R B iB > v γ + R B × = VIH
βRC
Therefore, for input voltages larger than the a certain value (VIH ) , the gate output is low.
For vi values between these two limits, the BE junction is forward biased but the BJT is
NOT in saturation, therefore, it is in active linear. In this case, the output voltage smoothly
changes for its high value to its low value as is shown in the plot of transfer characteristics.
This range of vi is a “forbidden” region and the gate would not work properly in this region.
This behavior can also seen in the plot of the BJT load line. For small values of vi (iB = 0)
BJT is in cut-off. As vi is increased, iB is increased and the operating point moves to the
left and up on the load line and enters the active-linear region. When iB is raised above
certain limit, the operating point enters the saturation region.
A major drawback of the this RTL inverter gate is the limited VCC
input range for the “low” signal (VIL ). Our analysis indicated
iC RC
that VIL = vγ , that is the gate input is low for voltages between 0
and vγ ≈ 0.7 V. For this analysis, we have been using a piecewise vo
linear model for the BE junction diode. In reality, the BJT RB iB
vi
will come out of cut-off (BE junction will conduct) at smaller
i2
voltages (0.4–0.5 V). To resolve this shortcoming, one can add R1 i1
a resistor between the base and ground (or between base and a
negative power supply) as is shown. (You have seen this circuit
in ECE20A, motor drive circuit.)
To see the impact of this resistor, note that VIL is the input voltage when BJT is just leaving
the cut-off region. At this point, vBE = vγ , and iB is positive but very small (effectively
vBE vBE
i1 = i2 = i B + i 1 ≈ i 1 =
R1 R1
RB RB
VIL = vi = RB i2 + vBE = vBE + vBE = vγ 1 +
R1 R1
This value should be compared with VIL = vγ in the absence of resistor R1 . It can be seen
that for RB = R1 , VIL is raised from 0.7 to 1.4 V and for RB = 2R1 , VIL is raised to 2.1 V.
R1 does not affect VIH as iB needed to put the BJT in saturation is typically several times
larger than i1 .
V
CC
RTL NOR Gate
RC
RTLs were the first digital logic circuits using transistors. They were replaced with other
forms (DDT, TTL, and ECL) with the advent of integrated circuits. The major problem
with these circuits are the use of large resistors that would take large space on an IC chip (in
today’s chip, resistor values are limited to about 20 kΩ and capacitance to about 100 pF).
Before we move on to more modern gates, we consider two important characteristics of a
digital gate.
Before BJT can enter saturation, it should traverse the active-linear region. The rise time,
tr (on the order of 1-10 ns) account for this transition. The time that takes for the gate to
switch “ON” is represented by ton .
Suppose that the input voltage to gate is then reduced instantaneously to low state. BJT
will leave saturation region and go to cut-off. Again, this not occur instantaneously. When
a BJT is in saturation, both BE and BC junctions are forward biased and conducting. As
such, an excess minority charge is stored in the base. For the transistor to leave saturation
and enter active-linear (BC junction to become reversed biased), this excess charge must be
removed. The time required for the removal of excess charge determines the storage time, t s
(order of 100 ns). Then, transistor traverses the active-linear region before entering cut-off.
This account for the fall time tf (1-10 ns). The total time it takes for the gate to switch
“OFF’ is represented by tof f . As can be seen, BJT switching is mainly set by the storage
time, ts .
Propagation delays introduced by transistor switching time are important constraints in
designing faster chips. Gate designs try to minimize propagation delays as much as possible.
Fan-out: All digital logic circuits are constructed with cross-coupling of several basic gates
(such as NOR or NAND). As such, a basic gate may be attached to several other gates.
The maximum number of gates that can be attached to a digital gate is called “fan-out.”
Obviously, one would like to have large fan-out.
The basic gate of DTL logic circuits is a NAND gate which is constructed by a combination
of a diode AND gate and a BJT inverter gate.
V
CC
Diode AND Gate: First, let’s consider the diode AND
iA
gate as is shown. To study the behavior of the gate we will RA
consider the state of the circuit for different values of v1 and
D1 i1
v2 (either 0 or 5 V corresponding to low and high states). v1 vo
To aid the analysis, let’s assume VCC = 5 V and RA = 1 kΩ. D2 i2
We note that by KCL, iA = i1 + i2 (assuming that there is v2
Current iA will be divided between two diodes by KCL, each carrying one half of iA (because
of symmtery). Thus, i1 = i2 = 2.1 mA. Since diode currents are positive, our assumption of
both diode being forward biased is justified and, therefore, vo = 0.7 V.
So, when v1 and v2 are low, D1 and D2 are ON and vo is low.
Case 2, v1 = 0, v2 = 5 V: Again, we note that the 5-V supply will tend to forward bias
D1 . Assume D1 is ON: vD1 = vγ = 0.7 V and i1 > 0. Then:
vo = v1 + vD1 = 0.7 V
vo = v2 + vD2 → vD2 = −4.3 V < vγ
VCC − vo 5 − 0.7
iA = = = 4.3 mA
RA 1, 000
i1 = iA − i2 = 4.3 − 0 = 4.3 mA
Since i1 > 0, our assumption of D1 being forward biased is justified and, therefore, vo = 0.7 V.
So, when v1 is low and v2 is high, D1 is ON and D2 is OFF and vo is low.
iA = i 1 + i 2 = 0
vo = VCC − i1 RA = 5 − 0 = 5 V
vD1 = vo − v1 = 5 − 5 = 0 < vγ and vD2 = vo − v2 = 5 − 5 = 0 < vγ
iC RC iC RC
iA iA
RA RA
vo vo
D1 i1 RB iB D1 i1 D3 D4 iB
v1 v1
D2 i2 D2 i2
v2 v2 R1
Voltage v3 = 0.9 V is not sufficient to froward bias D3 and D4 as v3 = vD3 + vD4 + vBE and we
need at least 1.4 V to forward bias the two diodes. So both D3 and D4 are OFF and i4 = 0.
(Note that D3 and D4 can be forward biased without BE junction being forward biased as
long as the current i4 is small enough such that voltage drop across the 5 kΩ resistor parallel
to BE junction is smaller than 0.7 V. In this case, i5 = i4 and iB = 0.) Then:
5 − v3 5 − 0.2
i1 + i 2 = i A = = = 0.82 mA
5, 000 5, 000
And by symmetry, i1 = i2 = 0.5iA = 0.41 mA. Since both i1 and i2 are positive, our
assumption of D1 and D2 being ON are justified. Since i4 = 0, iB = 0 and BJT will be in
cut-off with iC = 0 and vo = 5 V.
So, in this case, D1 and D2 are ON, D3 and D4 are OFF, BJT is in cut-off, and vo = 5 V.
Case 2: v1 = 0.2 V, v2 = 5 V Following arguments of case 1, assume D1 is ON. Again,
v3 = 0.7 + 0.2 = 0.9 V, and D3 and D4 will be OFF with i4 = 0. We find that voltage across
D2 is vD2 = v3 − v2 = 0.9 − 5 = −4.1 V and, thus, D2 will be OFF and i2 = 0. Then:
5 − v3 5 − 0.2
i1 = i A = = = 0.82 mA
5, 000 5, 000
and since i1 > 0, our assumption of D1 ON is justified. Since i4 = 0, iB = 0 and BJT will
be in cut-off with iC = 0 and vo = 5 V.
So, in this case, D1 is ON, D2 is OFF, D3 and D4 are OFF, BJT is in cut-off, and vo = 5 V.
5 − v3 5 − 2.1
i4 = i A = = = 0.58 mA
5, 000 5, 000
vBE 0.7
i5 = = = 0.14 mA
5, 000 5, 000
iB = i4 − i5 = 0.58 − 0.14 = 0.44 mA
and since i4 > 0 our assumption of D3 and D4 being ON are justified and since iB > 0 our
assumption of BJT not in cut-off is justified.
We still do not know if BJT is in active-linear or saturation. Assume BJT is in saturation:
vo = vCE = Vsat = 0.2 V and iC /iB < β. Then, assuming no gate is attached to the circuit,
we have
5 − Vsat 5 − 0.2
iC = = = 4.8 mA
1, 000 1, 000
and since iC /iB = 4.8/0.44 = 11 < β = 40, our assumption of BJT in saturation is justified.
So, in this case, D1 and D2 are OFF, D3 and D4 are ON, BJT is in saturation and vo = 0.2 V.
Overall, the output in “low” only if both inputs are “high”, thus, this is a NAND gate.
Note: It is interesting to note that at the input of this gate, the current actually flows out
of the gate. In the example above, when both inputs were high i1 = i2 = 0, when both were
low i1 = i2 = 0.4 mA, and when one input was low, e.g., v1 was low, i1 = 0.8mA. The input
current flowing in (or out of the gate in this case) has implications for the fan-out capability
of logic gates as is shown in the example below.
iR i
5kΩ
iA
5kΩ iL
vo
D1 i1 D3 D4 iB iC
v1
i4
D2 i2
v2 i5 5kΩ
The circuit is the same DTL NAND gate of previous example and we can use results from
previous example here. “N ” other NAND gates are attached to the output of this gate.
Fan-out is the maximum value of N . Since we want to make sure that our gate operates
properly under all conditions, we should consider the worst case, when all of the second stage
gates have maximum currents.
For a NAND DTL gate, the maximum current i occurs when all of the inputs are high with
exception of one input. We found this value to be 0.82 mA (Cases 2 & 3 in the previous
example). Therefore, the worst case is when the input of all second stage gates are low (for
the first stage, vo = 0.2 V) and each draw a current 0.82 mA (a total of iL = N × 0.82 mA
is drawn from the first stage gate).
Considering the first stage gate, we had found that vo = 0.2 V only for Case 4. For that
case, we found iB = 0.44 mA. Then:
5 − Vsat 5 − 0.2
iR = = = 4.8 mA
1, 000 1, 000
iC = iR + 0.82N = 4.8 + 0.82N
The first stage gate operates properly as long as the BJT is in saturation, i.e.,
As the fan-out should be integer, the fan-out for this gate is 13.
Fan-out of DTL gates can be greatly increased by a small modification. Fan-out can be
increased by increasing the base current of the BJT. iB is, however, limited by the current iA
(and i4 ). Reducing the value of RA in the AND diode part of the circuit will have increase
iB . Unfortunately, as this resistor is reduced, power dissipation in the gate increases and the
fan-out capability decreases dramatically.
R1