EE 4253/6253 Lecture Notes

September 7, 1998

page 38

MOSFET Device Operation

VGS << VT

p-substrate

DEPLETION

depletion region VGS VT

INVERSION

inversion region (n-type) depletion region VGS > VT

Enhancement-mode nMOS transistor cross-section Holes are repelled from the gate by positive VGS (nMOSFET) At the onset of INVERSION, electrons attracted under the gate to form channel. For a depletion-mode nMOS, area under gate is actually a lightly doped n-type material so that threshold voltage is < 0V.

EE 4253/6253 Lecture Notes

September 7, 1998

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MOSFET Structure versus Bias

Drain 0V Gate
n+

(a)
p-substrate

VGS > VT, VDS = 0V depletion region VDS

inversion layer

(b)
p-substrate

VDS < VGS - VT (Nonsaturated mode) VGS - VT VDS "Pinch-off" VDS

(c)
p-substrate

VDS > VGS - VT VDS (Saturated mode)

Cross-section (a): potential in channel same everywhere because VGS = VGD , channel "depth" same everywhere since VGS > VT and VGD > VT Cross-section (b): Depth of channel varies somewhat linearly with VGS and VDS. As VDS is increased, the drain-side of channel (just beneath the gate) becomes "pinched" because VGD becomes less and less. Cross-section (c): Here the current depends only on VGS and not VDS (if we neglect channel-length modulation) and the channel becomes completely pinched-off near the drain. With VDS > VGS -VT but VS = 0V, then VD > VG - VT and hence, VT > VGD , i.e., Vgate-to-drain is less than the threshold voltage. How does conduction occur after "pinch-off"? Electrons enter channel from source, then are swept across depletion region near drain by the positive drain voltage with respect to source (VDS).

EE 4253/6253 Lecture Notes

September 7, 1998

page 40

MOSFET Threshold Voltage

VT-MOS ideal threshold voltage for a MOS capacitor (the capacitor formed between the gate and substrate) Vfb Flatband voltage Qb VT-MOS = 2b + C b = (Note: "Qb" sometimes referred to as "Qbo")

ox

kT NA q ln ni bulk Fermi potential

o x Cox = oxide capacitance, inversely proportional to oxide thickness C ox = tox Qb = b 2 si . q . N A . 2 bulk charge term (total charge stored in depletion layer), p-substrate in this case

Bulk potential potential difference between Fermi level in intrinsic semiconductor and Fermi level in doped semiconductor Fermi level is the average energy level in a material. For intrinsic materials, it is halfway between the valence band and conduction band. p-type Fermi level closer to valence band n-type Fermi level closer to conduction band Other Constants (see text for values): k = Boltzmann's constant (eV/K, J/K) q = Electronic charge (coulombs) T = temperature (K) NA = carrier density in doped semiconductor ni = intrinsic carrier concentration in Silicon si = permittivity of Silicon = r . o r =11.7 (relative Silicon permittivity) o (permittivity of free space)

EE 4253/6253 Lecture Notes

September 7, 1998

page 41

MOSFET Threshold Voltage (continued)

(ms = gate work function, Qfc sometimes referred to as Qss)

Qfc fixed charge due to surface states which arise due to imperfections in silicon oxide interface and doping ms gate work function which is the work function difference between the gate material and substrate
Eg ms = - 2q + b

Eg Bandgap energy of Silicon (temperature dependent) b bulk Fermi potential Note: Eg is actually in electron volts, 1eV = 1q . 1V, so "q" 's in ms expression cancel out.

EE 4253/6253 Lecture Notes

September 7, 1998

page 42

Two common techniques for increasing the native threshold voltage of a MOS device: (1) Vary the doping concentration at the silicon-insulator interface through ion implantation (in process step called "threshold adjustment") affects Qfc (Qss, surface state charge) (2) Use different insulating material for gate affects Cox Between transistors, use very thick oxide (>> tox) to increase threshold voltage so that substrate surface does not become inverted through normal circuit voltage (obviously you do not want signal wire voltages and VD D lines inverting substrate). This keeps transistors electronically isolated from each other. Example VT calculation: Calculate the native threshold voltage for an ntransistor at 300K for a process with a Si substrate with NA = 1.80 10-16cm-3, a SiO2 gate oxide with thickness 200. (Assume ms = -0.9V, Qfc = 0C.) 1.80 10-16 b = 0.02586 ln 1.45 10 1 0 = 0.36V; kT note q = 0.02586V @ T = 300K

with 3.98.8510-14 Farads -7 - 5 = 1.726 10 0.2 10 cm2

Cox =

resulting in

VT = ms +

b + 2 2siqNA2
Cox

b = (-0.9 + 0.384 + 0.72)V = 0.16V

This device has a very low threshold voltage.

EE 4253/6253 Lecture Notes

September 7, 1998

page 43

Substrate (bulk) bias effect on Threshold Voltage

|) 2siqNA(2b + |VSB
Cox

( 2 b + |V S B | - b ) 2

where VTO is threshold voltage when VSB = 0V and is a constant which describes substrate bias effect. tox 1 = A = C A 2siqN 2siqN ox ox Values of usually range from (0.4 to 1.2)V1/2. In SPICE, = GAMMA, VTO = VTO, NA = NSUB, s = 2b is PHI. Example of substrate bias effect on threshold voltage: With NA = 31016cm-3, tox = 200, ox = 3.98.8510 -14 F/cm, si = 11.78.8510 -14 F/cm, and q = 1.610-19Coulomb 0.210-5 = 3.98.8510-14 = 0.57V1/2 21.610-1911.78.8510-1431016 31016 b = 0.02586 ln 1.51010 = 0.375V At a VSB = 2.5V, VT = VTO + 0.57( + 0.75) 0.75 + 2.5 VT = VTO + 0.53V

In analog designs it is quite common to use substrate bias to shift threshold voltage.

EE 4253/6253 Lecture Notes

September 7, 1998

page 44

Note: When connecting devices in series, VT of top device will increase if VB tied to appropriate rail because VSB is not zero.
VDD Mn2 d2 b2 s2 Mn1 d1 b1 VSB1 = 0V s1 Mp2 d2 VTn2 > VTn1 s2 b2 VSB2 0V Mp1 d1 VTp2 < VTp1 VBS2 0V s1 b1 VBS1 = 0V VDD

Actual shift in threshold voltage due to the above arrangement is very small. ----------------------------------------------------

Revisit operation under Saturation

G
VDS > VGS - VT

S n+
VGS - VT

D n+

This part of channel is pinched-off because VGD < VT. Current in the induced channel is constant because voltage drop is fixed at VGS - VT. 2 n Ideal equation ID = 2 ( V GS - V Tn ) is not entirely accurate because pinch-off point under gate is influenced by VDS . This influence of VDS on pinch-off essentially modifies the length of the channel (channel length modulation effect).

EE 4253/6253 Lecture Notes

September 7, 1998

page 45

New equation for Saturation

in SPICE is called LAMBDA, and is the channel length modulation factor. Empirical values range from (0.02 to 0.005) V-1. If we rewrite our current equation as
2 K' W ID = 2 L (V GS - V Tn ) (1 + V DS )

then when > 0V-1, the effective channel length is reduced. Be careful not to confuse channel length with gate length. In saturated pinch-off, they are not equal!