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Lab Report 3

This laboratory report details an experiment on semiconductor characteristics using various electrical components and equipment. The report includes an introduction, objectives, pre-lab preparation, equipment used, components, theory, procedure, calculations, results, and conclusions.

Uploaded by

Yohannes Alemayehu
Copyright
© © All Rights Reserved
Available Formats
Download as PDF, TXT or read online on Scribd
34 views

Lab Report 3

This laboratory report details an experiment on semiconductor characteristics using various electrical components and equipment. The report includes an introduction, objectives, pre-lab preparation, equipment used, components, theory, procedure, calculations, results, and conclusions.

Uploaded by

Yohannes Alemayehu
Copyright
© © All Rights Reserved
Available Formats
Download as PDF, TXT or read online on Scribd
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Addis Ababa University

Faculty of Technology
Department of Electrical and Computer Engineering
Laboratory Report
Course number: Eceg:- 2205 - Electrical Engineering Laboratory II

Experiment Number: 01

Title: Semiconductor Characteristics

Figure A: Circuit symbol for a Rectifying Diode

By: Besufekad Mekuria

Group: 1B, Subgroup 5, ID: TCR/0590/01

Date of Lab. session: November 11, 2009

Date of submission: November 18, 2009

TABLE OF CONTENTS:

AAU, FACULTY OF TECHNOLOGY, DEPARTMENT OF ELECTRICAL ENGINEERING, LABORATORY REPORT 0


Section Sub-Title Location
NO
1.1 Introduction Page Two

1.2 Objective Page Two

1.3 Preparation Page Two

1.4 Used Equipment Page Two

1.5 Components used Page Three

1.6 Theory Page Three

1.7 Procedure Page Five

1.8 Calculations Page Six

1.9 Results Page Seven

1.10 Conclusion Page Thirteen

Title

AAU, FACULTY OF TECHNOLOGY, DEPARTMENT OF ELECTRICAL ENGINEERING, LABORATORY REPORT 1


1.1 INTRODUCTION

1.2 OBJECTIVE
A. To introduce some.
B. To develop the skill of using.

1.3 PRE-LAB PREPARATION


Before the laboratory session, a laboratory manual was supplied by the Laboratory instructors. This
manual included

1.4 USED EQUIPMENT


No Description Code/Lab Reference Quantity
1 DC Power supply - 1
2 Multimeter (VOM) - 1
3 Cathode Ray oscilloscope - 1
4 Conducting Wires - 9
5 Variable Resistor - 1
6 Variable Inductors - 1
7 Variable Capacitors - 1
8 Stop watch - 1
Table 1: Electrical Equipments that were used to set up the circuit for the laboratory procedure

1.5 USED COMPONENTS


No Description Type Quantity
1 Resistor 1,000,000 Ω 1
2 Inductor 0-000001 μF 1
Table 2: Electrical Components that were used to set up the circuit for the laboratory procedure

1.6 THEORY

AAU, FACULTY OF TECHNOLOGY, DEPARTMENT OF ELECTRICAL ENGINEERING, LABORATORY REPORT 2


R

E
C

Figure 1: First Order Resistive - Capacitive Network

1.7 PROCEDURE
1 MΩ

20 V 10 pF

Figure 3: Procedural diagram for the laboratory session

1. The network for the procedure was set up according to ‘Figure 3’.

1.8 Calculations
All of the necessary calculations required

1.9 Results
After completing setting up the

Again, Graphing the measured Voltage drop as a function of time (while the capacitor is
charging) gives: (note that the graphs are drawn from the average values of the three trials
represented above).

AAU, FACULTY OF TECHNOLOGY, DEPARTMENT OF ELECTRICAL ENGINEERING, LABORATORY REPORT 3


1.10 Conclusion
Upon completion of the laboratory session, many observations were made; these observations have been
dealt with here under their own subheading.

Observations made from Analysis of first order transient Networks.

 For a

Observations made about practical errors


It is a well known fact that there does not exist a circuit element that functions with a hundred percent
efficiency. Therefore slight deviations of the measured values from the calculated ones are to be expected under
any circumstances. However the possible causes for these irregularities include:

 The DC voltmeter does not give rise to a potential difference with a magnitude that it is programmed to do.
This is generally due to manufacturing defects, defects from improper usage and gradual wearing off.

 The leads are not of Zero Resistance; this is because of factors like: Temperature change, corrosion, etc…

 The Ammeter used was an analog device; therefore readings are perceptible to be misconstrued. And also
continuous mistreatment of the device leads to incorrect readings in the future.

End of Report

AAU, FACULTY OF TECHNOLOGY, DEPARTMENT OF ELECTRICAL ENGINEERING, LABORATORY REPORT 4

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