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ORCIDSule Ozev
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2020 – today
- 2024
[c127]Tolga Aksoy, Nikhil Sagar Modala, Lakshmanan Balasubramanian, Rubin A. Parekhji, Sule Ozev:
Hierarchical Fault Simulation for Mixed-Signal Circuits Using Template Based Fault Response Modeling. ETS 2024: 1-6- [c126]Ishaan Bassi, Sule Ozev:
Electrical Stimulus Based Calibration of MEMS Accelerometer. ITC 2024: 217-225 - [c125]Nikhil Sagar Modala, Lakshmanan Balasubramanian, Rubin A. Parekhji, Sule Ozev:
Increasing the Efficiency of Hierarchical Fault Simulation through Functional Fault Clustering. MWSCAS 2024: 693-697 - [c124]Ferhat Can Ataman, Mohammed Aladsani, Y. B. Chethan Kumar, Georgios C. Trichopoulos, Sule Ozev:
Multi-Parameter Optimization of mm-Wave Antenna Layout Using Hybrid Modeling and Incremental Model Learning. VTS 2024: 1-5 - [c123]Ishaan Bassi, Sule Ozev:
Calibration and Source Localization Using an Array of Resistive Metal Oxide Gas Sensors. VTS 2024: 1-7 - [c122]Suhas Krishna Kashyap, Chinmaye Raghavendra, Suriyaprakash Natarajan, Sule Ozev:
Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors. VTS 2024: 1-7 - 2023
- [j57]Bora Bilgic, Sule Ozev
:
Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation. IEEE Des. Test 40(4): 5-16 (2023) - [j56]Suhas Krishna Kashyap, Sule Ozev:
IMPRoVED: Integrated Method to Predict PostRouting setup Violations in Early Design Stages. ACM Trans. Design Autom. Electr. Syst. 28(4): 49:1-49:23 (2023) - [c121]Ferhat Can Ataman, Muslum Emir Avci, Y. B. Chethan Kumar, Sule Ozev:
Global Tuning for System Performance Optimization of RF MIMO Radars. ETS 2023: 1-4 - [c120]Ferhat Can Ataman, Mohammed Aladsani, Georgios C. Trichopoulos, Y. B. Chethan Kumar, Sule Ozev:
Mismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors. ETS 2023: 1-6 - [c119]Ferhat Can Ataman, Y. B. Chethan Kumar, Sandeep Rao, Sule Ozev:
Improving Angle of Arrival Estimation Accuracy for mm-Wave Radars. ITC 2023: 30-36 - [c118]Ishaan Bassi, Sule Ozev:
A Low Cost Physical Stimulus Emulator for Motion and Pressure Sensors. MWSCAS 2023: 322-325 - 2022
- [j55]Mehmet Ince, Bora Bilgic, Sule Ozev:
Digital Fault-based Built-in Self-test and Evaluation of Low Dropout Voltage Regulators. ACM J. Emerg. Technol. Comput. Syst. 18(3): 54:1-54:20 (2022) - [j54]Maryam Shafiee, Sule Ozev:
An In-Field Programmable Adaptive CMOS LNA for Intelligent IoT Sensor Node Applications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(2): 201-210 (2022) - [c117]Bora Bilgic, Sule Ozev:
Guaranteed Activation of Capacitive Trojan Triggers During Post Production Test via Supply Pulsing. DATE 2022: 993-998 - [c116]Diaa Badawi, Ishaan Bassi, Sule Ozev, Ahmet Enis Çetin:
Detecting Anomaly in Chemical Sensors via Regularized Contrastive Learning. ICASSP 2022: 86-90 - [c115]Muslum Emir Avci, Sule Ozev, Y. B. Chethan Kumar:
Fast RF Mismatch Calibration Using Built-in Detectors. VTS 2022: 1-7 - [c114]Bora Bilgic, Sule Ozev:
Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components. VTS 2022: 1-7 - [c113]Daniel W. Gulick, Yuna Jung, Seunghyun Lee, Sule Ozev, Jennifer Blain Christen:
Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants. VTS 2022: 1-7 - 2021
- [j53]Fatih Karabacak, Ümit Y. Ogras, Sule Ozev:
Malicious Activity Detection in Lightweight Wearable and IoT Devices Using Signal Stitching. Sensors 21(10): 3408 (2021) - [j52]Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev:
Fault-based Built-in Self-test and Evaluation of Phase Locked Loops. ACM Trans. Design Autom. Electr. Syst. 26(3): 20:1-20:18 (2021) - [c112]Diaa Badawi, Agamyrat Agambayev, Sule Ozev, A. Enis Çetin:
Discrete Cosine Transform Based Causal Convolutional Neural Network for Drift Compensation in Chemical Sensors. ICASSP 2021: 8012-8016 - [c111]Muslum Emir Avci, Sule Ozev:
Background Receiver IQ Imbalance Correction for in-Field and Post-Production Testing and Calibration. ITC 2021: 380-388 - [c110]Ishaan Bassi, Sule Ozev, Doohwang Chang:
Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration. VTS 2021: 1-7 - 2020
- [j51]Ganapati Bhat, Hang Gao, Sumit K. Mandal, Ümit Y. Ogras, Sule Ozev:
Determining Mechanical Stress Testing Parameters for FHE Designs with Low Computational Overhead. IEEE Des. Test 37(4): 35-41 (2020) - [j50]Ganapati Bhat, Ujjwal Gupta, Yigit Tuncel, Fatih Karabacak, Sule Ozev, Ümit Y. Ogras:
Self-Powered Wearable IoT Devices for Health and Activity Monitoring. Found. Trends Electron. Des. Autom. 13(3): 145-269 (2020) - [j49]H. Seckin Demir, Jennifer Blain Christen, Sule Ozev:
Energy-Efficient Image Recognition System for Marine Life. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(11): 3458-3466 (2020) - [j48]Osman Emir Erol, Sule Ozev:
A Reconfigurable 0.1-10 MHz DT Passive Dynamic Zoom ADC for Cellular Receivers. IEEE Trans. Circuits Syst. I Regul. Pap. 67-I(7): 2216-2228 (2020) - [j47]Doohwang Chang, Jennifer N. Kitchen, Sayfe Kiaei, Sule Ozev:
In-Field Recovery of RF Circuits from Wearout Based Performance Degradation. IEEE Trans. Emerg. Top. Comput. 8(2): 442-452 (2020) - [c109]Mehmet Ince, Sule Ozev:
Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators. ETS 2020: 1-2 - [c108]Chengmo Yang, Patrick Cronin, Agamyrat Agambayev, Sule Ozev, A. Enis Çetin, Alex Orailoglu:
A Crowd-Based Explosive Detection System with Two-Level Feedback Sensor Calibration. ICCAD 2020: 8:1-8:9 - [c107]Muslum Emir Avci, Sule Ozev:
Design Optimization for N-port RF Network Reflectometers under Noise and Gain Imperfections. ITC 2020: 1-10 - [c106]Agamyrat Agambayev, Christopher Lue Sang, Jennifer Blain Christen, Sule Ozev:
Enabling Large-scale Fine-grained Simulation of IED Vapor Concentration in Open-air Environments. MWSCAS 2020: 73-76 - [c105]Debatrayee Roychowdhury, Soroush Moallemi, Sule Ozev, Jennifer Kitchen:
Self-Interference Signal Path Characterization in Full-Duplex Transceivers Using Built-in Self-Test. RWS 2020: 16-19
2010 – 2019
- 2019
- [j46]Diaa Badawi, Tuba Ayhan, Sule Ozev, Chengmo Yang, Alex Orailoglu, Ahmet Enis Çetin:
Detecting Gas Vapor Leaks Using Uncalibrated Sensors. IEEE Access 7: 155701-155710 (2019) - [j45]Jae Woong Jeong, Jennifer Kitchen, Sule Ozev:
On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration. IEEE Des. Test 36(3): 117-125 (2019) - [j44]Maryam Shafiee, Sule Ozev:
Contact-Less Near-Field Test of Active Integrated RF Phased Array Antennas. J. Electron. Test. 35(3): 335-347 (2019) - [j43]Osman Emir Erol, Sule Ozev:
Knowledge- and Simulation-Based Synthesis of Area-Efficient Passive Loop Filter Incremental Zoom-ADC for Built-In Self-Test Applications. ACM Trans. Design Autom. Electr. Syst. 24(1): 3:1-3:27 (2019) - [j42]Yanjun Li, Ender Yilmaz, Pete Sarson, Sule Ozev:
Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements. ACM Trans. Design Autom. Electr. Syst. 24(4): 45:1-45:16 (2019) - [c104]Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev:
Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. ETS 2019: 1-6 - [c103]Diaa Badawi, Sule Ozev, Jennifer Blain Christen, Chengmo Yang, Alex Orailoglu, A. Enis Çetin:
Detecting Gas Vapor Leaks through Uncalibrated Sensor Based CPS. ICASSP 2019: 8296-8300 - [c102]Hang Gao, Ganapati Bhat, Ümit Y. Ogras, Sule Ozev:
Optimized Stress Testing for Flexible Hybrid Electronics Designs. VTS 2019: 1-6 - [c101]Matthew McGuire, Ümit Y. Ogras, Sule Ozev:
PCB Hardware Trojans: Attack Modes and Detection Strategies. VTS 2019: 1-6 - [i4]Maryam Shafiee, Sule Ozev:
An In-Field Programmable Adaptive CMOS LNA for Intelligent IOT Sensor Node Applications. CoRR abs/1904.12999 (2019) - [i3]Diaa Badawi, Tuba Ayhan, Sule Ozev, Chengmo Yang, Alex Orailoglu, A. Enis Çetin:
Detecting Gas Vapor Leaks Using Uncalibrated Sensors. CoRR abs/1908.07619 (2019) - 2018
- [j41]Navankur Beohar, Venkata N. K. Malladi, Debashis Mandal, Sule Ozev, Bertan Bakkaloglu:
Online Built-In Self-Test of High Switching Frequency DC-DC Converters Using Model Reference Based System Identification Techniques. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(2): 818-831 (2018) - [j40]Maryam Shafiee, Navankur Beohar, Priyanka Bakliwal, Sidhanto Roy, Debashis Mandal, Bertan Bakkaloglu, Sule Ozev:
A Disturbance-Free Built-In Self-Test and Diagnosis Technique for DC-DC Converters. ACM Trans. Design Autom. Electr. Syst. 23(2): 25:1-25:22 (2018) - [j39]Doohwang Chang, Ganapati Bhat, Ümit Y. Ogras, Bertan Bakkaloglu, Sule Ozev:
Detection Mechanisms for Unauthorized Wireless Transmissions. ACM Trans. Design Autom. Electr. Syst. 23(6): 70:1-70:21 (2018) - [j38]Fatih Karabacak, Ümit Y. Ogras, Sule Ozev:
Remote Detection of Unauthorized Activity via Spectral Analysis. ACM Trans. Design Autom. Electr. Syst. 23(6): 81:1-81:21 (2018) - [c100]Mehmet Ince, Ender Yilmaz, Sule Ozev:
Enabling fast process variation and fault simulation through macromodelling of analog components. NATW 2018: 1-6 - [c99]Fatih Karabacak, Richard Welker, Matthew J. Casto, Jennifer N. Kitchen, Sule Ozev:
RF circuit authentication for detection of process Trojans. VTS 2018: 1-6 - [c98]Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev:
Online information utility assessment for per-device adaptive test flow. VTS 2018: 1-6 - [c97]Maryam Shafiee, Jennifer N. Kitchen, Sule Ozev:
A built-in self-test technique for transmitter-only systems. VTS 2018: 1-6 - [c96]Hans-Mart von Staudt, James Izon, Sule Ozev, Peter Sarson:
Special session on BIST/calibration of A/MS devices. VTS 2018: 1 - 2017
- [j37]Chandra K. H. Suresh, Sule Ozev, Ozgur Sinanoglu:
Adaptive Reduction of the Frequency Search Space for Multi-Vdd Digital Circuits Using Variation Sensitive Ring Oscillators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(6): 1043-1053 (2017) - [j36]Jae Woong Jeong, Vishwanath Natarajan, Shreyas Sen, T. M. Mak, Jennifer Kitchen, Sule Ozev:
A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources. ACM Trans. Design Autom. Electr. Syst. 23(1): 2:1-2:21 (2017) - [c95]Fatih Karabacak, Ümit Y. Ogras, Sule Ozev:
Remote detection of unauthorized activity via spectral analysis: work-in-progress. CODES+ISSS 2017: 10:1-10:2 - [c94]Maryam Shafiee, Sule Ozev:
Contact-less near-field measurement of RF phased array antenna mismatches. ETS 2017: 1-6 - [c93]Maryam Shafiee, Sule Ozev:
Receiver echo cancellation with real-time self calibration for passive implanted neuron recorders. ISCAS 2017: 1-4 - [c92]Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev:
Built-in self-test for stability measurement of low dropout regulator. ITC 2017: 1-9 - [c91]Mehmet Ince, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, Sule Ozev:
Evaluation of loop transfer function based dynamic testing of LDOs. ITC-Asia 2017: 14-19 - [c90]Mehmet Ince, Sule Ozev, Sarma B. K. Vrudhula:
Statistical library characterization using arbitrary polynomial chaos. LASCAS 2017: 1-4 - 2016
- [j35]Ramachandran Venkatasubramanian, Kent Oertle, Sule Ozev:
Rail Clamp with Dynamic Time-Constant Adjustment. IEEE J. Solid State Circuits 51(5): 1313-1324 (2016) - [j34]Chandra K. H. Suresh, Ozgur Sinanoglu, Sule Ozev:
Adapting to Varying Distribution of Unknown Response Bits. ACM Trans. Design Autom. Electr. Syst. 21(2): 33:1-33:22 (2016) - [j33]Ramachandran Venkatasubramanian, Robert Elio, Sule Ozev:
Process Independent Design Methodology for the Active RC and Single-Inverter-Based Rail Clamp. ACM Trans. Design Autom. Electr. Syst. 21(3): 50:1-50:19 (2016) - [j32]Doohwang Chang, Jennifer N. Kitchen, Bertan Bakkaloglu, Sayfe Kiaei, Sule Ozev:
Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits. IEEE Trans. Very Large Scale Integr. Syst. 24(3): 1179-1183 (2016) - [j31]Ramachandran Venkatasubramanian, Kent Oertle, Sule Ozev:
A Comparator-Based Rail Clamp. IEEE Trans. Very Large Scale Integr. Syst. 24(4): 1493-1502 (2016) - [j30]Jae Woong Jeong, Afsaneh Nassery, Jennifer N. Kitchen, Sule Ozev:
Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers. IEEE Trans. Very Large Scale Integr. Syst. 24(6): 2286-2298 (2016) - [c89]Ganapati Bhat, Ujjwal Gupta, Nicholas Tran, Jaehyun Park, Sule Ozev, Ümit Y. Ogras:
Multi-objective design optimization for flexible hybrid electronics. ICCAD 2016: 73 - [c88]Doohwang Chang, Jennifer Kitchen, Sule Ozev:
Post-production adaptation of RF circuits for application-specific performance metrics. ISCAS 2016: 2775-2778 - [c87]Fatih Karabacak, Ümit Y. Ogras, Sule Ozev:
Detection of malicious hardware components in mobile platforms. ISQED 2016: 179-184 - [c86]Fatih Karabacak, Uwadiae Obahiagbon, Ümit Y. Ogras, Sule Ozev, Jennifer Blain Christen:
Making unreliable Chem-FET sensors smart via soft calibration. ISQED 2016: 456-461 - [c85]Jae Woong Jeong, Jennifer Kitchen, Sule Ozev:
Process independent gain measurement with low overhead via BIST/DUT co-design. VTS 2016: 1-6 - 2015
- [j29]Ender Yilmaz, Sule Ozev:
Adaptive-Learning-Based Importance Sampling for Analog Circuit DPPM Estimation. IEEE Des. Test 32(1): 36-43 (2015) - [j28]Chandra K. H. Suresh, Sule Ozev, Ozgur Sinanoglu:
Adaptive Generation of Unique IDs for Digital Chips through Analog Excitation. ACM Trans. Design Autom. Electr. Syst. 20(3): 46:1-46:18 (2015) - [j27]Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani:
Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector. IEEE Trans. Very Large Scale Integr. Syst. 23(2): 331-341 (2015) - [c84]Osman Emir Erol, Sule Ozev, Chandra K. H. Suresh, Rubin A. Parekhji, Lakshmanan Balasubramanian:
On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC. DATE 2015: 1559-1562 - [c83]Jae Woong Jeong, Jennifer Kitchen, Sule Ozev:
Robust amplitude measurement for RF BIST applications. ETS 2015: 1-6 - [c82]Jae Woong Jeong, Jennifer Kitchen, Sule Ozev:
A self-compensating built-in self-test solution for RF phased array mismatch. ITC 2015: 1-9 - [c81]Navankur Beohar, Priyanka Bakliwal, Sidhanto Roy, Debashis Mandal, Philippe Adell, Bert Vermeire, Bertan Bakkaloglu, Sule Ozev:
Disturbance-free BIST for loop characterization of DC-DC buck converters. VTS 2015: 1-6 - [c80]Doohwang Chang, Bertan Bakkaloglu, Sule Ozev:
Enabling unauthorized RF transmission below noise floor with no detectable impact on primary communication performance. VTS 2015: 1-4 - [c79]Sule Ozev, Linda Milor:
Panel: Analog/RF BIST: Are we there yet? VTS 2015: 1 - 2014
- [j26]Ender Yilmaz, Afsaneh Nassery, Sule Ozev:
Built-In EVM Measurement With Negligible Hardware Overhead. IEEE Des. Test 31(1): 75-82 (2014) - [c78]Doohwang Chang, Sule Ozev, Ozgur Sinanoglu, Ramesh Karri:
Approximating the age of RF/analog circuits through re-characterization and statistical estimation. DATE 2014: 1-4 - [c77]Jae Woong Jeong, Sule Ozev, Shreyas Sen, Vishwanath Natarajan, Mustapha Slamani:
Built-in self-test and characterization of polar transmitter parameters in the loop-back mode. DATE 2014: 1-6 - [c76]Doohwang Chang, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Engin Afacan, Günhan Dündar:
Reliability enhancement using in-field monitoring and recovery for RF circuits. VTS 2014: 1-6 - [c75]Jae Woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao:
Development and empirical verification of an accuracy model for the power down leakage tests. VTS 2014: 1-6 - [c74]Tao Liu, Chao Fu, Sule Ozev, Bertan Bakkaloglu:
A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters. VTS 2014: 1-6 - [c73]Sule Ozev, Bertan Bakkaloglu:
Special session 4B: Panel: Testing and calibration for power management circuits. VTS 2014: 1 - 2013
- [j25]Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Efficient Process Shift Detection and Test Realignment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(12): 1934-1942 (2013) - [j24]Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring. IEEE Trans. Very Large Scale Integr. Syst. 21(6): 1116-1128 (2013) - [c72]Chandra K. H. Suresh, Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu:
Adaptive reduction of the frequency search space for multi-vdd digital circuits. DATE 2013: 292-295 - [c71]Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev:
Fault analysis and simulation of large scale industrial mixed-signal circuits. DATE 2013: 565-570 - [c70]Lingfei Deng, Vinay Kundur, Naveen Sai Jangala Naga, Muhlis Kenan Ozel, Ender Yilmaz, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Divya Pratab, Tehmoor Dar:
Electrical calibration of spring-mass MEMS capacitive accelerometers. DATE 2013: 571-574 - [c69]Afsaneh Nassery, Sule Ozev, Mustapha Slamani:
Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion. ETS 2013: 1-6 - [c68]Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Adaptive quality binning for analog circuits. ETS 2013: 1-6 - [c67]Afsaneh Nassery, Jae Woong Jeong, Sule Ozev:
Zero-overhead self test and calibration of RF transceivers. ITC 2013: 1-9 - [c66]Jae Woong Jeong, Sule Ozev, Shreyas Sen, T. M. Mak:
Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters. VTS 2013: 1-6 - 2012
- [j23]Afsaneh Nassery, Osman Emir Erol, Sule Ozev, Marian Verhelst:
Test Signal Development and Analysis for OFDM Systems RF Front-End Parameter Extraction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(6): 958-967 (2012) - [j22]Ender Yilmaz, Sule Ozev:
Test Application for Analog/RF Circuits With Low Computational Burden. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(6): 968-979 (2012) - [c65]Afsaneh Nassery, Sule Ozev:
An analytical technique for characterization of transceiver IQ imbalances in the loop-back mode. DATE 2012: 1084-1089 - [c64]Chandra K. H. Suresh, Ozgur Sinanoglu, Sule Ozev:
Adaptive testing of chips with varying distributions of unknown response bits. ETS 2012: 1-6 - [c63]Ender Yilmaz, Sule Ozev:
Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information. ETS 2012: 1-6 - [c62]Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell:
Adaptive testing: Conquering process variations. ETS 2012: 1-6 - [c61]Afsaneh Nassery, Srinath Byregowda, Sule Ozev, Marian Verhelst, Mustapha Slamani:
Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector. VTS 2012: 56-61 - 2011
- [j21]Gurusubrahmaniyan Subrahmaniyan Radhakrishnan, Sule Ozev:
Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation. J. Electron. Test. 27(4): 465-476 (2011) - [j20]Erdem Serkan Erdogan, Sule Ozev:
A Multi-Site Test Solution for Quadrature Modulation RF Transceivers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(9): 1421-1425 (2011) - [c60]Afsaneh Nassery, Sule Ozev, Marian Verhelst, Mustapha Slamani:
Extraction of EVM from Transmitter System Parameters. ETS 2011: 75-80 - [c59]Ender Yilmaz, Sule Ozev:
Fast and Accurate DPPM Computation Using Model Based Filtering. ETS 2011: 165-170 - [c58]Ramachandran Venkatasubramanian, Doohwang Chang, Sule Ozev:
Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study. ETS 2011: 215 - [c57]Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Adaptive multidimensional outlier analysis for analog and mixed signal circuits. ITC 2011: 1-8 - [c56]Ender Yilmaz, Anne Meixner, Sule Ozev:
An industrial case study of analog fault modeling. VTS 2011: 178-183 - 2010
- [j19]Erdem Serkan Erdogan, Sule Ozev:
Detailed Characterization of Transceiver Parameters Through Loop-Back-Based BiST. IEEE Trans. Very Large Scale Integr. Syst. 18(6): 901-911 (2010) - [j18]Erkan Acar, Sule Ozev:
Low Cost MIMO Testing for RF Integrated Circuits. IEEE Trans. Very Large Scale Integr. Syst. 18(9): 1348-1356 (2010) - [c55]Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev:
Defect filter for alternate RF test. ETS 2010: 265-270 - [c54]Ender Yilmaz, Sule Ozev, Kenneth M. Butler:
Adaptive test flow for mixed-signal/RF circuits using learned information from device under test. ITC 2010: 674-683
2000 – 2009
- 2009
- [j17]Erkan Acar, Sule Ozev:
Low-Cost Characterization and Calibration of RF Integrated Circuits through I - Q Data Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(7): 993-1005 (2009) - [j16]Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar:
Wafer-Level Defect Screening for "Big-D/Small-A" Mixed-Signal SoCs. IEEE Trans. Very Large Scale Integr. Syst. 17(4): 587-592 (2009) - [c53]Ender Yilmaz, Sule Ozev:
Adaptive test elimination for analog/RF circuits. DAC 2009: 720-725 - [c52]Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev:
Defect Filter for Alternate RF Test. ETS 2009: 101-106 - [c51]Ender Yilmaz, Sule Ozev:
Defect-based test optimization for analog/RF circuits for near-zero DPPM applications. ICCD 2009: 313-318 - [c50]Ender Yilmaz, Afsaneh Nassery, Sule Ozev, Erkan Acar:
Built-in EVM measurement for OFDM transceivers using all-digital DFT. ITC 2009: 1-10 - [c49]Erdem Serkan Erdogan, Sule Ozev:
A Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources. VTS 2009: 303-308 - 2008
- [j15]Erkan Acar, Sule Ozev:
Defect-Oriented Testing of RF Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(5): 920-931 (2008) - [j14]Fang Liu, Sule Ozev, Plamen K. Nikolov:
Parametric variability analysis for multistage analog circuits using analytical sensitivity modeling. ACM Trans. Design Autom. Electr. Syst. 13(2): 33:1-33:28 (2008) - [c48]Bogdan F. Romanescu, Michael E. Bauer, Sule Ozev, Daniel J. Sorin:
Reducing the impact of intra-core process variability with criticality-based resource allocation and prefetching. Conf. Computing Frontiers 2008: 129-138 - [c47]Ender Yilmaz, Sule Ozev:
Dynamic test scheduling for analog circuits for improved test quality. ICCD 2008: 227-233 - [c46]Erdem Serkan Erdogan, Sule Ozev, Philippe Cauvet:
Diagnosis of assembly failures for System-in-Package RF tuners. ISCAS 2008: 2286-2289 - [c45]Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler:
Optimized EVM Testing for IEEE 802.11a/n RF ICs. ITC 2008: 1-10 - [c44]Erdem Serkan Erdogan, Sule Ozev:
Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers. VTS 2008: 209-214 - 2007
- [j13]Bogdan F. Romanescu, Michael E. Bauer, Sule Ozev, Daniel J. Sorin:
VariaSim: simulating circuits and systems in the presence of process variability. SIGARCH Comput. Archit. News 35(5): 45-48 (2007) - [j12]Fred A. Bower, Daniel J. Sorin, Sule Ozev:
Online diagnosis of hard faults in microprocessors. ACM Trans. Archit. Code Optim. 4(2): 8 (2007) - [j11]Fang Liu, Sule Ozev:
Statistical Test Development for Analog Circuits Under High Process Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(8): 1465-1477 (2007) - [j10]Erkan Acar, Sule Ozev:
Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup. IEEE Trans. Very Large Scale Integr. Syst. 15(1): 37-47 (2007) - [c43]Bogdan F. Romanescu, Michael E. Bauer, Daniel J. Sorin, Sule Ozev:
Reducing the Impact of Process Variability with Prefetching and Criticality-Based Resource Allocation. PACT 2007: 424 - [c42]Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar:
AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs. ASP-DAC 2007: 823-828 - [c41]Erdem Serkan Erdogan, Sule Ozev:
An ADC-BiST scheme using sequential code analysis. DATE 2007: 713-718 - [c40]Mahmut Yilmaz, Albert Meixner, Sule Ozev, Daniel J. Sorin:
Lazy Error Detection for Microprocessor Functional Units. DFT 2007: 361-369 - [c39]Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz:
Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor. ICCD 2007: 317-324 - [c38]Erkan Acar, Sule Ozev:
Digital calibration of RF transceivers for I-Q imbalances and nonlinearity. ICCD 2007: 512-517 - [c37]Erkan Acar, Sule Ozev:
Low cost characterization of RF transceivers through IQ data analysis. ITC 2007: 1-10 - [c36]Fang Liu, Erkan Acar, Sule Ozev:
Test yield estimation for analog/RF circuits over multiple correlated measurements. ITC 2007: 1-10 - [c35]Fang Liu, Sule Ozev:
Efficient simulation of parametric faults for multi-stage analog circuits. ITC 2007: 1-9 - [c34]Erkan Acar, Sule Ozev, Kevin B. Redmond:
A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up. VTS 2007: 3-8 - [i2]Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty:
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores. CoRR abs/0710.4686 (2007) - [i1]Jonathan R. Carter, Sule Ozev, Daniel J. Sorin:
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown. CoRR abs/0710.4715 (2007) - 2006
- [j9]Fei Su, Sule Ozev, Krishnendu Chakrabarty:
Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems. J. Electron. Test. 22(2): 199-210 (2006) - [j8]Fang Liu, Sule Ozev, Martin A. Brooke:
Identifying the Source of BW Failures in High-Frequency Linear Analog Circuits Based on S-Parameter Measurements. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(11): 2594-2605 (2006) - [j7]Fei Su, Sule Ozev, Krishnendu Chakrabarty:
Concurrent testing of digital microfluidics-based biochips. ACM Trans. Design Autom. Electr. Syst. 11(2): 442-464 (2006) - [j6]Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty:
Test infrastructure design for mixed-signal SOCs with wrapped analog cores. IEEE Trans. Very Large Scale Integr. Syst. 14(3): 292-304 (2006) - [c33]Erkan Acar, Sule Ozev, Kevin B. Redmond:
Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers. ICCAD 2006: 210-216 - [c32]Erkan Acar, Sule Ozev:
Efficient Testing of RF MIMO Transceivers Used in WLAN Applications. ICCD 2006: 432-437 - [c31]Erdem Serkan Erdogan, Sule Ozev:
A Robust, Self-Tuning CMOS Circuit for Built-in Go/No-Go Testing of Synthesizer Phase Noise. ITC 2006: 1-10 - [c30]Mahmut Yilmaz, Derek Hower, Sule Ozev, Daniel J. Sorin:
Self-Checking and Self-Diagnosing 32-bit Microprocessor Multiplier. ITC 2006: 1-10 - [c29]Fred A. Bower, Derek Hower, Mahmut Yilmaz, Daniel J. Sorin, Sule Ozev:
Applying architectural vulnerability Analysis to hard faults in the microprocessor. SIGMETRICS/Performance 2006: 375-376 - [c28]Fang Liu, Plamen K. Nikolov, Sule Ozev:
Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework. VTS 2006: 272-277 - 2005
- [j5]Fred A. Bower, Sule Ozev, Daniel J. Sorin:
Autonomic Microprocessor Execution via Self-Repairing Arrays. IEEE Trans. Dependable Secur. Comput. 2(4): 297-310 (2005) - [c27]Fang Liu, Sule Ozev:
Hierarchical analysis of process variation for mixed-signal systems. ASP-DAC 2005: 465-470 - [c26]Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty:
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores. DATE 2005: 50-55 - [c25]Fang Liu, Jacob J. Flomenberg, Devaka V. Yasaratne, Sule Ozev:
Hierarchical Variance Analysis for Analog Circuits Based on Graph Modelling and Correlation Loop Tracing. DATE 2005: 126-131 - [c24]Jonathan R. Carter, Sule Ozev, Daniel J. Sorin:
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown. DATE 2005: 300-305 - [c23]Erkan Acar, Sule Ozev:
Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions. ICCAD 2005: 73-79 - [c22]Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty:
A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs. ICCD 2005: 137-142 - [c21]Fang Liu, Sule Ozev:
Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits. ICCD 2005: 161-170 - [c20]Erkan Acar, Sule Ozev:
Defect-based RF testing using a new catastrophic fault model. ITC 2005: 9 - [c19]Fred A. Bower, Daniel J. Sorin, Sule Ozev:
A Mechanism for Online Diagnosis of Hard Faults in Microprocessors. MICRO 2005: 197-208 - [c18]Erkan Acar, Sule Ozev:
Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements. VTS 2005: 374-379 - 2004
- [j4]Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu:
Seamless Test of Digital Components in Mixed-Signal Paths. IEEE Des. Test Comput. 21(1): 44-55 (2004) - [j3]Sule Ozev, Alex Orailoglu:
Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead. IEEE Trans. Very Large Scale Integr. Syst. 12(7): 756-765 (2004) - [c17]Fred A. Bower, Paul G. Shealy, Sule Ozev, Daniel J. Sorin:
Tolerating Hard Faults in Microprocessor Array Structures. DSN 2004: 51-60 - [c16]Fei Su, Sule Ozev, Krishnendu Chakrabarty:
Test planning and test resource optimization for droplet-based microfluidic systems. ETS 2004: 72-77 - [c15]Fang Liu, Sule Ozev, Martin A. Brooke:
Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search. ICCAD 2004: 641-647 - [c14]Sule Ozev, Alex Orailoglu:
End-to-End Testability Analysis and DfT Insertion for Mixed-Signal Paths. ICCD 2004: 72-77 - [c13]Erkan Acar, Sule Ozev:
Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis. ITC 2004: 783-792 - [c12]Sule Ozev, Christian Olgaard:
Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures. VTS 2004: 217-222 - 2003
- [j2]Sule Ozev, Alex Orailoglu:
Statistical Tolerance Analysis for Assured Analog Test Coverage. J. Electron. Test. 19(2): 173-182 (2003) - [c11]Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty:
TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers. ICCAD 2003: 95-99 - [c10]Fei Su, Sule Ozev, Krishnendu Chakrabarty:
Testing of Droplet-Based Microelectrofluidic Systems. ITC 2003: 1192-1200 - 2002
- [j1]Sule Ozev, Christian Olgaard, Alex Orailoglu:
Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers. IEEE Des. Test Comput. 19(5): 82-91 (2002) - [c9]Sule Ozev, Alex Orailoglu:
Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits. ICCD 2002: 258-264 - [c8]Sule Ozev, Alex Orailoglu, Hosam Haggag:
Automated test development and test time reduction for RF subsystems. ISCAS (1) 2002: 581-584 - [c7]Sule Ozev, Alex Orailoglu:
An Integrated Tool for Analog Test Generation and Fault Simulation. ISQED 2002: 267-272 - [c6]Sule Ozev, Alex Orailoglu:
Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis. VTS 2002: 213-222 - 2001
- [c5]Christian Olgaard, Sule Ozev, Alex Orailoglu:
Testability implications in low-cost integrated radio transceivers: a Bluetooth case study. ITC 2001: 965-974 - 2000
- [c4]Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu:
Test Synthesis for Mixed-Signal SOC Paths. DATE 2000: 128-133 - [c3]Sule Ozev, Alex Orailoglu:
Block-Based Test Integration for Analog Integrated Circuits. LATW 2000: 128-132 - [c2]Sule Ozev, Alex Orailoglu:
Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems. VTS 2000: 149-156
1990 – 1999
- 1999
- [c1]Sule Ozev, Alex Orailoglu:
Low-Cost Test for Large Analog IC's. DFT 1999: 101-
Coauthor Index
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