In this paper the ATPG is implemented using C++. This ATPG is based on fault equivalence concept in which the number of faults gets reduced before compaction method. This ATPG uses the line justification and error propagation to find the... more
In this paper the ATPG is implemented using C++. This ATPG is based on fault equivalence concept in which the number of faults gets reduced before compaction method. This ATPG uses the line justification and error propagation to find the test vectors for reduced fault set with the aid of controllability and observability. Single stuck at fault model is considered. The programs are developed for fault equivalence method, controllability Observability, automatic test pattern generation and test data compaction using object oriented language C++. ISCAS 85 C17 circuit was used for analysis purpose along with other circuits. Standard ISCAS (International Symposium on Circuits And Systems) netlist format was used. The flow charts and results for ISCAS 85 C17 circuits along with other netlists are given in this paper. The test vectors generated by the ATPG further compacted to reduce the test vector data. The algorithm is developed for the test vector compaction and discussed along with results
Power dissipation in sequential circuits is due to increased toggling count of Circuit under Test, which depends upon test vectors applied. If successive test vectors sequences have more toggling nature then it is sure that toggling rate... more
Power dissipation in sequential circuits is due to increased toggling count of Circuit under Test, which depends upon test vectors applied. If successive test vectors sequences have more toggling nature then it is sure that toggling rate of flip flops is higher. Higher toggling for flip flops results more power dissipation. To overcome this problem, one method is to use GA to have test vectors of high fault coverage in short interval, followed by Hamming distance management on test patterns. This approach is time consuming and needs more efforts. Another method which is purposed in this paper is a PSO based Frame Work to optimize power dissipation. Here target is to set the entire test vector in a frame for time period 'T', so that the frame consists of all those vectors strings which not only provide high fault coverage but also arrange vectors in frame to produce minimum toggling.
In this paper a new algorithm named Position Oriented Test Generation (POTG) is proposed which would not only detect whether the chip is faulty or not but, also provide the information regarding the position and the type of fault present.... more
In this paper a new algorithm named Position Oriented Test Generation (POTG) is proposed which would not only detect whether the chip is faulty or not but, also provide the information regarding the position and the type of fault present. A modified fault dictionary is prepared that is used to minimize the effort in fault location. The proposed algorithm has two parts: first, generation of optimized fault dictionary, and then usage of this fault dictionary. This modified dictionary also gives a heuristic approach to minimize the number of test vectors required for testing the chip with some trade-off with fault coverage. This proposed algorithm is faster in locating a fault in a chip compared to other classical fault location technique. For validation, POTG Algorithm has been applied to ISCAS’85 Benchmark circuit and results have been obtained.
